Control device and control method of semiconductor manufacturing apparatus
US-10553507-B2 · Feb 4, 2020 · US
US11110565B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11110565-B2 |
| Application number | US-201815909634-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 1, 2018 |
| Priority date | Sep 8, 2017 |
| Publication date | Sep 7, 2021 |
| Grant date | Sep 7, 2021 |
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Official abstract text for this publication.
A polishing apparatus includes an acoustic sensor, a sound collector, an analyzer, a feature quantity calculator, and an end point calculator. The acoustic sensor detects the polishing sound of an object. The sound collector collects a polishing sound detected by the acoustic sensor. The analyzer performs frequency analysis on the power spectrum of the polishing sound with a predetermined time resolution. The feature quantity calculator calculates an arithmetic value of the power spectra having a preset time difference of the power spectra as a polishing feature quantity by using the analysis data provided by the analysis performed by the analyzer. The end point calculator determines a polishing end point of the object based on the change in the feature quantity.
Opening claim text (preview).
What is claimed is: 1. A polishing apparatus comprising: an acoustic sensor configured to detect a polishing sound of an object to be polished; a sound collector configured to collect the polishing sound detected by the acoustic sensor; an analyzer configured to perform frequency analysis on power spectra of the polishing sound with a given time resolution to acquire first data, the first data represented by a first table in which each power spectrum of the power spectra is correlated with a time point and a frequency; a calculator configured to: perform an arithmetic operation between a first part of the power spectra in the first data that is correlated with a first time point and a second part of the power spectra in the first data that is correlated with a second time point to acquire second data, the second data represented by a second table in which each of a plurality of arithmetic values is correlated with the time point and a mixed frequency; analyze each of parts of the arithmetic values in the second data that is correlated with a corresponding mixed frequency to determine whether or not the part of the arithmetic values of the second data satisfies a changes in value; synthesize two of the parts of the arithmetic values of the second data with value changes when a correlation coefficient between the two of the parts of the arithmetic values of the second data with value changes falls under a threshold value to obtain synthesized values; and an end point calculator configured to determine a polishing end point of the object based on a change in the synthesized values. 2. The polishing apparatus according to claim 1 , wherein the calculator is configured to set the first time point and the second time point to have a time difference based on polishing environment information relating to a polishing environment of the object. 3. The polishing apparatus according to claim 2 , wherein the polishing environment information includes replacement timing of a polishing component. 4. The polishing apparatus according to claim 1 , wherein the calculator is configured to calculate a product of the power spectra of different frequencies. 5. The polishing apparatus according to claim 1 , wherein the time difference is set based on a decrease time of the power spectrum. 6. The polishing apparatus according to claim 1 , wherein the calculator is configured to calculate the correlation coefficient if the second data changes from increasing to decreasing. 7. A polishing method comprising: detecting a polishing sound of an object to be polished; collecting the polishing sound; performing frequency analysis on a power spectra of the collected polishing sound with a given time resolution to acquire first data, the first data represented by a first table in which each power spectrum of the power spectra is correlated with a time point and a frequency; performing an arithmetic operation between a first part of the power spectra in the first data that is correlated with a first time point and a second part of the power spectra in the first data that is correlated with a second time point to acquire second data, the second data represented by a second table in which each of a plurality of arithmetic values is correlated with the time point and a mixed frequency; analyzing each of parts of the arithmetic values in the second data that is correlated with a corresponding mixed frequency to determine whether or not the part of the arithmetic values of the second data satisfies changes in value; synthesizing two of the parts of the arithmetic values of the second data with value changes when a correlation coefficient between the two of the parts of the arithmetic values of the second data with value changes falls under a threshold value to obtain synthesized values; and determining a polishing end point of the object based on a change in the synthesized values. 8. The method according to claim 7 , further comprising setting the first time point and the second time point to have a time difference based on polishing environment information indicative of a polishing environment of the object. 9. The method according to claim 7 , wherein the time difference is set based on a decrease time of the power spectrum. 10. The method according to claim 7 , wherein the correlation coefficient is calculated in a case where the second data changes from increasing to decreasing. 11. A polishing control apparatus comprising: a processor and a memory storing data, the processor configured to: collect a polishing sound of an object to be polished; perform frequency analysis on the power spectra of the polishing sound with a given time resolution to acquire first data, the first data represented by a first table in which each power spectrum of the power spectra is correlated with a time point and a frequency; perform an arithmetic operation between a first part of the power spectra in the first data that is correlated with a first time point and a second part of the power spectra in the first data that is correlated with a second time point to acquire second data, the second data represented by a second table in which each of a plurality of arithmetic values is correlated with the time point and a mixed frequency; analyze each of parts of the arithmetic values in the second data that is correlated with a corresponding mixed frequency to determine whether or not the part of the arithmetic values of the second data satisfies changes in value; synthesize two of the parts of the arithmetic values of the second data with value changes when a correlation coefficient between the two of the parts of the arithmetic values of the second data with value changes falls under a threshold value to obtain synthesized values; and determine a polishing end point of the object to be polished based on a change in the synthesized values. 12. The polishing control apparatus according to claim 11 , wherein the processor is configured to set the first time point and the second time point to have a time difference based on polishing environment information indicative of a polishing environment of the object to be polished. 13. The polishing control apparatus according to claim 11 , wherein the time difference is set based on a decrease time of the power spectrum. 14. The polishing control apparatus according to claim 11 , wherein the processor is configured to calculate the correlation coefficient in a case where the second data changes from increasing to decreasing.
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