Multi-energy-spectrum X-ray imaging system and method of substance identification of item to be inspected by using the same

Patent metadata

Field	Value
Publication number	US-11112528-B2
Application number	US-201716314093-A
Country	US
Kind code	B2
Filing date	Sep 12, 2017
Priority date	Dec 7, 2016
Publication date	Sep 7, 2021
Grant date	Sep 7, 2021

Abstract

The present disclosure discloses a method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and identifying the item to be inspected as the item corresponding to the minimum distance. The present disclosure is based on a multi-energy-spectrum X-ray imaging system, and proposes a method of substance identification by analyzing the multi-energy-spectrum substance identification issue. Compared with the conventional dual-energy X-ray system, the multi-spectrum imaging can significantly improve the system's ability to identify substances in theory, especially in the field of security applications. The improvement of substance identification is important for contraband inspection, such as, drugs, explosives.

First claim

We claim:

1. A method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising:
acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; and
determining the item to be inspected based on the transparency related vector;
wherein the determining the item to be inspected based on the transparency related vector comprises:
calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and
determining a first atomic number and a first thickness of the item corresponding to the minimum distance and a second atomic number and a second thickness of an item corresponding to the next minimum distance;
determining an atomic number and a thickness of the item to be inspected by using a linear interpolation algorithm based on the first and second atomic numbers and the first and second thicknesses; and
determining a kind of the item to be inspected based on the atomic number and the thickness of the item to be inspected.

2. The method of claim 1 , wherein the determining one of the set of mapping points which is closest to the mapping point comprises:
determining a point which is closest to the mapping point by using the Mahalanobis distance algorithm, the Euclidean distance algorithm, or the Cosine distance algorithm.

3. A method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising:
acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; and
determining the item to be inspected based on the transparency related vector,
wherein the determining the item to be inspected based on the transparency related vector comprises:
mapping the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions into a two-dimensional plane by using a non-linear dimension reduction algorithm, so as to acquire a mapping point of the transparency related vector of the item to be inspected in the two-dimensional plane and a set of mapping points of the transparency related vectors of the multiple kinds of items in the two-dimensional plane, respectively;
determining one of the set of mapping points which is closest to the mapping point; and
identifying the item to be inspected as the one of the multiple kinds of items corresponding to the closest point.

4. The method of claim 3 , wherein the determining one of the set of mapping points which is closest to the mapping point comprises determining a point which is closest to the mapping point by using the Mahalanobis distance algorithm, the Euclidean distance algorithm, or the Cosine distance algorithm.

5. A method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising:
acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; and
determining the item to be inspected based on the transparency related vector;
wherein the determining the item to be inspected based on the transparency related vector comprises:
selecting one or more of the N energy regions as reference energy regions;
acquiring respective N transparency values of the item to be inspected in the N energy regions based on the transparency related vector;
calculating a reference transparency value based on the transparency values of the item to be inspected in the one or more energy regions which are selected as the reference regions;
calculating a relative mass attenuation coefficient value of the item to be inspected in the N energy regions based on the reference transparency value and the N transparency values;
determining one of the multiple kinds of items having a relative mass attenuation coefficient value closest to the relative mass attenuation coefficient value, and identifying the item to be inspected as the determined item.

6. The method of claim 5 , wherein the determining one of the multiple kinds of items having a relative mass attenuation coefficient value closest to the relative mass attenuation coefficient value and the identifying the item to be inspected as the determined item comprises:
determining one of the multiple kinds of items having a relative mass attenuation coefficient value closest to the relative mass attenuation coefficient value by using the minimum mean square error method.

7. The method of claim 5 , wherein the determining one of the set of mapping points which is closest to the mapping point comprises determining a point which is closest to the mapping point by using the Mahalanobis distance algorithm, the Euclidean distance algorithm, or the Cosine distance algorithm.

8. A multi-energy-spectrum X-ray imaging system, comprising:
an X-ray source configured to generate an X-ray;
a detector configured to receive the X-ray which is emitted from the X-ray source and is transmitted through or scattered by an item to be inspected and convert the received X-ray into an output signal;
a processor configured to execute program instructions to be operable to
acquire, based on the output signal, a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; and
determine the item to be inspected based on the transparency related vector; and
a memory configured to store the program instructions;
wherein the processor is further configured to determine the item to be inspected based on the transparency related vector by:
calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and
determining a first atomic number and a first thickness of the item corresponding to the minimum distance and a second atomic number and a second thickness of an item corresponding to the next minimum distance;
determining an atomic number and a thickness of the item to be inspected by using a linear interpolation algorithm based on the first and second atomic numbers and the first and second thicknesses; and
determining a kind of the item to be inspected based on the atomic number and the thickness of the item to be inspected.

9. A multi-energy-spectrum X-ray imaging system, comprising:
an X-ray source configured to generate an X-ray;
a detector configured to receive the X-ray which is emitted from the X-ray source and is transmitted through or scattered by an item to be inspected and convert the received X-ray into an output signal;
a processor configured to execute program instructions to be operable to
acquire, based on the output signal, a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; and
determine the item to be inspected based on the transparency related vector; and
a memory configured to store the program instructions,
wherein the processor is further configured to determine the item to be inspected based on the transparency related vector by:
mapping the transparency related vector and transparency related vectors stored in the system consisting of N transparency

Assignees

• Nuctech Co Ltd

Inventors

• Xu Guangming
• Liu Bicheng
• Zhao Ziran
• Gu Jianping
• Li Qiang
• Zhang Lan

Classifications

• G01N23/087 Primary

  using polyenergetic X-rays · CPC title

• G01R23/18

  with provision for recording frequency spectrum · CPC title

• G01N23/04 Primary

  and forming images of the material · CPC title

• G01N23/10

  the material being confined in a container, e.g. in a luggage X-ray scanners · CPC title

• G01N2223/1016

  X-ray · CPC title