Method for identifying and compensating for systems errors

Patent metadata

Field	Value
Publication number	US-11119151-B2
Application number	US-201916700778-A
Country	US
Kind code	B2
Filing date	Dec 2, 2019
Priority date	Dec 2, 2019
Publication date	Sep 14, 2021
Grant date	Sep 14, 2021

Abstract

A method for at least one of identifying and compensating for system errors in a measurement system is disclosed, wherein the measurement system comprises a signal generator and a signal analyzer. The method comprises: generating a test signal via the signal generator, the test signal having predetermined properties; forwarding the test signal to a device under test; processing the test signal via the device under test, thereby generating a transmission signal; receiving the transmission signal via the signal analyzer; determining a response function of the device under test based on the test signal and based on the transmission signal; and determining at least one periodic component of the response function. Further, a measurement system as well as a calibration system are disclosed.

First claim

The embodiments of the invention in which an exclusive property or privilege is claimed are defined as follows:

1. A method for at least one of identifying and compensating for system errors in a measurement system, said measurement system comprising a signal generator and a signal analyzer, comprising:
generating a test signal via said signal generator, said test signal having one or more properties;
forwarding said test signal to a device under test;
processing said test signal via said device under test, thereby generating a transmission signal;
receiving said transmission signal via said signal analyzer;
determining a response function of said device under test based on said test signal and based on said transmission signal; and
determining at least one periodic component of said response function.

2. The method of claim 1 , wherein said response function is at least one of a frequency response or a transfer function.

3. The method of claim 1 , wherein a transformed response function is determined in order to determine said at least one periodic component, said transformed response function being a Fourier transform or a Laplace transform of said response function.

4. The method of claim 3 , wherein a peak search is performed on the transformed response function, thereby determining peak positions of peaks in the transformed response function.

5. The method of claim 4 , wherein at least one of an electrical length or a mechanical length of at least one component of said measurement system is determined based on said determined peak positions.

6. The method of claim 5 , wherein said at least one of the electrical length or the mechanical length is displayed on a display of said measurement system.

7. The method of claim 1 , wherein the response function is filtered with a frequency selective filter in order to remove predetermined frequency ranges from said response function.

8. The method of claim 1 , wherein a device under test having a known actual response function is used, and wherein the actual response function is compared with the determined response function.

9. The method of claim 8 , wherein correction parameters for the measurement system are determined based on the comparison of the actual response function with the determined response function.

10. The method of claim 9 , wherein a corrected response function of another device under test is determined based on the correction parameters.

11. A measurement system, comprising a signal generator, a signal analyzer and a device under test,
said signal generator being configured to generate a test signal having one or more properties,
said signal generator being configured to forward said test signal to said device under test,
said signal analyzer being configured to receive a transmission signal from said device under test,
said signal analyzer being configured to determine a response function of said device under test based on said test signal and based on said transmission signal, and
said signal analyzer being configured to determine at least one periodic component of said response function.

12. The measurement system of claim 11 , wherein said response function is at least one of a frequency response or a transfer function.

13. The measurement system of claim 11 , wherein said signal analyzer is configured to determine a transformed response function in order to determine said at least one periodic component, said transformed response function being a Fourier transform or a Laplace transform of said response function.

14. The measurement system of claim 13 , wherein said signal analyzer is configured to perform a peak search on the transformed response function, thereby determining peak positions of peaks in the transformed response function.

15. The measurement system of claim 14 , wherein said signal analyzer is configured to determine at least one of an electrical length or a mechanical length of at least one component of said measurement system based on said determined peak positions.

16. The measurement system of claim 15 , further comprising a display, wherein said signal analyzer is configured to display said at least one of the electrical length or the mechanical length on said display.

17. The measurement system of claim 15 , wherein said signal analyzer is configured to filter the response function with a frequency selective filter in order to remove predetermined frequency ranges from said response function.

18. The measurement system of claim 17 , wherein the frequency selective filter is established as at least one of hardware or software.

19. A calibration system, comprising a signal generator, a signal analyzer and a device under test, wherein said device under test has a known actual response function,
said signal generator being configured to generate a test signal having a plurality of properties,
said signal generator being configured to forward said test signal to said device under test,
said signal analyzer being configured to receiving a transmission signal from said device under test,
said signal analyzer being configured to determine a response function of said device under test based on said test signal and based on said transmission signal, and
said signal analyzer being configured to compare said actual response function with the determined response function.

20. The calibration system of claim 19 , wherein the signal analyzer is configured to determine correction parameters for the measurement system based on the comparison of the actual response function with the determined response function and/or wherein said signal analyzer is configured to save the determined correction parameters for use with another device under test.

Assignees

• Rohde & Schwarz

Inventors

• Lagler Andreas
• Ramian Florian

Classifications

• G01R31/31705

  Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits (generation of test sequences therefor G01R31/31835, using scan test therefor G01R31/318544) · CPC title

• G01R31/2839 Primary

  using signal generators, power supplies or circuit analysers (G01R31/2879 takes precedence; multimeters G01R15/12, network analysers G01R27/28) · CPC title

• G01R27/28

  Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response (in line transmission systems H04B3/46) · CPC title

• G01R31/3177 Primary

  Testing of logic operation, e.g. by logic analysers · CPC title