Holder for multiple reference standards for calibrating a measurement system

Patent metadata

Field	Value
Publication number	US-11060891-B2
Application number	US-202017026233-A
Country	US
Kind code	B2
Filing date	Sep 20, 2020
Priority date	Mar 10, 2017
Publication date	Jul 13, 2021
Grant date	Jul 13, 2021

Abstract

A holder is configured to hold multiple reference standards for calibrating a measurement system. The holder includes a first receptacle that is configured to receive a first reference standard. The holder includes a second receptacle that is configured to receive a second reference standard. The holder includes a calibration jig that is configured to facilitate a bijective determination of a position and orientation of the holder in space.

First claim

What is claimed is:

1. A holder for a plurality of reference standards for calibrating a measurement system, the holder comprising:
a first receptacle that is configured to receive a first reference standard;
a second receptacle that is configured to receive a second reference standard; and
a calibration jig that is configured to facilitate a bijective determination of a position and orientation of the holder in space.

2. The holder of claim 1 , wherein each of the first receptacle and the second receptacle is configured as a separate recess.

3. The holder of claim 1 , wherein:
the first receptacle comprises a first plane base and the second receptacle comprises a second plane base, and
the first plane base and the second plane base lie in a common first plane.

4. The holder of claim 3 , wherein:
the first receptacle comprises at least one first magnet that is fastened to the first plane base and configured to detachably fasten the first reference standard, and
the second receptacle comprises at least one second magnet that is fastened to the second plane base and configured to detachably fasten the second reference standard.

5. The holder of claim 3 , wherein:
the first receptacle comprises a first recess,
the second receptacle comprises a second recess,
the first recess has a first sidewall that peripherally surrounds the first plane base at least in part,
a first opening is provided in the first sidewall,
the second recess has a second sidewall that peripherally surrounds the second plane base at least in part, and
a second opening is provided in the second sidewall.

6. The holder of claim 1 , wherein:
the first receptacle comprises at least one first magnet that is configured to detachably fasten the first reference standard, and
the second receptacle comprises at least one second magnet that is configured to detachably fasten the second reference standard.

7. The holder of claim 1 , wherein:
the calibration jig comprises a first form feature configured to enable a determination of the position and orientation of the holder except for one degree of freedom, and
the calibration jig comprises a second form feature configured to enable a distinction between a first side of the holder and a second side of the holder opposite the first side.

8. The holder of claim 7 , wherein:
the first form feature is mirror-symmetrical with respect to a central plane of the holder,
the central plane is arranged between the first side and the second side and divides the holder into two parts of substantially same size, and
the second form feature is asymmetrical with respect to the central plane.

9. The holder of claim 7 , wherein the first form feature comprises a U-shaped or bowl-shaped face.

10. The holder of claim 7 , wherein:
the second form feature comprises a first plane face that faces the first side of the holder and a second plane face that faces the second side of the holder,
the first plane face is inclined at a first angle with respect to a normal direction that is orthogonal to a first plane base of the first receptacle,
the second plane face is inclined at a second angle with respect to the normal direction, and
the second angle is unequal to the first angle.

11. The holder of claim 1 , wherein:
the holder further comprises a third receptacle that is configured to receive a third reference standard and a fourth receptacle that is configured to receive a fourth reference standard,
the first receptacle and the second receptacle are arranged on a first side of the holder, and
the third receptacle and the fourth receptacle are arranged on a second side of the holder opposite the first side.

12. The holder of claim 11 , wherein:
the first receptacle has a first plane base,
the second receptacle has a second plane base,
the third receptacle has a third plane base,
the fourth receptacle has a fourth plane base,
the first plane base and the second plane base lie in a common first plane, and
the third plane base and the fourth plane base lie in a common second plane that is parallel to the common first plane.

13. The holder of claim 1 , further comprising a cylindrical through hole.

14. The holder of claim 1 , wherein:
the first reference standard is detachably fastened in the first receptacle, and
the second reference standard is detachably fastened in the second receptacle.

15. The holder of claim 14 , wherein the first reference standard is arranged parallel to the second reference standard.

16. The holder of claim 14 , wherein:
the first reference standard comprises at least one of a roughness standard, an optical standard, and a form standard, and
the second reference standard comprises at least one of a roughness standard, an optical standard, and a form standard.

17. A measurement system comprising:
a holder for a plurality of reference standards for calibrating the measurement system,
wherein the holder comprises:
a first receptacle that is configured to receive a first reference standard;
a second receptacle that is configured to receive a second reference standard; and
a calibration jig that is configured to facilitate a bijective determination of a position and orientation of the holder in space.

18. A calibration method comprising:
providing a measurement system having at least one of an optical sensor and a tactile measuring sensor;
providing a holder comprising a first receptacle in which a first reference standard is arranged, a second receptacle in which a second reference standard is arranged, and a calibration jig that is configured to facilitate a bijective determination of a position and orientation of the holder in space;
determining the position and orientation of the holder by using the calibration jig and the at least one of the optical sensor and the tactile measuring sensor; and
calibrating the measurement system using at least one of the first reference standard and the second reference standard.

Assignees

• Zeiss Carl Industrielle Messtechnik Gmbh

Inventors

• Jenisch Walter
• Schäffauer Kai
• Mayinger Philipp
• Zimmermann Michael
• Mahringer Markus
• Hitzler Stefan

Classifications

• G01D11/30 Primary

  Supports specially adapted for an instrument; Supports specially adapted for a set of instruments · CPC title

• G01B21/042 Primary

  Calibration or calibration artifacts (G01B3/30, G01B9/02072 take precedence) · CPC title

• G01B21/30

  for measuring roughness or irregularity of surfaces · CPC title