Lens assembly, terahertz wave tomography system and method, and terahertz wave filter

Patent metadata

Field	Value
Publication number	US-11067503-B2
Application number	US-201916639849-A
Country	US
Kind code	B2
Filing date	Jun 20, 2019
Priority date	Aug 7, 2018
Publication date	Jul 20, 2021
Grant date	Jul 20, 2021

Abstract

The present disclosure provides a lens assembly, a terahertz wave tomography system and method, and a terahertz wave filter. The lens assembly includes: a first substrate and a second substrate that are oppositely disposed; a seal, wherein the seal, the first substrate and the second substrate enclose a cavity in which a magnetic fluid is filled; and a plurality of electromagnetic generating units disposed on at least one of a first side of the first substrate close to the second substrate or a second side of the first substrate away from the second substrate, wherein at least a part of the plurality of electromagnetic generating units are configured to generate a magnetic field in a case where a voltage is applied to make the magnetic fluid form a Fresnel zone plate pattern.

First claim

What is claimed is:

1. A lens assembly, comprising:
a first substrate and a second substrate that are oppositely disposed;
a seal, which encloses a cavity with the first substrate and the second substrate, wherein a magnetic fluid is filled in the cavity; and
a plurality of electromagnetic generating units disposed on at least one of a first side of the first substrate close to the second substrate or a second side of the first substrate away from the second substrate, wherein at least a part of the plurality of electromagnetic generating units are configured to generate a magnetic field, in a case where a voltage is applied, to make the magnetic fluid form a Fresnel zone plate pattern.

2. The lens assembly according to claim 1 , wherein at least one of the plurality of electromagnetic generating units comprises a solenoid.

3. The lens assembly according to claim 1 , wherein orthographic projections of the plurality of electromagnetic generating units on the first substrate are arranged in concentric rings.

4. The lens assembly according to claim 3 , wherein the orthographic projections of the plurality of electromagnetic generating units on the first substrate are arranged in the Fresnel zone plate pattern.

5. The lens assembly according to claim 1 , wherein orthographic projections of the plurality of electromagnetic generating units on the first substrate are arranged in a matrix.

6. The lens assembly according to claim 1 , wherein at least one of the plurality of electromagnetic generating units is disposed on the first side; and
wherein the lens assembly further comprises:
a first insulating layer disposed between the at least one of the plurality of electromagnetic generating units and the magnetic fluid and covering the T.

7. The lens assembly according to claim 1 , further comprising:
a second insulating layer disposed between the second substrate and the magnetic fluid.

8. The lens assembly according to claim 1 , wherein at least one of the plurality of electromagnetic generating units is disposed on the second side; and
further comprising:
a protective layer covering the at least one of the plurality of electromagnetic generating units.

9. The lens assembly according to claim 1 , wherein the plurality of electromagnetic generating units is disposed symmetrically with respect to the first substrate.

10. The lens assembly according to claim 1 , wherein a direction of the magnetic field is perpendicular to a plane where the first substrate is located.

11. The lens assembly according to claim 1 , wherein a plurality of thin film transistors is disposed in the first substrate, and each of plurality of thin film transistors is connected to at least one of the plurality of electromagnetic generating units.

12. The lens assembly according to claim 1 , wherein the plurality of electromagnetic generating units is disposed on a side of the second substrate close to the first substrate, and at least one of the first side or the second side.

13. The lens assembly according to claim 12 , wherein the plurality of electromagnetic generating units is disposed on the side of the second substrate close to the first substrate and the first side.

14. A terahertz wave tomography system, comprising: the lens assembly according to claim 1 , configured to receive a first terahertz wave and focus a second terahertz wave transmitted through the lens assembly at a position to be imaged of a sample to be imaged.

15. The terahertz wave tomography system according to claim 14 , further comprising:
a transmitter configured to transmit the first terahertz wave to the lens assembly; and
a processing device configured to receive and process a third terahertz wave transmitted through the sample to be imaged to obtain an image of the position to be imaged.

16. The terahertz wave tomography system according to claim 15 , wherein the processing device comprises:
a collimator configured to collimate the third terahertz wave transmitted through the sample to be imaged;
a focuser configured to focus the third terahertz wave collimated by the collimator;
a receiver configured to receive the third terahertz wave focused by the focuser; and
a processor configured to process the terahertz wave focused by the focuser to obtain the image of the position to be imaged.

17. A terahertz wave filter, comprising the lens assembly according to claim 1 and an aperture stop located on a light exiting side of the lens assembly, wherein the lens assembly is configured to receive terahertz waves of a plurality of wavelengths and focus a terahertz wave of a predetermined wavelength of the terahertz waves of the plurality of wavelengths at the aperture stop.

18. A terahertz wave tomography method, comprising:
transmitting a first terahertz wave to a lens assembly, wherein the lens assembly comprises:
a first substrate and a second substrate that are oppositely disposed,
a seal, which encloses a cavity with the first substrate and the second substrate, wherein a magnetic fluid is filled in the cavity, and
a plurality of electromagnetic generating units disposed on at least one of a first side of the first substrate close to the second substrate or a second side of the first substrate away from the second substrate;
applying a voltage to at least a part of the plurality of electromagnetic generating units to make the magnetic fluid form a Fresnel zone plate pattern, thereby making a second terahertz wave transmitted through the lens assembly focus at a position to be imaged of a sample to be imaged; and
receiving and processing a third terahertz wave transmitted through the sample to be imaged to obtain an image of the position to be imaged.

19. The terahertz wave tomography method according to claim 18 , wherein the at least a part of the plurality of electromagnetic generating units and other electromagnetic generating units of the plurality of electromagnetic generating units with no voltage applied are distributed in the Fresnel zone plate pattern.

20. The terahertz wave tomography method according to claim 19 , wherein the position to be imaged comprises a first position to be imaged and a second position to be imaged; and
wherein the step of applying the voltage comprises:
applying the voltage to a first part of the at least a part of the plurality of electromagnetic generating units to make the magnetic fluid form a first Fresnel zone plate pattern, thereby making the second terahertz wave transmitted through the lens assembly focus at the first position to be imaged of the sample to be imaged; and
applying the voltage to a second part of the at least a part of the plurality of electromagnetic generating units to make the magnetic fluid form a second Fresnel zone plate pattern, thereby making the second terahertz wave transmitted through the lens assembly focus at the second position to be imaged of the sample to be imaged,
wherein the second part of the at least a part of the plurality of electromagnetic generating units comprise at least one electromagnetic generating unit different from each of the first part of the at least a part of the plurality of electromagnetic generating units, so that a radius of a first half wave zone of the second Fresnel zone plate pattern is different from a radius of a first half wave zone of the first Fresnel zone plate pattern.

Assignees

• Beijing Boe Optoelectronics Tech Co Ltd
• Boe Technology Group Co Ltd

Inventors

• Guo Lanjun
• Wang Chunlei

Classifications

• H01Q19/065 Primary

  Zone plate type antennas · CPC title

• G01N2201/0633

  Directed, collimated illumination · CPC title

• G01N21/3581 Primary

  using far infrared light; using Terahertz radiation · CPC title

• H01Q15/02

  Refracting or diffracting devices, e.g. lens, prism · CPC title

• G02B3/14 Primary

  of variable focal length · CPC title