Component life cycle test categorization and optimization

Patent metadata

Field	Value
Publication number	US-11119877-B2
Application number	US-201916571376-A
Country	US
Kind code	B2
Filing date	Sep 16, 2019
Priority date	Sep 16, 2019
Publication date	Sep 14, 2021
Grant date	Sep 14, 2021

Abstract

A system for testing electrical components comprising a supplier test system operating on a first processor and configured to generate test data for a component and to store the component test data on a block chain. A board level test system operating on a second processor and configured to generate test data for a board and to store the board test data on the block chain. A test tracking system configured to request a first key to access to the component test data and a second key to access the board test data and to store the first key and the second key.

First claim

What is claimed is:

1. A system for testing electrical components comprising:
a supplier test system operating on a first processor and configured to generate test data for a component and to store the component test data on a block chain;
a board level test system operating on a second processor and configured to generate test data for a board and to store the board test data on the block chain; and
a test tracking system configured to request a first key to access the component test data and a second key to access the board test data and to store the first key and the second key.

2. The system of claim 1 further comprising an assembly test system operating on a third processor and configured to generate test data for an assembly and to store the assembly test data on the block chain, wherein the test tracking system is further configured to request a third key to access the assembly test data and to store the third key.

3. The system of claim 1 further comprising a rack test system operating on a third processor and configured to generate test data for a rack and to store the rack test data on the block chain, wherein the test tracking system is further configured to request a third key to access the rack test data and to store the third key.

4. The system of claim 1 wherein the test tracking system is configured to receive first set data identifying the board test data and the component test data and second set data and to perform a Jaccard Index analysis on the first set data and the second set data.

5. The system of claim 1 wherein the test tracking system is configured to receive an advanced shipping notice and to generate piece part query data from the advanced shipping notice.

6. The system of claim 1 further comprising:
an assembly test system operating on a third processor and configured to generate test data for an assembly and to store the assembly test data on the block chain, wherein the test tracking system is further configured to request a third key to access the assembly test data and to store the third key; and
a rack test system operating on a fourth processor and configured to generate test data for a rack and to store the rack test data on the block chain, wherein the test tracking system is further configured to request a fourth key to access the rack test data and to store the fourth key.

7. The system of claim 1 further comprising:
an assembly test system operating on a third processor and configured to generate test data for an assembly and to store the assembly test data on the block chain, wherein the test tracking system is further configured to request a third key to access the assembly test data and to store the third key; and
wherein the test tracking system is configured to receive first set data identifying the board test data and the component test data and second set data and to perform a Jaccard Index analysis on the first set data and the second set data.

8. The system of claim 1 further comprising:
an assembly test system operating on a third processor and configured to generate test data for an assembly and to store the assembly test data on the block chain, wherein the test tracking system is further configured to request a third key to access the assembly test data and to store the third key; and
wherein the test tracking system is configured to receive an advanced shipping notice and to generate piece part query data from the advanced shipping notice.

9. A method for testing electrical components comprising:
generating test data for a component using component test equipment;
storing the component test data on a block chain of a data memory device;
generating test data for a board using board test equipment;
storing the board test data on the block chain of the data memory device;
requesting a first key to access the component test data;
requesting a second key to access the board test data; and
storing the first key and the second key.

10. The method of claim 9 further comprising:
generating test data for an assembly;
storing the assembly test data on the block chain;
requesting a third key to access the assembly test data; and
storing the third key.

11. The method of claim 9 further comprising:
generating test data for a rack;
storing the rack test data on the block chain;
requesting a third key to access the rack test data; and
storing the third key.

12. The method of claim 9 further comprising:
receiving first set data identifying the board test data and the component test data and second set data; and
performing a Jaccard Index analysis on the first set data and the second set data.

13. The method of claim 9 further comprising:
receiving an advanced shipping notice; and
generating piece part query data from the advanced shipping notice.

14. A method for testing electrical components comprising:
generating test data for a component using component test equipment;
storing the component test data on a block chain of a data memory device;
generating test data for a board using board test equipment;
storing the board test data on the block chain of the data memory device;
requesting a first key to access the component test data using the data memory device;
requesting a second key to access the board test data; and
storing the first key and the second key.

15. The method of claim 14 further comprising:
generating test data for an assembly; and
storing the assembly test data on the block chain.

16. The method of claim 15 further comprising;
requesting a third key to access the assembly test data; and
storing the third key.

17. The method of claim 14 further comprising:
generating test data for a rack; and
storing the rack test data on the block chain.

18. The method of claim 17 further comprising:
requesting a third key to access the rack test data; and
storing the third key.

19. The method of claim 14 further comprising:
receiving first set data identifying the board test data and the component test data and second set data; and
performing a Jaccard Index analysis on the first set data and the second set data.

20. The method of claim 14 further comprising:
receiving an advanced shipping notice; and
generating piece part query data from the advanced shipping notice.

Assignees

• Dell Products Lp

Inventors

• Anshul Shanir
• Panikkar Shibi
• Cao Xiang
• Ji Dong

Classifications

• G06F11/263 Primary

  Generation of test inputs, e.g. test vectors, patterns or sequences {; with adaptation of the tested hardware for testability with external testers} · CPC title

• G06F11/273 Primary

  Tester hardware, i.e. output processing circuits {(G06F11/263 takes precedence)} · CPC title