Semiconductor device and fingerprint identification device

US11049771B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11049771-B2
Application numberUS-201816136792-A
CountryUS
Kind codeB2
Filing dateSep 20, 2018
Priority dateMar 28, 2018
Publication dateJun 29, 2021
Grant dateJun 29, 2021

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  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for forming a semiconductor device is provided. The method includes providing a substrate, placing a first stencil having a first openwork pattern on the substrate, applying a first material onto the substrate through the first stencil, and removing the first stencil from the substrate. The first material includes a transparent material. The method also includes placing a second stencil having a second openwork pattern on the substrate, applying a second material onto the substrate through the second stencil, and removing the second stencil from the substrate. The second material includes a light-shielding material, and the second openwork pattern is different from the first openwork pattern.

First claim

Opening claim text (preview).

What is claimed is: 1. A semiconductor device, comprising: a semiconductor substrate; a light collimator layer disposed on the semiconductor substrate, wherein the light collimator layer comprises: a transparent material and a light-shielding material, wherein the transparent material is disposed correspondingly only to a pixel within the semiconductor substrate; and a plurality of light filtering particles disposed in the transparent material, wherein the light filtering particles are made of a light filtering material, wherein the light filtering particles are evenly distributed across a thickness of the transparent material. 2. The semiconductor device of claim 1 , wherein the transparent material is in direct contact with the semiconductor substrate. 3. The semiconductor device of claim 1 , wherein the transparent material comprises a light curing material, a thermal curing material, or a combination thereof. 4. The semiconductor device of claim 1 , wherein a portion of the transparent material is disposed on edges of the semiconductor substrate. 5. The semiconductor device of claim 1 , further comprising a cover plate disposed on the light collimator layer. 6. A fingerprint identification device, comprising: a semiconductor substrate; and a light collimator layer disposed on the semiconductor substrate, wherein the light collimator layer comprises: a transparent material and a light-shielding material, wherein the transparent material is disposed correspondingly only to a pixel within the semiconductor substrate; and a plurality of light filtering particles disposed in the transparent material, wherein the light filtering particles are made of a light filtering material, wherein the light filtering particles are evenly distributed across a thickness of the transparent material. 7. The fingerprint identification device of claim 6 , wherein the transparent material is in direct contact with the semiconductor substrate. 8. The fingerprint identification device of claim 6 , wherein the transparent material comprises a light curing material, a thermal curing material, or a combination thereof. 9. The fingerprint identification device of claim 6 , wherein a portion of the transparent material is disposed on edges of the semiconductor substrate. 10. The fingerprint identification device of claim 6 , further comprising a cover plate disposed on the light collimator layer.

Assignees

Inventors

Classifications

  • Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement · CPC title

  • H10D84/01Primary

    Manufacture or treatment · CPC title

  • Optical elements or arrangements associated with the image sensors · CPC title

  • Contact-type image sensors [CIS] · CPC title

  • Constructional details of image sensors · CPC title

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Frequently asked questions

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What does patent US11049771B2 cover?
A method for forming a semiconductor device is provided. The method includes providing a substrate, placing a first stencil having a first openwork pattern on the substrate, applying a first material onto the substrate through the first stencil, and removing the first stencil from the substrate. The first material includes a transparent material. The method also includes placing a second stenci…
Who is the assignee on this patent?
Vanguard Int Semiconduct Corp
What technology area does this patent fall under?
Primary CPC classification H10D84/01. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jun 29 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 6 related publications on this page (citations in our corpus or others sharing the same primary CPC).