Defect detection method and device

Patent metadata

Field	Value
Publication number	US-11193887-B2
Application number	US-201817042010-A
Country	US
Kind code	B2
Filing date	Dec 13, 2018
Priority date	Jun 11, 2018
Publication date	Dec 7, 2021
Grant date	Dec 7, 2021

Abstract

A defect detection device 10 is provided with: a laser light source 11 for irradiating laser light to a measurement region R of a surface of an inspection object S; a laser light source control unit 15 for controlling the laser light source so as to cause laser light to be outputted continuously or quasi-continuously for a time longer than a period of vibration generated in the inspection object; an interferometer (speckle shearing interferometer 14) for generating interference light in which reflected light of the laser light reflected in the measurement region and reference laser light emitted from the laser light source 11 interfere; a detector (image sensor 145) for detecting the intensity of the interference light for each point in the measurement region R; a phase shifter 143 for shifting the phase of the reflected laser light or the reference laser light; an integrated intensity pattern determination unit 16 for obtaining an integrated intensity obtained by integrating the intensity for each point over an integration time longer the period of the vibration in three or more phases, the phase being shifted by the phase shifter 143 into three or more different phases; an interference degree distribution generation unit 17 for obtaining the distribution of the degree of interference based on the integrated intensity obtained in each of the three or more phases for each point; and a defect detection unit 18 for detecting a defect in the measurement region R based on the distribution of the degree of interference in the measurement region R.

First claim

The invention claimed is:

1. A defect detection method comprising:
emitting laser light continuously or quasi-continuously from a laser light source for a time longer than a period of vibration generated in an inspection object to a measurement region on a surface of the inspection object in a state in which the vibration is being generated in the inspection object;
generating integrated intensity for a plurality of points in the measurement region three or more times by shifting a phase of either reflected laser of the laser light reflected in the measurement region or reference laser light emitted from the laser light source, the integrated intensity being obtained by integrating intensity of interference light in which the reflected laser light and the reference laser light interfere over an integration time longer than the period of the vibration; and
obtaining a distribution of a degree of interference from respective integrated intensities obtained in three or more phases for each point of the plurality of points in the measurement region and detecting a defect in the measurement region based on the distribution of the degree of interference.

2. The defect detection method as recited in claim 1 ,
wherein the reference laser light is laser light obtained by branching a part of the laser light emitted from the laser light source just before the measurement region.

3. The defect detection method as recited in claim 1 ,
wherein the reference laser light is laser light emitted from the laser light source and reflected in the measurement region.

4. The defect detection method as recited in claim 1 ,
wherein the vibration is environmental vibration generated in the inspection object in an environment in which the inspection object is used.

5. The defect detection method as cited in claim 4 ,
wherein the environmental vibration is generated by a traffic load applied to the inspection object.

6. The defect detection method as recited in claim 1 ,
wherein the vibration is applied to the inspection object by an excitation means.

7. The defect detection method as recited in claim 6 ,
wherein the excitation means is one of a vibrating vehicle, an ultrasonic vibrator, an electric tool, and a non-power tool.

8. A defect detection device comprising:
a laser light source configured to emit laser light to a measurement region on a surface of an inspection object;
a laser light source control unit configured to control the laser light source so as to cause the laser light to be outputted continuously or quasi-continuously for a time longer than a period of vibration generated in the inspection object;
an interferometer configured to generate interference light in which reflected laser light of the laser light reflected in the measurement region and reference laser light emitted from the laser light source interfere;
a detector configured to detect intensity of the interference light for a plurality of points in the measurement region;
a phase shifter configured to shift a phase of either the reflected laser light or the reference laser light;
an integrated intensity determination unit configured to make the phase shifter shift the phase into three or more different phases and obtain integrated intensity obtained by integrating the intensity of the interference light for each point over an integration time longer than a period of the vibration in the three or more phases;
an interference degree distribution generation unit configured to obtain a distribution of a degree of interference based on the integrated intensity obtained in each of the three or more phases for each point of the plurality of points in the measurement region; and
a defect detection unit configured to detect a defect in the measurement region based on the distribution of the degree of interference in the measurement region.

9. The defect detection device as recited in claim 8 ,
wherein the reference laser light is laser light obtained by branching a part of the laser light emitted from the laser light source just before the measurement region.

10. The defect detection device as recited in claim 8 ,
wherein the reference laser light is laser light emitted from the laser light source and reflected in the measurement region.

11. The defect detection device as recited in claim 8 ,
wherein a display unit configured to display information based on the distribution of the degree of interference in the measurement region is provided, instead of the defect detection unit or together with the defect detection unit.

Assignees

• Shimadzu Corp

Inventors

• Hatahori Takahide
• Takubo Kenji

Classifications

• G01N2291/0234

  Metals, e.g. steel · CPC title

• G01N2201/06113

  Coherent sources; lasers · CPC title

• G01B9/02094

  Speckle interferometers, i.e. for detecting changes in speckle pattern · CPC title

• G01N29/2418

  using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics (photoacoustic cells G01N21/1702; measuring characteristics of vibrations by using radiation-sensitive means G01H9/00; acousto-optical conversion techniques for short-range imaging G01S15/8965; sound-producing devices using laser bundle G10K15/046) · CPC title

• G01N29/045

  by imparting shocks to the workpiece and detecting the vibrations or the acoustic waves caused by the shocks (measuring resonant frequency G01H13/00; measuring strength properties by application of mechanical stress G01N3/00) · CPC title