Photoacid generator and chemically amplified positive-type photoresist composition for thick film comprising the same

US11150555B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11150555-B2
Application numberUS-201816337280-A
CountryUS
Kind codeB2
Filing dateApr 3, 2018
Priority dateSep 11, 2017
Publication dateOct 19, 2021
Grant dateOct 19, 2021

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A non-ionic photoacid generator and a chemically amplified positive-type photoresist composition for a thick film including the non-ionic photoacid generator. The non-ionic photoacid generator may not only exhibit high solubility in a solvent of the photoresist composition, but may also exhibit chemical and thermal stability and high sensitivity. In particular, the non-ionic photoacid generator is decomposed by light to generate an acid, and at the same time, can exhibit a corrosion preventing effect on a metal substrate.

First claim

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The invention claimed is: 1. A non-ionic photoacid generator comprising at least one functional group represented by the following Chemical Formula 1: wherein, in Chemical Formula 1, R 1 is a C1 to C10 aliphatic hydrocarbon group substituted or unsubstituted with at least one of a halogen atom, an alkylthio group, and an alicyclic hydrocarbon group; a C1 to C10 perfluoroalkyl group; a C6 to C20 aryl group substituted or unsubstituted with at least one of a halogen atom, an alkylthio group, an alkyl group, and an acyl group; or a C7 to C20 arylalkyl group substituted or unsubstituted with a halogen atom and an alkylthio group, and Z is a group represented by the following Chemical Formula 2b: wherein, in Chemical Formula 2b, R 2 is hydrogen, a C3 to C10 alkyl group, or a C1 to C10 hydroxyalkyl group, R 3 is a chemical bond, a C1 to C10 alkylene group, or a group represented by the following Chemical Formula 3, and when R 2 is a C3 to C10 alkyl group and R 3 is a C1 to C10 alkylene group, they are connected to each other to form a C4 to C20 aliphatic ring, wherein, in Chemical Formula 3, R a is a chemical bond or a C1 to C10 alkylene group, R b is a C1 to C10 alkylene group, n is an integer of 1 to 10, and when n is 2 or more, each R b , which is repeated two or more times, is the same or different from each other. 2. The non-ionic photoacid generator of claim 1 , wherein the non-ionic photoacid generator is represented by the following Chemical Formula 5a or 5b: wherein, in Chemical Formulae 5a and 5b, R 1 , R 2 , and R 3 are as defined above in Chemical Formulae 1, 2b, and 3. 3. A chemically amplified positive-type photoresist composition for a thick film comprising the non-ionic photoacid generator of claim 2 . 4. A chemically amplified positive-type photoresist composition for a thick film comprising the non-ionic photoacid generator of claim 1 . 5. The chemically amplified positive-type photoresist composition for a thick film of claim 4 , wherein the composition does not comprise a separate corrosion inhibitor. 6. The chemically amplified positive-type photoresist composition for a thick film of claim 4 , wherein the composition further comprises an alkali developable polymer resin, a photoinitiator and an organic solvent. 7. The non-ionic photoacid generator of claim 1 , comprising one, two, three or four functional groups represented by Chemical Formula 1 as defined in claim 1 . 8. The non-ionic photoacid generator of claim 1 , wherein R 1 is methyl, ethyl, propyl, isopropyl, butyl, sec-butyl, tert-butyl, isobutyl, amyl, isoamyl, tert-amyl, hexyl, 2-hexyl, 3-hexyl, heptyl, 2-heptyl, 3-heptyl, isoheptyl, tert-heptyl, octyl, isooctyl, tert-octyl, 2-ethylhexyl, nonyl, isononyl, decyl, dodecyl, tridecyl, tetradecyl, pentadecyl, hexadecyl, heptadecyl, octadecyl, trifluoromethyl, pentafluoroethyl, heptafluoropropyl, nonafluorobutyl, tridecylfluorohexyl, heptafluorooctyl, 2,2,2-trifluoroethyl, 1,1-difluoroethyl, 1,1-difluoropropyl, 1,1,2,2-tetrafluoropropyl, 3,3,3-trifluoropropyl, 2,2,3,3,3-pentafluoropropyl, 1,1,2,2-tetrafluorotetradecyl, phenyl, naphthyl, 2-methylphenyl, 3-methylphenyl, 4-methylphenyl, 4-vinylphenyl, 3-isopropylphenyl, 4-isopropylphenyl, 4-butylphenyl, 4-isobutylphenyl, 4-tert-butylphenyl, 4-hexylphenyl, 4-cyclohexylphenyl, 4-octylphenyl, 4-(2-ethylhexyl)phenyl, 2,3-dimethylphenyl, 2,4-dimethylphenyl, 2,5-dimethylphenyl, 2,6-dimethylphenyl, 3,4-dimethylphenyl, 3,5-dimethylphenyl, 2,4-di-tert-butylphenyl, 2,5-di-tert-butylphenyl, 2,6-di-tert-butylphenyl, 2,4-di-tert-pentylphenyl, 2,5-di-tert-amylphenyl, 2,5-di-tert-octylphenyl, cyclohexylphenyl, biphenyl, 2,4,5-trimethylphenyl, 2,4,6-trimethylphenyl, 2,4,6-triisopropylphenyl, pentafluorophenyl, chlorophenyl, dichlorophenyl, trichlorophenyl, 2,4-bis(trifluoromethyl)phenyl, bromoethylphenyl, 4-methylthiophenyl, 4-butylthiophenyl, 4-octylthiophenyl, 4-dodecylthiophenyl, 1,2,5,6-tetrafluoro-4-methylthiophenyl, 1,2,5,6-tetrafluoro-4-butylthiophenyl, 1,2,5,6-tetrafluoro-4-dodecylthiophenyl, benzyl, phenethyl, 2-phenylpropan-2-yl, diphenylmethyl, triphenylmethyl, styryl, cinnamyl, pentafluorophenylmethyl, phenyldifluoromethyl, 2-phenyl-tetrafluoroethyl, 2-(pentafluorophenyl)ethyl, p-methylthiobenzyl, 2,3,5,6-tetrafluoro-4-methylthiophenylethyl, acetylphenyl, acetylnaphthyl, benzoylphenyl, 1-anthraquinolyl, or 2-anthraquinolyl group. 9. A non-ionic photoacid generator comprising at least one functional group represented by the following Chemical Formula 4a or 4b: wherein, in Chemical Formulae 4a and 4b, R 1 is a C1 to C10 aliphatic hydrocarbon group substituted or unsubstituted with at least one of a halogen atom, an alkylthio group, and an alicyclic hydrocarbon group; a C1 to C10 perfluoroalkyl group; a C6 to C20 aryl group substituted or unsubstituted with at least one of a halogen atom, an alkylthio group, an alkyl group, and an acyl group; or a C7 to C20 arylalkyl group substituted or unsubstituted with a halogen atom and an alkylthio group, R 2 is hydrogen, a C3 to C10 alkyl group, or a C1 to C10 hydroxyalkyl group, R 3 is a chemical bond, a C1 to C10 alkylene group, or a group represented by the following Chemical Formula 3, and when R 2 is a C3 to C10 alkyl group and R 3 is a C1 to C10 alkylene group, they are connected to each other to form a C4 to C20 aliphatic ring, wherein, in Chemical Formula 3, R a is a chemical bond or a C1 to C10 alkylene group, R b is a Cl to C10 alkylene group, n is an integer of 1 to 10, and when n is 2 or more, each R b , which is repeated two or more times, is the same or different from each other, T is —H, —(C═O)OH, —O—(C═O)OH, —(C═O)NH 2 , —NH—(C═O)H, —OCH 3 , —SH, —NH 2 , —NO 2 , —CF 3 , or —SF 3 , and R c is a C4 to C20 aliphatic ring. 10. A chemically amplified positive-type photoresist composition for a thick film comprising the non-ionic photoacid generator of claim 9 . 11. The chemically amplified positive-type photoresist composition for a thick film of claim 10 , wherein the composition does not comprise a separate corrosion inhibitor. 12. The chemically amplified positive-type photoresist composition for a thick film of claim 10 , wherein the composition further comprises an alkali developable polymer resin, a photoinitiator and an organic solvent. 13. The non-ionic photoacid generator of claim 9 , comprising one, two, three or four functional groups represented by Chemical Formulae 4a or 4b as defined in claim 9 . 14. The non-ionic photoacid generator of claim 9 , wherein R 1 is methyl, ethyl, propyl, isopropyl, butyl, sec-butyl, tert-butyl, isobutyl, amyl, isoamyl, tert-amyl, hexyl, 2-hexyl, 3-hexyl, heptyl, 2-heptyl, 3-heptyl, isoheptyl, tert-heptyl, octyl, isooctyl, tert-octyl, 2-ethylhexyl, nonyl, isononyl, decyl, dodecyl, tridecyl, tetradecyl, pentadecyl, hexadecyl,

Assignees

Inventors

Classifications

  • C07D221/14Primary

    Aza-phenalenes, e.g. 1,8-naphthalimide · CPC title

  • G03F7/0045Primary

    with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors · CPC title

  • Macromolecular compounds which are photodegradable, e.g. positive electron resists (G03F7/075 takes precedence; macromolecular quinonediazides G03F7/023) · CPC title

  • with perfluoro compounds, e.g. for dry lithography (G03F7/0048 takes precedence) · CPC title

  • G03F7/004Primary

    Photosensitive materials (G03F7/12, G03F7/14 take precedence) · CPC title

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What does patent US11150555B2 cover?
A non-ionic photoacid generator and a chemically amplified positive-type photoresist composition for a thick film including the non-ionic photoacid generator. The non-ionic photoacid generator may not only exhibit high solubility in a solvent of the photoresist composition, but may also exhibit chemical and thermal stability and high sensitivity. In particular, the non-ionic photoacid generator…
Who is the assignee on this patent?
Lg Chemical Ltd
What technology area does this patent fall under?
Primary CPC classification C07D221/14. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Oct 19 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).