Wafer grounding design for single pad lapping
US-8956200-B2 · Feb 17, 2015 · US
US11037585B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11037585-B2 |
| Application number | US-201815964903-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 27, 2018 |
| Priority date | Apr 27, 2018 |
| Publication date | Jun 15, 2021 |
| Grant date | Jun 15, 2021 |
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The present invention is directed to the fabrication of head sliders for use in hard disk drives, and in particular the provision and usage of electrical bond pads on the slider surface structure to accommodate needs of the fabrication process as well as slider operation within a disk drive.
Opening claim text (preview).
What is claimed is: 1. A method of processing a slider usable within a disk drive and having magnetic read and write transducers, comprising the steps of: performing lapping operation an air bearing surface of at least one slider including magnetic read and write transducers with associated bonding pads along with at least one electrical lapping guide; monitoring progress of the lapping operation by measuring electrical resistance of the electronic lapping guide by probing a pair of electrical lapping guide bond pads that are connected with the electronic lapping guide; ceasing the lapping operation at least partially based upon the measurement of a predetermined electrical resistance of the electrical lapping guide; and after the lapping operation is ceased, electrically connecting the electrical lapping guide bond pads to a pair of transducer device control conductors so that a transducer device connected with the pair of electrical lapping guide bond pads can be controlled. 2. The method of claim 1 , wherein during the lapping step at least a first pair of electrical lapping guide bond pads are electrically connected with a first transducer device. 3. The method of claim 2 , wherein also during the lapping step the first pair of electrical lapping guide bond pads are electrically connected with an electrical lapping guide. 4. The method of claim 2 , wherein also during the lapping step one electrical lapping guide bond pad of the first pair of electrical lapping guide bond pads and another electrical lapping guide bond pad of a second pair of electrical lapping guide bond pads are electrically connected with an electrical lapping guide. 5. The method of claim 1 , wherein the electrical lapping guide bond pad is not connected with the transducer device during the lapping step and the method further comprising a step of electrically connecting the electrical lapping guide bond pad to a separately provided transducer bond pad after the lapping step. 6. A method of processing a slider usable within a disk drive and having magnetic read and write transducers, comprising the steps of: performing lapping operation an air bearing surface of at least one slider including magnetic read and write transducers with associated bonding pads along with at least one electrical lapping guide; monitoring progress of the lapping operation by measuring electrical resistance of the electronic lapping guide by probing an electrical lapping guide bond pad; ceasing the lapping operation at least partially based upon the measurement of a predetermined electrical resistance of the electrical lapping guide; and after the lapping operation is ceased, electrically connecting the electrical lapping guide bond pad to a first transducer device control conductor so that a first transducer device connected with the electrical lapping guide bond pad can be controlled, wherein during the lapping step one electrical lapping guide bond pad of a first pair of electrical lapping guide bond pads and another electrical lapping guide bond pad of a second pair of electrical lapping guide bond pads are electrically connected with the first transducer. 7. A method of processing a slider usable within a disk drive and having magnetic read and write transducers, comprising the steps of: performing lapping operation an air bearing surface of at least one slider including magnetic read and write transducers with associated bonding pads along with at least one electrical lapping guide; monitoring progress of the lapping operation by measuring electrical resistance of the electronic lapping guide by probing an electrical lapping guide bond pad; ceasing the lapping operation at least partially based upon the measurement of a predetermined electrical resistance of the electrical lapping guide; and after the lapping operation is ceased, electrically connecting the electrical lapping guide bond pad to a transducer device control conductor, wherein the electrical lapping guide bond pad is not connected with the transducer device during the lapping step and the method further comprising a step of electrically connecting the electrical lapping guide bond pad to a separately provided transducer bond pad after the lapping step so that a transducer device is then connected with the electrical lapping guide bond pad and can be controlled by the transducer device control conductor.
Machining magnetic material [e.g., grinding, etching, polishing] · CPC title
Fabricating head structure or component thereof · CPC title
Control means for lapping machines or devices · CPC title
Working or finishing the interfacing surface of heads, e.g. lapping of heads · CPC title
Testing or indicating in relation thereto, e.g. before the fabrication is completed · CPC title
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