Method for correcting active matrix substrate and method for manufacturing display apparatus

Patent metadata

Field	Value
Publication number	US-11181791-B2
Application number	US-201716641136-A
Country	US
Kind code	B2
Filing date	Nov 15, 2017
Priority date	Aug 25, 2017
Publication date	Nov 23, 2021
Grant date	Nov 23, 2021

Abstract

The present disclosure illustrates a method for correcting an active matrix substrate. The method includes steps: performing the broken-line inspection process to inspect whether the broken line exists on the first and second gate lines; if one first gate line is inspected to be broken, performing a source line repair-section forming process to cut off the cut portions of the second source lines disposed at two sides of a pixel electrode corresponding to a broken location of the first gate line, to form source line repair sections overlapping with the broken first gate line and the second gate line; performing a gate line repair-section forming process on the second gate line, adjacent to the broken first gate line, to cut off the cut portions of the second gate line to form a gate line repair section overlapping with the second source lines; and performing a connection process.

First claim

What is claimed is:

1. A method for correcting an active matrix substrate,
the active matrix substrate comprising:
a substrate;
a plurality of pixel electrodes disposed on the substrate and arranged in a matrix form, so as to form a plurality of pixels;
a plurality of first gate lines disposed between the plurality of pixel electrodes respectively, and extended in parallel with each other;
a plurality of first source lines disposed between the plurality of pixel electrodes respectively, and extended in a direction crossing the plurality of first gate lines;
a plurality of capacitor lines disposed between the plurality of first gate lines respectively, and extended at an angle to one another;
a plurality of switch devices disposed on the plurality of pixel electrodes respectively, and electrically connected to the plurality of pixel electrodes, the plurality of first gate lines, the plurality of capacitor lines and the plurality of first source lines, respectively;
a plurality of second source lines disposed between the plurality of pixel electrodes respectively, and extended in parallel with the plurality of first source lines; and
a plurality of second gate line disposed between the plurality of pixel electrodes respectively, and extended in parallel with the plurality of first gate lines;
wherein the plurality of first gate lines, the plurality of capacitor lines, the plurality of first source lines, the plurality of second gate lines, and the plurality of second source lines are isolated from each other;
wherein the method comprises:
performing a broken-line inspection process to inspect whether a broken line exists;
if the broken line is inspected, performing a repair-section forming process to cut off an undesired portion and form a plurality of repair sections overlapping the broken line; and
performing a connection process to electrically connect the broken line and the plurality of repair sections;
wherein, the method for correcting an active matrix substrate further comprising:
performing the broken-line inspection process to inspect whether the broken line exists on one of the first gate lines and the second gate lines;
if only one of the first gate lines is inspected to be broken, performing a source line repair-section forming process to cut off cut portions of the second source lines disposed at two sides of the pixel electrodes corresponding to a broken location of the first gate line, so as to form source line repair sections overlapping with the broken first gate line and the second gate line, wherein a part of the cut portions locate near a same side of the broken first gate line opposite to the second gate line, and another part of the cut portions locate near a same of the second gate line opposite to the broken first gate line;
performing a gate line repair-section forming process on the second gate line, adjacent to the broken first gate line, to cut off cut portions of the second gate line respectively located at two sides of the second source lines disposed at two sides of the broken location, so as to form a gate line repair section overlapping with the second source lines; and
performing a connection process to electrically connect portions of the source line repair sections, overlapping with the broken first gate line, to the broken first gate line respectively, and electrically connect portions of the source line repair sections, overlapping with the second gate line, to the gate line repair section.

2. The method according to claim 1 , further comprising:
performing the broken-line inspection process to inspect whether the broken line exists on one of the first gate lines and the second gate lines;
if one of the first gate lines and one of the second gate line both are inspected to be broken and broken locations are between the same two pixel electrodes, performing the source line repair-section forming process to cut off the cut portions of the second source lines disposed at two sides of the pixel electrodes corresponding to the broken locations of the first gate line and the second gate line, so as to form source line repair sections overlapping with the broken first gate line and other second gate line, wherein the part of the cut portions locate near the same side of the broken first gate line opposite to the other second gate line, and the other part of the cut portions locate near the same side of the other second gate line opposite to the broken first gate line;
performing the gate line repair-section forming process on the other second gate line to cut off the cut portions of the other second gate line respectively located at two sides of the second source lines disposed at two sides of the pixel electrodes corresponding to the broken locations, so as to form the gate line repair section overlapping with the second source lines; and
performing the connection process to electrically connect portions of the source line repair sections, overlapping with the broken first gate line, to the broken first gate line respectively, and electrically connect portions of the source line repair sections, overlapping with the other second gate line, to the gate line repair section.

3. The method according to claim 1 , further comprising:
performing the broken-line inspection process to inspect whether the broken line exists on one of the first source lines and the second source lines;
if only one of the first source lines is inspected to be broken, performing the gate line repair-section forming process to cut off the cut portions of the second gate lines disposed at two sides of the pixel electrodes corresponding to the broken location of the first source line, so as to form gate line repair sections overlapping with the broken first source line and the second source line, wherein the part of the cut portions locate near the same side of the broken first source line opposite to the second source line, and the other part of the cut portions locate near the same side of the other second source line opposite to the broken first source line;
performing the source line repair-section forming process on the second source line, adjacent to the broken first source line, to cut off the cut portions of the second source line respectively located at two sides of the second gate lines disposed at two sides of the pixel electrodes corresponding to the broken location, so as to form the source line repair section overlapping with the second gate lines; and
performing the connection process to electrically connect the gate line repair sections to the broken first source line respectively, and electrically connect portions of the source line repair sections, overlapping with the second gate line, to the gate line repair section.

4. The method according to claim 1 , further comprising:
performing the broken-line inspection process to inspect whether the broken line exists on one of the first source lines and the second source lines;
if one of the first source lines and one of the second source lines both are inspected to be broken, and broken locations are between the same two pixel electrodes, performing the gate line repair-section forming process to cut off the cut portions of the second gate lines disposed at two sides of the pixel electrodes corresponding to the broken locations of the first source line and the second source line, so as to form gate line repair sections overlapping with the broken first source line and other second source line, wherein the part of the cut portions locate near the same side of the broken first source line opposite to the other second source line, and the other part of the cut portions locate near the same side of the other second source line opposite to the broken first source line;
performing the source line repair-section forming process on the other second source lin

Assignees

• Hkc Corp Ltd

Inventors

• He Huailiang

Classifications

• G02F1/1309

  Repairing; Testing · CPC title

• G02F1/136286 Primary

  Wiring, e.g. gate line, drain line · CPC title

• G02F1/136263

  Line defects · CPC title

• G09G2330/12

  Test circuits or failure detection circuits included in a display system, as permanent part thereof · CPC title

• G02F1/136259 Primary

  Repairing; Defects · CPC title