Three-dimensional shape measurement device, robot system, and three-dimensional shape measurement method

Patent metadata

Field	Value
Publication number	US-11118902-B2
Application number	US-201816048421-A
Country	US
Kind code	B2
Filing date	Jul 30, 2018
Priority date	Jul 31, 2017
Publication date	Sep 14, 2021
Grant date	Sep 14, 2021

Abstract

A three-dimensional shape measurement device includes a controller, in which the controller starts a process in which a plurality of different phase pattern images is projected by a projector, whenever the phase pattern image is projected by the projector before a rising time elapses, the rising time being a time until the luminance of light does not temporally change after a light source of the projector applies the light, and measures a three-dimensional shape of a target object onto which the phase pattern image is projected on the basis of a captured image obtained by the camera after the process is performed.

First claim

What is claimed is:

1. A three-dimensional shape measurement device comprising:
a controller,
wherein the controller
starts a process in which a plurality of different phase pattern images is projected by a projector, and,
whenever the phase pattern image is projected by the projector before a rising time elapses, the rising time being a time until the luminance of light does not temporally change after a light source of the projector applies the light,
measures a three-dimensional shape of a target object onto which the phase pattern image is projected on the basis of a captured image obtained by the camera after the process is performed,

wherein the controller includes
a processor that is configured to execute the computer-executable instructions,

wherein the processor is configured to
receive an operation,
generate the plurality of phase pattern images in response to the received operation,
control projection timings at which the projector projects the plurality of phase pattern images and capturing timings at which the camera captures the plurality of phase pattern images projected by the projector,
cause the projection unit to project the plurality of phase pattern images according to the projection timings,
cause the camera to capture the phase pattern images according to the capturing timings, and
measure the three-dimensional shape of the target object on the basis of the captured image obtained by the camera.

2. The three-dimensional shape measurement device according to claim 1 ,
wherein the plurality of phase pattern images are four phase pattern images,
wherein the four phase pattern images represent a wave in which a luminance value periodically changes along a first direction on the phase pattern image,
wherein the four phase pattern images include a first phase pattern image which is a phase pattern image representing a reference wave, a second phase pattern image which is a phase pattern image representing a wave of which a phase advances by 90 degrees with respect to the wave represented by the first phase pattern image, a third phase pattern image which is a phase pattern image representing a wave of which a phase advances by 90 degrees with respect to the wave represented by the second phase pattern image, and a fourth phase pattern image which is a phase pattern image representing a wave of which a phase advances by 90 degrees with respect to the wave represented by the third phase pattern image, and
wherein the controller causes the projector to project the four phase pattern images in an order of the first phase pattern image, the third phase pattern image, the second phase pattern image, and the fourth phase pattern image.

3. The three-dimensional shape measurement device according to claim 1 ,
wherein the processor receives the operation from a user.

4. The three-dimensional shape measurement device according to claim 1 ,
wherein the processor receives a request from another device as the operation.

5. The three-dimensional shape measurement device according to claim 1 ,
wherein the controller measures the three-dimensional shape of the target object onto which the phase pattern image is projected, by using a phase shift method based on the captured image obtained by the camera.

6. A robot system comprising:
a three-dimensional shape measurement device that includes a processor which is configured to execute the computer-executable instructions so as to measure a three-dimensional shape of a target object;
a robot; and
a robot controller that moves the robot on the basis of the three-dimensional shape of the target object measured by the three-dimensional shape measurement device,
wherein the processor
starts a process in which a plurality of different phase pattern images is projected by a projector, and,
whenever the phase pattern image is projected by the projector before a rising time elapses, the rising time being a time until the luminance of light does not temporally change after a light source of the projector applies the light,
measures the three-dimensional shape of the target object onto which the phase pattern image is projected on the basis of a captured image obtained by the camera after the process is performed,
receive an operation,
generate the plurality of phase pattern images in response to the received operation,
control projection timings at which the projector projects the plurality of phase pattern images and capturing timings at which the camera captures the plurality of phase pattern images projected by the projector,
cause the projection unit to project the plurality of phase pattern images according to the projection timings,
cause the camera to capture the phase pattern images according to the capturing timings, and
measure the three-dimensional shape of the target object on the basis of the captured image obtained by the camera.

7. A three-dimensional shape measurement method comprising:
starting a process in which a plurality of different phase pattern images is projected, and
whenever the phase pattern image is projected before a rising time elapses, the rising time being a time until the luminance of light does not temporally change after applying the light,
measuring a three-dimensional shape of a target object onto which the phase pattern image is projected on the basis of a captured image after the process is performed,
wherein the process includes
receiving an operation,
generating the plurality of phase pattern images in response to the received operation,
controlling the projection timings at which the plurality of phase pattern images are projected and capturing timings at which the plurality of phase pattern images are captured,
causing the plurality pattern images to be projected according to the projection timings,
causing the phase pattern images to be captured according to the capturing timings, and
measuring the three-dimensional shape of the target object on the basis of the captured image.

Assignees

• Seiko Epson Corp

Inventors

• Tsukamoto Kentaro
• Harada Tomoki

Classifications

• H04N23/695

  Control of camera direction for changing a field of view, e.g. pan, tilt or based on tracking of objects · CPC title

• G06T7/521 Primary

  from laser ranging, e.g. using interferometry; from the projection of structured light · CPC title

• G01B11/2527

  with phase change by in-plane movement of the patern · CPC title

• G06T2207/10152

  Varying illumination · CPC title

• B25J9/1697

  Vision controlled systems · CPC title