Measurement device and measurement system

US11150263B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11150263-B2
Application numberUS-201916712796-A
CountryUS
Kind codeB2
Filing dateDec 12, 2019
Priority dateDec 14, 2018
Publication dateOct 19, 2021
Grant dateOct 19, 2021

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Provided is a measurement device including a data acquisition unit that acquires a data stream obtained in time series by a first sensor provided in a structure, and representing impact given to the structure by a movement of a moving object, and a processing unit that obtains a covariance based on the data stream and detects a timing of the impact given to the structure by the movement of the moving object, based on the covariance.

First claim

Opening claim text (preview).

What is claimed is: 1. A measurement device comprising: a data acquisition unit acquiring a data stream that is obtained in time series by a first sensor provided in a structure and that represents an impact given to the structure by a movement of a moving object; and a processing unit obtaining a covariance based on the data stream and detecting a timing of the impact given to the structure by the movement of the moving object, based on the covariance. 2. The measurement device according to claim 1 , wherein the processing unit obtains a self-covariance of the data stream as the covariance, and detects a timing of the impact based on the self-covariance. 3. The measurement device according to claim 2 , wherein the processing unit obtains the self-covariance of the data stream in the same section, as the covariance. 4. The measurement device according to claim 2 , wherein the processing unit obtains a square envelope of an amplitude waveform of the impact as the self-covariance. 5. The measurement device according to claim 4 , wherein the processing unit performs high-pass filter processing on the data stream, acquires a value obtained by squaring the data stream subjected to the high-pass filter processing, and performs low-pass filter processing on the squared value, thereby obtaining the self-covariance. 6. The measurement device according to claim 1 , wherein the data acquisition unit acquires a second data stream obtained in time series by a second sensor provided at a position different from a position in which the first sensor is provided in the structure, and representing the impact on the structure by the movement of the moving object, and the processing unit obtains the covariance between a first data stream which is the data stream and the second data stream. 7. The measurement device according to claim 1 , wherein the data stream is a data stream of an acceleration, and the processing unit obtains the covariance between the data stream of the acceleration and a data stream of a velocity obtained from the data stream of the acceleration. 8. The measurement device according to claim 1 , wherein the processing unit obtains an intensity of the impact at a timing of the impact, based on the covariance. 9. The measurement device according to claim 1 , wherein the processing unit performs bandpass filter processing on the data stream and obtains the covariance based on the data stream subjected to the bandpass filter processing. 10. The measurement device according to claim 9 , wherein the bandpass filter processing is processing for passing a frequency bandwidth in which a gain of response frequency characteristics of the impact is larger than 1. 11. The measurement device according to claim 1 , wherein the processing unit obtains the covariance in a section including one wavelength of a waveform of the impact. 12. The measurement device according to claim 11 , wherein the processing unit obtains the covariance in a section having a section length shorter than two wavelengths of the waveform of the impact. 13. The measurement device according to claim 1 , wherein the processing unit obtains the covariance in a section having a section length in which an emphasized waveform by the covariance becomes a single-peak waveform. 14. The measurement device according to claim 1 , wherein the processing unit performs offset adjustment of a section for obtaining the covariance such that a peak timing of an emphasized waveform by the covariance matches an impact occurrence timing. 15. The measurement device according to claim 1 , wherein the first sensor is provided in an area through which the moving object passes in the structure, and the processing unit detects the timing of the impact to detect a timing at which the moving object passes through the passing area. 16. The measurement device according to claim 1 , wherein the processing unit performs detection of an axle of the moving object based on the covariance. 17. A measurement system comprising: the measurement device according to claim 1 ; and the first sensor.

Assignees

Inventors

Classifications

  • G01P15/18Primary

    in two or more dimensions · CPC title

  • G01P15/00Primary

    Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration · CPC title

  • Data stream processing; Continuous queries · CPC title

  • G01G19/03Primary

    for weighing during motion ({G01G19/022, G01G19/045,} G01G19/04, G01G19/07 take precedence {; weighing a continuous stream material during flow G01G11/00; check weighing of materials dispensed into removable containers G01G15/00}) · CPC title

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What does patent US11150263B2 cover?
Provided is a measurement device including a data acquisition unit that acquires a data stream obtained in time series by a first sensor provided in a structure, and representing impact given to the structure by a movement of a moving object, and a processing unit that obtains a covariance based on the data stream and detects a timing of the impact given to the structure by the movement of the …
Who is the assignee on this patent?
Seiko Epson Corp
What technology area does this patent fall under?
Primary CPC classification G01P15/18. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 19 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).