Surface treatment processing method and surface treatment processing device

Patent metadata

Field	Value
Publication number	US-11045922-B2
Application number	US-201716098164-A
Country	US
Kind code	B2
Filing date	May 16, 2017
Priority date	May 16, 2016
Publication date	Jun 29, 2021
Grant date	Jun 29, 2021

Abstract

A first inspection step nondestructively inspects a surface side state of a treatment target to be subjected to shot processing of shooting shot media at the treatment target and evaluates that the treatment target is failed when an inspection result deviates from a first allowable range predetermined. A condition setting step sets a shot processing condition in response to the inspection result of the first inspection step for the treatment target evaluated as not failed in the first inspection step. A shot processing step performs shot processing of shooting shot media at the treatment target evaluated as not failed in the first inspection step in the shot processing condition set in the condition setting step. A second inspection step after the shot processing step nondestructively inspects a surface side state of the treatment target.

First claim

The invention claimed is:

1. A surface treatment processing method comprising:
a first inspection step of nondestructively inspecting at least one of a surface side state and an external dimension of a treatment target to be subjected to shot processing of shooting shot media at the treatment target and evaluating that the treatment target is failed when a first inspection result of the first inspection step is out of a first allowable range predetermined;
a condition setting step of setting a shot processing condition in response to the first inspection result for the treatment target evaluated as not failed in the first inspection step, after the first inspection step;
a shot processing step of performing shot processing of shooting shot media at the treatment target evaluated as not failed in the first inspection step after the condition setting step;
a second inspection step of nondestructively inspecting at least one of a surface side state and an external dimension of the treatment target after the shot processing step, wherein in the second inspection step it is evaluated that the treatment target is passed when a second inspection result of the second inspection step is within a normal range predetermined; and
a reference value resetting step of resetting a reference value of the shot processing condition at a predetermined time to suppress a ratio in which the second inspection result is above a normal range at a future time by a predetermined amount based on a calculated tendency of a temporal change in second inspection results averages, the resetting step performed before processing starts, the tendency including calculating average daily values of inspection result data determined during the second inspection step compared to a standard median value of a second range, and determining a gradient and an intercept to determine the tendency,
wherein in the first inspection step and the second inspection step, a residual stress on the surface side of the treatment target is measured, and
measurement methods of the first inspection step and the second inspection step are methods of measuring the residual stress of the treatment target, including:
an X-ray irradiation step of irradiating X-rays to the treatment target;
a movement control step of moving a first detection element and a second detection element by driving a movement mechanism; and
a stress calculation step of calculating the residual stress of the treatment target based on intensity peaks of diffracted X-rays of the treatment target respectively detected by the first detection element and the second detection element during the movement control step.

2. The surface treatment processing method according to claim 1 ,
wherein in the reference value resetting step, at least one of a shot media projection volume per unit time, a shot media projection speed, a projection pressure for projecting shot media, a rotation speed of an impeller per unit time for accelerating and shooting shot media by a centrifugal force with a rotation of the impeller, a processing time, and each reference value of a relative shooting position with respect to the treatment target is reset.

3. The surface treatment processing method according to claim 1 ,
wherein the first inspection step and the second inspection step include at least one of a step of measuring a residual stress on a surface side of the treatment target, a step of magnetically evaluating the surface side of the treatment target by an eddy current, a step of measuring a color tone on the surface side of the treatment target, and a step of measuring a surface roughness of the treatment target in order to inspect the surface side state of the treatment target.

4. The surface treatment processing method according to claim 1 ,
wherein in the movement control step, movement of the first detection element and movement of the second detection element are synchronized with each other.

5. The surface treatment processing method according to claim 1 , further comprising:
a storage step of storing at least one of the first inspection result and the second inspection result.

6. The surface treatment processing method according to claim 1 , further comprising:
a storage step of storing at least one of the first inspection result, the second inspection result, and the shot processing condition in a server,
wherein in the storage step, at least one of the first inspection result, the second inspection result, and the shot processing condition is stored in an internal storage unit, and then at least one of the first inspection result, the second inspection result, and the shot processing condition stored in the internal storage unit is stored in the server.

7. The surface treatment processing method according to claim 6 ,
wherein in the condition setting step, the shot processing condition is set in response to information input from the server.

8. A surface treatment processing device comprising:
a first inspection unit configured to nondestructively inspect at least one of a surface side state and an external dimension of a treatment target;
a control unit configured to evaluate that the treatment target is failed when a first inspection result of the first inspection unit deviates from a first allowable range predetermined and set a shot processing condition for shooting shot media at the treatment target evaluated as not failed in response to the first inspection result;
a shooting unit configured to perform shot processing of shooting shot media at the treatment target evaluated as not failed by the control unit; and
a second inspection unit configured to nondestructively inspect at least one of a surface side state and an external dimension of the treatment target subjected to the shot processing by the shooting unit,
wherein the control unit is configured to:
evaluate that the treatment target is passed when a second inspection result of the second inspection unit is within a normal range predetermined, and
reset a reference value of the shot processing condition at a predetermined time to suppress a ratio in which the second inspection result is above a normal range at a future time by a predetermined amount based on a calculated tendency of a temporal change in second inspection results averages,
wherein the control unit is configured to reset the reference value of the shot processing condition before processing starts,
wherein the tendency includes calculating average daily values of inspection result data determined by the second inspection unit compared to a standard median value of a second range, and determining a gradient and an intercept to determine the tendency, and
wherein at least one of the first inspection unit and the second inspection unit includes a stress measurement device,
the stress measurement device includes:
an X-ray generation source configured to irradiate an X-ray to the treatment target,
a first detection element configured to detect intensities of diffracted X-rays of the treatment target at a first detection position,
a second detection element configured to detect the intensities of the diffracted X-rays of the treatment target at a second detection position different from the first detection position,
a movement mechanism configured to move each of the first detection element and the second detection element in a direction orthogonal to an X-ray incident direction,
a movement control unit configured to control the detection positions of the first detection element and the second detection element by driving the movement mechanism, and
a stress calculation unit configured to calculate a residual stress of the treatment target based on intensity peaks of the diffracted X-rays respectively

Assignees

• Sintokogio Ltd

Inventors

• Iwata Kyoichi
• Koyama Takuya
• Kobayashi Yuji
• Matsui Akinori

Classifications

• G01N23/207

  Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions · CPC title

• B24C1/10 Primary

  for compacting surfaces, e.g. shot-peening (for deforming sheet metal, tubes or profiles B21D31/06; as a metallurgical treatment C21D7/00, C22F1/00) · CPC title

• G01L1/00

  Measuring force or stress, in general (measuring force due to impact G01L5/00) · CPC title

• G01L1/25

  using wave or particle radiation, e.g. X-rays {, microwaves}, neutrons (G01L1/24 takes precedence) · CPC title

• G05B2219/32182

  If state of tool, product deviates from standard, adjust system, feedback · CPC title