Resistive test-probe tips

Patent metadata

Field	Value
Publication number	US-11079408-B2
Application number	US-201816165928-A
Country	US
Kind code	B2
Filing date	Oct 19, 2018
Priority date	May 18, 2018
Publication date	Aug 3, 2021
Grant date	Aug 3, 2021

Abstract

A test-probe tip having a tip component, a resistive element, and a compliance member. The tip component is configured to electrically connect to a device under test at a first end of the tip component. The resistive element is electrically connected to a second end of the tip component along a signal-flow axis. The resistive element is configured to provide electrical impedance to an electrical signal passing through the resistive element. The compliance member is configured to allow movement of the tip component in a first direction when a mechanical force applied to the tip component in the first direction and to cause movement of the tip component in an opposite, second direction when the mechanical force applied to the tip component is removed or reduced. Architectures for the resistive element are also described.

First claim

The invention claimed is:

1. A test-probe tip comprising:
a tip component having a first end configured to electrically connect to a device under test, and a second end that is opposite the first end of the tip component along a signal-flow axis of the test-probe tip;
a resistive element electrically connected to the second end of the tip component along the signal-flow axis, the resistive element being configured to provide electrical impedance to an electrical signal passing through the resistive element;
a compliance member configured to allow movement of the tip component in a first axial direction along the signal-flow axis of the test-probe tip when a mechanical force applied to the tip component in the first axial direction and to cause movement of the tip component in a second axial direction along the signal-flow axis of the test-probe tip, the second axial direction being opposite to the first axial direction, when the mechanical force applied to the tip component is removed or reduced; and
a structural member, the structural member structurally coupling the tip component to the compliance member;
an air gap between the structural member and the resistive element;
in which the first layer and the second layer are concentric;
in which, in a cross-section perpendicular to the signal-flow axis of the test-probe tip, the second layer surrounds the first layer.

2. The test-probe tip of claim 1 , in which the resistive element is electrically connected to the second end of the tip component at a first end of the resistive element, in which the compliance member includes a plunger base component electrically coupled to a second end of the resistive element, the second end of the resistive element being opposite the first end of the resistive element along the signal-flow axis of the test-probe tip.

3. The test-probe tip of claim 1 , in which the resistive element is within the structural member.

4. The test-probe tip of claim 2 , in which the plunger base component is electrically coupled to the second end of the resistive element at a first end of the plunger base component, in which the compliance member further includes a barrel component, and in which a second end of the plunger base component is configured to slide inside the barrel component and along the signal-flow axis of the test-probe tip, the second end of the plunger base component being opposite the first end of the plunger base component along the signal-flow axis of the test-probe tip.

5. The test-probe tip of claim 4 , in which the compliance member further includes a spring mechanism within the barrel component, the spring mechanism being configured to allow movement of the plunger base component within the barrel component in the first axial direction when the mechanical force applied to the tip component in the first axial direction and to cause movement of the plunger base component within the barrel component in the second axial direction when the mechanical force is removed or reduced.

6. The test-probe tip of claim 1 , in which the resistive element comprises a first layer having a first impedance and a second layer having a second impedance, the second impedance being greater than the first impedance.

7. The test-probe tip of claim 6 , in which the resistive element further comprises a third layer having a third impedance, the third impedance being greater than the second impedance, in which the first layer, the second layer, and the third layer are concentric, and in which, in a cross-section perpendicular to the signal-flow axis of the test-probe tip, the second layer surrounds the first layer and the third layer surrounds the second layer.

8. The test-probe tip of claim 6 , in which the first layer and the second layer are orthogonal to the signal-flow axis of the test-probe tip.

9. The test-probe tip of claim 8 , in which the second layer is electrically nonconductive and comprises a via passing through the second layer, parallel to the signal-flow axis of the test-probe tip.

10. The test-probe tip of claim 9 , further comprising a third layer orthogonal to the signal-flow axis of the test-probe tip, the third layer having a third impedance that is lower than the second impedance, the second layer being between the first layer and the third layer, the first layer and the third layer each being electrically conductive.

11. The test-probe tip of claim 1 , in which the resistive element comprises a material selected from the group consisting of a conductive epoxy resistor having a suspended resistive material or an elastomer having a suspended resistive material.

12. A resistive element configured to provide electrical impedance to an electrical signal passing along a signal-flow axis of the resistive element, the resistive element comprising:
a first layer having a first impedance;
a second layer having a second impedance, the second impedance being greater than the first impedance, in which the first layer and the second layer are concentric in which, in a cross-section perpendicular to the signal-flow axis, the second layer surrounds the first layer; and in which the second layer is substantially an insulator.

13. The resistive element of claim 12 , in which the resistive element further comprises a third layer having a third impedance, the third impedance being greater than the second impedance, in which the first layer, the second layer, and the third layer are concentric, and in which, in a cross-section perpendicular to the signal-flow axis, the second layer surrounds the first layer and the third layer surrounds the second layer.

14. The resistive element of claim 12 , in which the first layer and the second layer are orthogonal to the signal-flow axis.

15. The resistive element of claim 14 , in which the second layer is electrically nonconductive and comprises a via passing through the second layer, parallel to the signal-flow axis.

16. The resistive element of claim 15 , further comprising a third layer orthogonal to the signal-flow axis, the third layer having a third impedance that is lower than the second impedance, the second layer being between the first layer and the third layer, the first layer and the third layer each being electrically conductive.

Assignees

• Tektronix Inc

Inventors

• Campbell Julie A
• Bartlett Josiah A

Classifications

• G01R1/06761

  related to layers · CPC title

• G01R1/06722

  Spring-loaded · CPC title

• H01C7/001

  Mass resistors · CPC title

• G01R1/06738

  related to tip portion · CPC title

• G01R1/06788

  Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments (end pieces terminating in a probe H01R11/18) · CPC title