Sensor opening test system, sensor opening test management terminal, sensor, sensor opening test method, and computer program

US11106558B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11106558-B2
Application numberUS-201716346550-A
CountryUS
Kind codeB2
Filing dateSep 21, 2017
Priority dateNov 14, 2016
Publication dateAug 31, 2021
Grant dateAug 31, 2021

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The present invention is provided with a sensor-side metadata acquiring unit that acquires sensor-side test metadata, an application-side metadata acquiring unit that acquires application-side test metadata, a matching unit that determines matching of acquired sensor-side test metadata and acquired application-side test metadata, and a dataflow control command instructing unit that transmits a dataflow control command instructing test data flow to an opening test application from a sensor or network adaptor specified by matched sensor-side test metadata and the application-side test metadata.

First claim

Opening claim text (preview).

The invention claimed is: 1. A sensor opening test system comprising a processor configured with a program to perform operations comprising: operation as a sensor-side metadata acquiring unit configured to acquire sensor-side test metadata for opening testing only, the sensor-side test metadata including at least a sensor identifier uniquely identifying a sensor configured to output sensing data or a network adaptor connected to the sensor and configured to transmit sensing data to a network; operation as an application-side metadata acquiring unit configured to acquire application-side test metadata for the opening testing only, the application-side test metadata comprising metadata of an opening test application for the opening testing of the sensor only, the metadata of the opening test application including at least the sensor identifier, the opening test application being configured to check whether or not an application device in which the opening test application is installed can receive data from the sensor; operation as a matching unit configured to determine matching of the acquired sensor-side test metadata and the acquired application-side test metadata, based on a sameness of the sensor identifiers; and operation as an instructing unit configured to transmit, to a distribution device configured to manage distribution of the sensing data, a dataflow control command instructing test data flow to the opening test application of the application device from the sensor or network adaptor specified by the sensor-side test metadata and the application-side test metadata that are matched. 2. The sensor opening test system according to claim 1 , wherein the sensor-side test metadata includes information indicating that the metadata comprises metadata for the opening testing, and information identifying a distribution source of sensing data of the sensor, and the application-side test metadata includes information indicating that the metadata comprises metadata for the opening testing, and information identifying a distribution destination of sensing data of the sensor. 3. The sensor opening test system according to claim 2 , wherein the processor is configured with the program to perform operations further comprising operation as a metadata setting changing unit configured to change a setting of the sensor-side test metadata to enable acquisition of the sensor-side test metadata by the sensor-side metadata acquiring unit, or to change a setting of the application-side test metadata to enable acquisition of the application-side test metadata by the application-side metadata acquiring unit. 4. The sensor opening test system according to claim 2 , wherein the processor is configured with the program to perform operations further comprising operation as a test data reception state presenting unit configured to present a reception state of test data in the opening test application. 5. The sensor opening test system according to claim 2 , wherein the sensor identifier comprises a UUID (Universally Unique Identifier). 6. The sensor opening test system according to claim 1 , wherein the processor is configured with the program to perform operations comprising operation as a metadata setting changing unit configured to change a setting of the sensor-side test metadata to enable acquisition of the sensor-side test metadata by the sensor-side metadata acquiring unit, or to change a setting of the application-side test metadata to enable acquisition of the application-side test metadata by the application-side metadata acquiring unit. 7. The sensor opening test system according to claim 6 , wherein the processor is configured with the program to perform operations further comprising operation as a test data reception state presenting unit configured to present a reception state of test data in the opening test application. 8. The sensor opening test system according to claim 6 , wherein the sensor identifier comprises a UUID (Universally Unique Identifier). 9. The sensor opening test system according to claim 1 , wherein the processor is configured with the program to perform operations comprising operation as a test data reception state presenting unit configured to present a reception state of test data in the opening test application. 10. The sensor opening test system according to claim 9 , wherein the sensor identifier comprises a UUID (Universally Unique Identifier). 11. The sensor opening test system according to claim 1 , wherein the sensor identifier comprises a UUID (Universally Unique Identifier). 12. A sensor opening test management terminal in a sensor opening test system that, with respect to sensor-side test metadata for opening testing only, the sensor-side test metadata including at least a sensor identifier uniquely identifying a sensor configured to output sensing data or a network adaptor connected to the sensor and configured to transmit sensing data to a network and application-side test metadata for the opening testing only, the application-side test metadata comprising metadata of an opening test application for the opening testing of the sensor only, the metadata including at least the sensor identifier, the opening test application being configured to check whether or not an application device in which the opening test application is installed can receive data from the sensor, determines matching of the sensor-side test metadata and the application-side test metadata, based on a sameness of the sensor identifiers, and performs the opening testing of the sensor or the network adaptor, the sensor opening test management terminal comprising a processor configured with a program to perform operations comprising: operation as a setting changing unit configured to change a setting of the sensor-side test metadata or the application-side test metadata, such that the sensor-side test metadata or the application-side test metadata is targeted for matching; and operation as a presenting unit configured to present a reception state, in the opening test application, of test data transmitted from the sensor or network adaptor. 13. A sensor in a sensor opening test system that, with respect to sensor-side test metadata for opening testing only, the sensor-side test metadata including at least a sensor identifier uniquely identifying a sensor configured to output sensing data and application-side metadata for the opening testing only, the application-side test metadata comprising metadata of an opening test application for the opening testing of the sensor only, the metadata including at least the sensor identifier, the opening test application being configured to check whether or not an application device in which the opening test application is installed can receive data from the sensor, determines matching of the sensor-side test metadata and the application-side test metadata, based on a sameness of the sensor identifiers, and performs the opening testing of the sensor, the sensor comprising: a sensor configured to output sensing data; an opening test data transmitting unit provided with a function of a normal mode for transmitting the sensing data and a sensor opening test mode, and configured to transmit test data when in the sensor opening test mode; and a presenting unit configured to present a reception state, in the opening test application, of test data transmitted from the sensor. 14. The sensor according to claim 13 , wherein the processor is configured with the program to perform operations further comprising operation as a setting changing unit configured to change a setting of the sensor-side test metadata or the applicati

Assignees

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Classifications

  • to test input/output devices or peripheral units · CPC title

  • Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing · CPC title

  • Monitoring · CPC title

  • Arrangements in telecontrol or telemetry systems for selectively calling a substation from a main station, in which substation desired apparatus is selected for applying a control signal thereto or for obtaining measured values therefrom · CPC title

  • to test CPU or processors · CPC title

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What does patent US11106558B2 cover?
The present invention is provided with a sensor-side metadata acquiring unit that acquires sensor-side test metadata, an application-side metadata acquiring unit that acquires application-side test metadata, a matching unit that determines matching of acquired sensor-side test metadata and acquired application-side test metadata, and a dataflow control command instructing unit that transmits a …
Who is the assignee on this patent?
Omron Tateisi Electronics Co
What technology area does this patent fall under?
Primary CPC classification G06F11/2221. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 31 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).