High refractive index hydrogenated silicon carbide and process

Patent metadata

Field	Value
Publication number	US-11142820-B2
Application number	US-201916250488-A
Country	US
Kind code	B2
Filing date	Jan 17, 2019
Priority date	Jan 17, 2019
Publication date	Oct 12, 2021
Grant date	Oct 12, 2021

Abstract

In a method for depositing a layer of amorphous hydrogenated silicon carbide (SiC:H), a gas mixture comprising a reactive gas to inert gas volume ratio of 1:12 to 2:3 is introduced into a reaction chamber of a plasma-enhanced chemical vapor deposition apparatus. The reactive gas has a ratio of Si of 50 to 60, C of 3 to 13, and H of 32 to 42 at %. The inert gas comprises i) a first inert gas selected from helium, neon and mixtures; and ii) a second inert gas selected from argon, krypton, xenon and mixtures. The reaction plasma is at a power frequency of 1-16 MHz at a power level of 100 W to 700 W. The resulting layer exhibits a refractive index of not less than 2.4 and a loss of not more than 180 dB/cm at an indicated wavelength within 800 to 900 nm.

First claim

What is claimed is:

1. A method for depositing a layer of amorphous hydrogenated silicon carbide (SiC:H), comprising
a) introducing a gas mixture comprising a reactive gas and an inert gas into a reaction chamber of a plasma-enhanced chemical vapor deposition apparatus at a reactive gas to inert gas volume ratio of 1:12 to 2:3, wherein
the reactive gas comprises a silicon source and a carbon source, and
the inert gas comprises i) a first inert gas selected from the group consisting of helium, neon and mixtures thereof and ii) a second inert gas selected from the group consisting of argon, krypton, xenon and mixtures thereof, the inert gas having a volume ratio of first inert gas to second inert gas of 2:5 to 6:5; and

b) reacting the reactive gas in the presence of a plasma;
wherein
the plasma is generated using plasma generation power at a frequency of from about 1-16 MHz at a power level of from 50 W to 300 W,
the reactive gas and the inert gas are introduced at a total reactive gas flow rate of from 1000 sccm to 4000 sccm and a total inert gas flow rate of from 6000 sccm to 12,000 sccm, the total reactive gas flow rate and the total inert gas flow rate and the plasma conditions being sufficient to provide the amorphous hydrogenated silicon carbide layer having an atomic concentration ratio of Si of 50 at % to 60 at %, C of 3 at % to 13 at %, and H of 32 at % to 42 at % at a deposition rate of amorphous hydrogenated silicon carbide of from about 2 nm/sec to about 6 nm/sec, and
the total reactive gas flow rate and the total inert gas flow rate and plasma conditions being such that the amorphous hydrogenated silicon carbide layer as deposited exhibits both a refractive index of not less than 2.6 and an optical loss of not more than 120 dB/cm at a wavelength of 825 nm.

2. The method of claim 1 , wherein the silicon source comprises silane (SiH 4 ) and the carbon source comprises methane (CH 4 ).

3. The method of claim 1 , wherein the amorphous hydrogenated silicon carbide layer has an atomic concentration ratio of Si of 52 at % to 58 at %, C of 5 at % to 11 at %, and H of 34 at % to 40 at %.

4. The method of claim 1 , wherein the total reactive gas flow rate of is from 1200 sccm to 4000 sccm.

5. The method of claim 1 , wherein the reaction of the reactive gas is carried out at a substrate temperature of not more than 250° C.

6. The method of claim 1 , wherein the reaction of the reactive gas is carried out at a substrate temperature of from 200° C. to 225° C.

7. The method of claim 1 , wherein the amorphous hydrogenated silicon carbide layer exhibits a refractive index of not less than 2.8.

8. The method of claim 1 , wherein the optical loss is not more than 100 dB/cm.

9. The method of claim 1 , wherein the optical loss is not more than 50 dB/cm.

10. The method of claim 1 , wherein
the amorphous hydrogenated silicon carbide layer has an atomic concentration ratio of Si of 52 at % to 58 at %, C of 3 at % to 13 at %, and H of 36 at % to 39 at %;
the reaction of the reactive gas is carried out at a substrate temperature of from 200° C. to 225° C.

11. The method of claim 1 , wherein the total reactive gas flow rate of is from 2500 sccm to 4000 sccm.

Assignees

• Seagate Technology Llc

Inventors

• Huang Xiaoyue
• Zhang Deming
• Hovinen Minna
• Zhou Ziyou

Classifications

• G02B2006/12035

  Materials · CPC title

• G02B6/122

  Basic optical elements, e.g. light-guiding paths · CPC title

• G02B6/021

  characterised by the core or cladding or coating, e.g. materials, radial refractive index profiles, cladding shape · CPC title

• C23C16/325 Primary

  Silicon carbide · CPC title

• C01B32/963

  Preparation from compounds containing silicon · CPC title