Cordierite sintered body, method for manufacturing the same, composite substrate, and electronic device
US-2016264471-A1 · Sep 15, 2016 · US
US11198648B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11198648-B2 |
| Application number | US-201715463251-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 20, 2017 |
| Priority date | Mar 23, 2016 |
| Publication date | Dec 14, 2021 |
| Grant date | Dec 14, 2021 |
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A cordierite-based sintered body according to the present invention contains cordierite as a main component and silicon nitride or silicon carbide. The cordierite-based sintered body preferably has a thermal expansion coefficient less than 2.4 ppm/° C. at 40° C. to 400° C., an open porosity of 0.5% or less, and an average grain size of 1 μm or less.
Opening claim text (preview).
What is claimed is: 1. A composite substrate comprising, a piezoelectric substrate bonded to a cordierite-based sintered body support substrate, wherein the cordierite-based sintered body contains cordierite as a main component and silicon nitride, the cordierite-based sintered body having: a thermal expansion coefficient less than 2.4 ppm/° C. at 40° C. to 400° C., an open porosity of 0.5% or less, and an average grain size of 0.61 μm or less, wherein the cordierite-based sintered body has a Young's modulus of 160 GPa or more, and wherein the cordierite-based sintered body contains silicon nitride and has a polished surface, and when the polished surface is subjected to observation of a backscattered electron image and a composition analysis with an SEM and then an area ratio of a cordierite phase to a silicon nitride phase is determined from a contrast ratio of the image and converted to a volume ratio of the sintered body, the cordierite phase is 60% to 90% by volume and the silicon nitride phase is 10% to 40% by volume; wherein the polished surface has a center-line average roughness Ra of 1.5 nm or less; and wherein the polished surface is a surface to which the piezoelectric substrate is bonded. 2. The composite substrate according to claim 1 , wherein the number of pores that have a maximum length of 1 μm or more and present in an area of 100 μm×100 μm of the polished surface is 10 or less. 3. The composite substrate according to claim 1 , wherein the cordierite-based sintered body has a four-point flexural strength of 220 MPa or more. 4. A method for producing a composite substrate in which a piezoelectric substrate is bonded to a cordierite-based sintered body-comprising the steps of: (a) preparing a raw-material powder mixture by mixing 60% to 90% by volume of a cordierite powder having an average particle diameter of 0.1 to 1 μm and 10% to 40% by volume of a silicon nitride powder having an average particle diameter of 0.1 to 1 μm in a total amount of 100% by; and (b) producing the cordierite-based sintered body by forming the raw material powder mixture into a compact having a predetermined form and subjecting the compact to hot pressing at a pressing pressure of 20 to 300 kgf/cm 2 and a firing temperature of 1350° C. to 1450° C., wherein the cordierite-based sintered body has a thermal expansion coefficient less than 2.4 ppm/° C. at 40° C. to 400° C., an open porosity of 0.5% or less, and an average grain size of 0.61 μm or less, and wherein the cordierite-based sintered body has a Young's modulus of 160 GPa or more, wherein the cordierite-based sintered body contains silicon nitride and has a polished surface, and when the polished surface is subjected to observation of a backscattered electron image and a composition analysis with an SEM and then an area ratio of a cordierite phase to a silicon nitride phase is determined from a contrast ratio of the image and converted to a volume ratio of the sintered body, the cordierite phase is 60% to 90% by volume and the silicon nitride phase is 10% to 40% by volume, wherein the polished surface has a center-line average roughness Ra of 1.5 nm or less, and wherein the polished surface is a surface to which the piezoelectric functional substrate is bonded. 5. The composite substrate according to claim 1 , wherein the piezoelectric substrate is lithium tantalate or lithium niobate.
Surface properties, e.g. surface roughness · CPC title
Thermal properties, e.g. thermal expansion coefficient · CPC title
submicron sized, i.e. from 0,1 to 1 micron · CPC title
Silicon nitrides, e.g. silicon carbonitride, silicon oxynitride · CPC title
Silicon carbides · CPC title
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