Method and device for enabling testing of a communication node
US-10659174-B2 · May 19, 2020 · US
US11063676B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11063676-B2 |
| Application number | US-202016843747-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 8, 2020 |
| Priority date | Jul 11, 2016 |
| Publication date | Jul 13, 2021 |
| Grant date | Jul 13, 2021 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
The embodiments herein relate to a method performed by a testing device for enabling testing of a communication node. The testing device measures a test parameter associated with RF characteristics of the communication node when it is located at a test location during a first condition. The communication node is configured with a node setting during the measurement in the first condition. The testing device measures the test parameter associated with the RF characteristics of the communication node when it is located at the test location during a second condition. The communication node is configured with the same node setting in the second condition as in the first condition. The testing device checks whether a result parameter associated with the test parameter measured during the first and second condition fulfills a requirement.
Opening claim text (preview).
The invention claimed is: 1. A method for testing a base station (BS), the method comprising: placing the BS in an anachoic chamber; placing a measuring device in the anachoic chamber, wherein the measuring device is an antenna or radio-frequency (RF) probe; while the BS and the measuring device are within the anachoic chamber and a temperature within the anachoic chamber is within a first temperature range, using the measuring device to measure a test parameter, thereby obtaining a first measurement value; while the BS and the measuring device are within the anachoic chamber and the temperature within the anachoic chamber is within a second temperature range, using the measuring device to measure the test parameter, thereby obtaining a second measurement value, wherein the second temperature range does not overlap with the first temperature range; and calculating Pext=Pmax+Δsample, where Δsample=m1−m2, m1 is the first measurement value, m2 is the second measurement value, and Pmax is a third measurement of the test parameter. 2. The method of claim 1 , further comprising determining whether Pext fulfills a requirement. 3. The method of claim 2 , further comprising, when the result parameter does not fulfil the requirement, verifying that the communication node is not capable of operating during the second condition. 4. The method of claim 1 , wherein the test parameter is at least one of: Effective Isotropic Radiated Power, Equivalent Isotropic Radiated Power, Equivalent Isotropic Sensitivity, Timing Alignment Error, and frequency stability. 5. The method of claim 1 , wherein the BS is an Active Antenna System (AAS) BS. 6. A testing system, the testing system comprising: an anachoic chamber; a base station (BS) positioned within the anachoic chamber; a measuring device positioned within in the anachoic chamber, wherein the measuring device is an antenna or radio-frequency (RF) probe; and a measuring system, wherein the measuring system is configured to: employ the measuring device to measure a test parameter while the BS and the measuring device are within the anachoic chamber and a temperature within the anachoic chamber is within a first temperature range, thereby obtaining a first measurement value; employ the measuring device to measure the test parameter while the BS and the measuring device are within the anachoic chamber and the temperature within the anachoic chamber is within a second temperature range, thereby obtaining a second measurement value, wherein the second temperature range does not overlap with the first temperature range; and calculate Pext=Pmax+Δsample, where Δsample=m1−m2, m1 is the first measurement value, m2 is the second measurement value, and Pmax is a third measurement of the test parameter. 7. The testing system of claim 6 , wherein the measuring system is further configured to determine whether Pext fulfills a requirement. 8. The testing system of claim 7 , wherein the measuring system is further configured to verify that the communication node is not capable of operating during the second condition as a result of determining that the result parameter does not fulfil the requirement. 9. The testing system of claim 6 , wherein the test parameter is at least one of: Effective Isotropic Radiated Power, Equivalent Isotropic Radiated Power, Equivalent Isotropic Sensitivity, Timing Alignment Error, and frequency stability. 10. The testing system of claim 6 , wherein the BS is an Active Antenna System (AAS) BS.
for measurement of specific parameters of the transmitter or components thereof · CPC title
using auxiliary channels or channel simulators · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.