Parallel trigger model for test and measurement instruments

Patent metadata

Field	Value
Publication number	US-11061077-B2
Application number	US-201715859322-A
Country	US
Kind code	B2
Filing date	Dec 29, 2017
Priority date	Mar 9, 2017
Publication date	Jul 13, 2021
Grant date	Jul 13, 2021

Abstract

A test and measurement instrument for performing multiple operations, including a port to receive a signal from a device under test; and a processor. The processor configured to, based on a parallel trigger model, execute a first process associated with first functionality of the test and measurement instrument, and execute a second process on the signal from the device under test, the second process associated with second functionality of the test and measurement instrument. The second process commencing prior to completion of the first process.

First claim

We claim:

1. A test and measurement instrument, comprising:
a port to receive a signal from a device under test;
an input configured to receive a parallel trigger model, the parallel trigger model including a procedure for performing a first process and a second process in parallel; and
a processor configured to, based on the parallel trigger model:
detect whether the parallel trigger model includes an overlap between the first process and the second process,
generate an error message in response to detecting the overlap,
when the overlap is not detected, execute the first process to cause a first functionality of the test and measurement instrument to be performed, and
when the overlap is not detected, execute the second process to cause a second functionality of the test and measurement instrument to be performed on the signal, the second process commencing prior to a completion of the first process.

2. The test and measurement instrument of claim 1 , wherein the test and measurement instrument is a data acquisition unit including a plurality of channels, and the first process causes the data acquisition unit to switch between the plurality of channels, and the second process causes the data acquisition unit to measure characteristics of the signal.

3. The test and measurement instrument of claim 1 , wherein the test and measurement instrument is a source measure unit, and the first process causes the source measure unit to switch between a plurality of sources that are to be applied to the device under test, and the second process causes the source measure unit to measure characteristics of the signal.

4. The test and measurement instrument of claim 1 , wherein the first process causes the test and measurement instrument to perform a first type of measurement and the second process causes the test and measurement instrument to perform a second type of measurement.

5. The test and measurement instrument of claim 1 , wherein to execute the first process and the second process, the processor is further configured, based on the parallel trigger model, to:
contemporaneously configure an initial configuration for a first type of operation that is included in the first process and an initial configuration for the second type of operation that is included in the second process;
execute the first type of operation in accordance with the initial configuration of the first type of operation; and
execute the second type of operation in accordance with the initial configuration of the second type of operation.

6. The test and measurement instrument of claim 5 , wherein to execute the second type of operation is in response to completion of the first type of operation.

7. The test and measurement instrument of claim 6 , wherein the processor is further configured, based on the parallel trigger model, to:
configure a next configuration of the first type of operation during the execution of the second type of operation in accordance with the initial configuration; and
in response to completion of the second type of operation, perform the first type of operation in accordance with the next configuration.

8. The test and measurement instrument of claim 1 , wherein the parallel trigger model defines a first sequence of procedures associated with the first process and a second sequence of procedures associated with the second process.

9. The test and measurement instrument of claim 1 , wherein the parallel trigger model causes the processor to execute the first process and the second process independently of one another.

10. The test and measurement instrument of claim 1 , wherein the parallel trigger model coordinates procedures within the first process with procedures within the second.

11. A method for performing first and second functionality of a test and measurement instrument, the method comprising:
receiving a parallel trigger model including a procedure for performing a first process and a second process in parallel;
detecting whether the parallel trigger model includes an overlap between the first process and the second process,
generating an error message in response to detecting the overlap,
receiving a signal from a device under test;
when the overlap is not detected, based on the parallel trigger model, performing a first process associated with a first functionality, from a start time to an end time; and
when the overlap is not detected, based on the parallel trigger model, performing a second process, associated with a second functionality, on the signal, the second process beginning prior to the end time of the first process.

12. The method of claim 11 , wherein the first process is switching circuits of the test and measurement instrument and the second process is measuring a characteristic of the signal.

13. The method of claim 11 , wherein the first process and the second process performed independently.

14. The method of claim 11 , wherein the first process and the second process are performed with one or more dependencies.

15. The method of claim 11 , wherein the first process is a first type of measurement and the second process is a second type of measurement.

16. A non-transitory computer readable storage medium having instructions stored thereon that, when executed by a processor of a test and measurement instrument, cause the test and measurement instrument to:
receive a parallel trigger model including a procedure for performing a first type of operation and a second type of operation in concert;
detect whether the parallel trigger model includes an overlap between the first process and the second process;
generate an error message in response to detecting the overlap;
when the overlap is not detected, configure a first set of components associated with a first functionality of the test and measurement instrument to perform a first type of operation based on the parallel trigger model;
when the overlap is not detected, configure, concurrently with the configuration of the first set of components, a second set of components associated with a second functionality of the test and measurement instrument to perform the second type of operation based on the parallel trigger model; and
perform the first type of operation and the second type of operation in concert based on the parallel trigger model.

17. The non-transitory computer readable storage medium of claim 16 , wherein the first type of operation is switching circuits of the test and measurement instrument and the second type of operation is measuring a characteristic of the signal.

18. The non-transitory computer readable storage medium of claim 16 , wherein the first type of operation and the second type of operation are configured and performed independently.

19. The non-transitory computer readable storage medium of claim 16 , wherein the first type of operation and the second type of operation are configured and performed dependently.

Assignees

• Keithley Instruments

Inventors

• Frackelton Brian P
• Polly George J

Classifications

• G01R13/32

  Circuits for displaying non-recurrent functions such as transients; Circuits for triggering; Circuits for synchronisation; Circuits for time-base expansion · CPC title

• G01R31/50 Primary

  Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections (testing of sparking plugs H01T13/58) · CPC title

• G01R13/0254

  for triggering, synchronisation · CPC title

• G01R31/00 Primary

  Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ({measuring superconductive properties G01R33/1238;} testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture {H10P74/00}) · CPC title