Device and method for determining a temperature or a temperature-dependent value usable for determining the temperature, temperature sensor, pressure sensor and combination sensor

Patent metadata

Field	Value
Publication number	US-11125627-B2
Application number	US-201815909618-A
Country	US
Kind code	B2
Filing date	Mar 1, 2018
Priority date	Mar 3, 2017
Publication date	Sep 21, 2021
Grant date	Sep 21, 2021

Abstract

In accordance with an embodiment, a device includes an interface configured for obtaining at least one measurement signal from a temperature sensor. In a first time interval the at least one measurement signal comprises information about a temperature-dependent voltage difference between a first temperature-dependent voltage at a first diode of the temperature sensor and a second temperature-dependent voltage at a second diode of the temperature sensor. In a second time interval the at least one measurement signal comprises information about a measurement value of a temperature-dependent voltage at a temperature-dependent electrical component of the temperature sensor.

First claim

What is claimed is:

1. A device for determining a temperature or a temperature-dependent value usable for determining the temperature, the device comprising:
an interface configured for obtaining at least one measurement signal from a temperature sensor, wherein in a first time interval the at least one measurement signal comprises information about a temperature-dependent voltage difference between a first temperature-dependent voltage at a first diode of the temperature sensor and a second temperature-dependent voltage at a second diode of the temperature sensor, and wherein in a second time interval the at least one measurement signal comprises information about a measurement value of a temperature-dependent voltage at a temperature-dependent electrical component of the temperature sensor; and
a calculation circuit configured for:
determining at least one first calibration measurement value at a first calibration temperature and a second calibration measurement value at a second calibration temperature in the first time interval on the basis of the information about the temperature-dependent voltage difference,
determining at least one first calibration voltage value at the temperature-dependent electrical component at the first calibration temperature and a second calibration voltage value at the temperature-dependent electrical component at the second calibration temperature in the first time interval, and
determining the temperature or the temperature-dependent value usable for determining the temperature in the second time interval on the basis of the information about the measurement value of the temperature-dependent voltage at the temperature-dependent electrical component and on the basis of at least the first calibration voltage value or the second calibration voltage value.

2. The device as claimed in claim 1 , wherein the calculation circuit is configured to determine the temperature or the temperature-dependent value usable for determining the temperature by using a mathematical function on the basis of a mathematical relationship between the first calibration voltage value at the first calibration temperature and the second calibration voltage value at the second calibration temperature.

3. The device as claimed in claim 1 , wherein the calculation circuit is configured to determine the temperature or the temperature-dependent value usable for determining the temperature on the basis of the information about the measurement value of the temperature-dependent voltage at the temperature-dependent electrical component and on the basis of a two point calibration on the basis of the first calibration voltage value and on the basis of the second calibration voltage value.

4. The device as claimed in claim 1 , wherein the calculation circuit is configured to determine the temperature or the temperature-dependent value usable for determining the temperature by using a lookup table, wherein the lookup table is based on at least the first calibration voltage value and the second calibration voltage value.

5. The device as claimed in claim 1 , wherein the first calibration measurement value corresponds to a first temperature measurement value and the second calibration measurement value corresponds to a second temperature measurement value.

6. The device as claimed in claim 1 , wherein the calculation circuit is configured to determine a reference temperature on the basis of the information about the temperature-dependent voltage difference, wherein the calculation circuit is configured to compare the determined temperature with the reference temperature and to determine anew the first calibration measurement value at the first calibration temperature, the second calibration measurement value at the second calibration temperature, the first calibration voltage value at the temperature-dependent electrical component at the first calibration temperature and the second calibration voltage value at the temperature-dependent electrical component at the second calibration temperature if a deviation between the reference temperature and the determined temperature is greater than a deviation threshold value.

7. The device as claimed in claim 1 , wherein the calculation circuit comprises a processor.

8. A method for determining a temperature or a temperature-dependent value usable for determining the temperature, the method comprising:
obtaining a first measurement signal from a temperature sensor, wherein in a first time interval the first measurement signal comprises information about a temperature-dependent voltage difference between a first temperature-dependent voltage at a first diode of the temperature sensor and a second temperature-dependent voltage at a second diode of the temperature sensor;
determining at least one first calibration measurement value at a first calibration temperature and a second calibration measurement value at a second calibration temperature in the first time interval on the basis of the information about the temperature-dependent voltage difference;
determining at least one first calibration voltage value at a temperature-dependent electrical component of the temperature sensor at the first calibration temperature and a second calibration voltage value at the temperature-dependent electrical component at the second calibration temperature in the first time interval; and
obtaining a second measurement signal from the temperature sensor in a second time interval comprising information about a measurement value of a temperature-dependent voltage at the temperature-dependent electrical component; and
determining the temperature or the temperature-dependent value usable for determining the temperature in the second time interval on the basis of the information about the measurement value of the temperature-dependent voltage at the temperature-dependent electrical component and on the basis of at least the first calibration voltage value or the second calibration voltage value.

9. The method as claimed in claim 8 , wherein determining the temperature or the temperature-dependent value usable for determining the temperature is performed using a mathematical function on the basis of a mathematical relationship between the first calibration voltage value at the first calibration temperature and the second calibration voltage value at the second calibration temperature.

10. The method as claimed in claim 8 , wherein determining the temperature or the temperature-dependent value usable for determining the temperature on the basis of the information about the measurement value of the temperature-dependent voltage at the temperature-dependent electrical component is performed on the basis of a two point calibration on the basis of the first calibration voltage value and on the basis of the second calibration voltage value.

11. The method as claimed in claim 8 , wherein determining the temperature or the temperature-dependent value usable for determining the temperature is performed using a lookup table, wherein the lookup table is based on at least the first calibration voltage value and the second calibration voltage value.

12. The method as claimed in claim 8 , wherein the first calibration measurement value corresponds to a first temperature measurement value and the second calibration measurement value corresponds to a second temperature measurement value.

13. The method as claimed in claim 8 , further comprising:
determining a reference temperature on the basis of the information about the temperature-dependent voltage difference;
comparing the determined temperature with the reference temperature; and
determining anew the first calibratio

Assignees

• Infineon Technologies Ag

Inventors

• Jenkner Christian
• Neumaier Daniel

Classifications

• G01K15/005

  Calibration · CPC title

• G01K15/00

  Testing or calibrating of thermometers · CPC title

• G01L11/02

  by optical means · CPC title

• G01K7/01 Primary

  using semiconducting elements having PN junctions (G01K7/02, G01K7/16, G01K7/30 take precedence) · CPC title

• H04R1/04

  Structural association of microphone with electric circuitry therefor (in electric hearing aids H04R25/00) · CPC title