Sensor apparatus and method of making same
US-2019110747-A1 · Apr 18, 2019 · US
US11156512B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11156512-B2 |
| Application number | US-201816617901-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 29, 2018 |
| Priority date | May 29, 2017 |
| Publication date | Oct 26, 2021 |
| Grant date | Oct 26, 2021 |
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A strain gauge and a metal strip having such a strain gauge, which has a first measuring grid, a second measuring grid, and a substrate on which these two measuring grids are positioned in a common plane. In order to enable achievement of an inexpensive strain gauge whose measurement results can be robustly compensated for in relation to a temperature disturbance variable, it is proposed that the multi-layer substrate have a metallic layer and an electrically insulating layer onto which electrically insulating layer these two measuring grids consisting of a piezoresistive material are printed.
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The invention claimed is: 1. A strain gauge comprising: a first measuring grid; a second measuring grid; and a multi-layer substrate on which the first and second measuring grids are positioned in a common plane, wherein the multi-layer substrate has a metallic layer and an electrically insulating layer, the first and second measuring grids each consisting of a piezoresistive material are printed directly onto a first surface of the electrically insulating layer, and a second surface of the electrically insulating layer faces the metallic layer, and wherein the strain gauge counteracts temperature disturbance variables. 2. The strain gauge according to claim 1 , wherein the second measuring grid oriented at a right angle to the first measuring grid is embodied as a passive measuring grid for temperature compensation of strain measurement values of the first measuring grid for which purpose the first and second measuring grids consist of the same piezoresistive material. 3. The strain gauge according to claim 2 , wherein the first and second measuring grids have the same nominal resistance. 4. The strain gauge according to claim 2 , wherein the first and second measuring grids each have at least one meandering grid section, with one grid section of the first measuring grid being positioned between two grid sections of the second measuring grid. 5. The strain gauge according to claim 4 , wherein each of the first and second measuring grids has a plurality of meandering grid sections, which grid sections are positioned one after the other in alternating fashion. 6. The strain gauge according to claim 4 , wherein a grid section of the first measuring grid has two meandering rows extending next to each other. 7. The strain gauge according to claim 4 , wherein a ratio of at least one grid length of a first grid section to at least one grid width of a second grid section is 1:0.75 to 1:1.25. 8. The strain gauge according to claim 4 , wherein the grid sections of the respective measuring grids are embodied as identically shaped, in particular as identical. 9. The strain gauge according to claim 1 , wherein the first and second measuring grids are identically oriented and, as active measuring grids, have respective piezoresistive materials with temperature coefficients that are different from each other and strain factors that are different from each other. 10. The strain gauge according to claim 9 , wherein the first and second measuring grids each have a meandering grid section. 11. The strain gauge according to claim 10 , wherein the grid sections are positioned one inside the other and are identically shaped. 12. The strain gauge according to claim 9 , wherein the two measuring grids extend in a double meander. 13. The strain gauge according to claim 1 , wherein the metallic layer of the substrate is an aluminum strip or steel strip or is a plate made of aluminum or steel. 14. The strain gauge according to claim 1 , wherein the electrically insulating layer of the substrate is a primer or an insulating lacquer layer or an organic or inorganic pre-coating. 15. A metal strip having a coating and having a strain gauge according to claim 1 , wherein the metal strip constitutes the metallic layer of the substrate of the strain gauge and the coating on the metal strip constitutes the electrically insulating layer of the substrate of the strain gauge.
using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material · CPC title
for temperature variations · CPC title
for measuring the deformation in a solid, e.g. by resistance strain gauge · CPC title
of the semi-conductor type · CPC title
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