Method for inspecting composite structures using quantitative infra-red thermography

Patent metadata

Field	Value
Publication number	US-11054376-B2
Application number	US-201916575152-A
Country	US
Kind code	B2
Filing date	Sep 18, 2019
Priority date	Apr 18, 2017
Publication date	Jul 6, 2021
Grant date	Jul 6, 2021

Abstract

A system and method for inspecting a surface of a structure for defects includes an inspection apparatus having a heating device for heating a section of the surface of the structure, an infrared camera for receiving infrared radiation from the surface in response to heating, a controller configured to generate thermographs from the received infrared radiation, and a communication device. A training system includes an expert system module configured to determine correlations between a set of thermographs generated by a thermal simulation of modeled structural elements with defects, and parameters of the modeled structural elements. A computer system communicatively coupled to the training system and the inspection apparatus, is adapted to receive thermographs received from the inspection apparatus and to detect quantitative parameters of defects in the structure using the correlations obtained from the training system.

First claim

What is claimed is:

1. A method of training a system to enable an inspection apparatus to perform an accurate quantitative inspection of a surface of a structure for defects, the method comprising:
receiving operator inputs concerning properties of the structure and environmental conditions at the structure;
generating a set of structural elements using the operator inputs, each of the modeled structural elements including an integrated defect;
generating thermographs corresponding to each of the structural elements through application of a transient thermal analysis;
computing correlations between the thermographs and parameters of corresponding structural elements;
wherein the correlations enable subsequently obtained thermographs taken of structures to be analyzed to determine quantitative parameters of defects in the structure.

2. The method of claim 1 , wherein the structure is composed of a composite material.

3. The method of claim 1 , wherein the transient thermal analysis employs finite element analysis.

4. The method of claim 1 , wherein the correlations between the thermographs and the parameters of corresponding structural elements are determined using a machine learning technique.

5. The method of claim 4 , wherein the machine learning technique employs a neural network.

6. The method of claim 1 , wherein the structural elements are characterized by a location, defect type, defect size, defect orientation and entrapped media.

7. The method of claim 6 , wherein the defect type is one of delamination, unique void, matrix cracking, fiber-matrix de-bonding, multiple voids, and holes.

8. The method of claim 6 , wherein the entrapped media is a liquid or gas selected for inspection.

9. The method of claim 1 , further comprising:
determining optimal acquisition parameters for controlling the inspection apparatus based on material properties of the structure, environmental conditions, and a thermal analysis of the corresponding structural elements.

10. The method of claim 9 , wherein the acquisition parameters include a heating parameters including at least one of a heating mode, a heating time and a target heat flux level and an acquisition time for operating the inspection apparatus.

11. The method of claim 9 , wherein the thermal analysis is performed on a structural element having a smallest and a deepest defect.

Assignees

• Saudi Arabian Oil Co

Inventors

• Villette Thibault
• Traidia Abderrazak

Classifications

• G01N21/88

  Investigating the presence of flaws or contamination · CPC title

• H04N23/23

  from thermal infrared radiation · CPC title

• G06N20/00

  Machine learning · CPC title

• G01N21/8806

  Specially adapted optical and illumination features · CPC title

• G01N21/8851

  Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges (G01N21/8806 and G01N21/93 - G01N21/95692 take precedence; optical measurement of dimensions G01B11/00; optical scanning G02B26/10; image transformation G06T3/00; computerised image enhancement G06T5/00; image processing per se for flaw detection G06T7/0002) · CPC title