Method for analyzing the performance of multiple test instruments measuring the same type of part

US11036470B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11036470-B2
Application numberUS-201715798345-A
CountryUS
Kind codeB2
Filing dateOct 30, 2017
Priority dateOct 30, 2017
Publication dateJun 15, 2021
Grant dateJun 15, 2021

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

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A method for operating a data processing system to analyze data sets for groupings and a computer readable medium having instructions to execute that method are disclosed. The method includes causing the data processing system to receive a plurality of data sets, each data set including a plurality of values characterized by a statistical distribution and a label. The method also includes causing the data processing system to compute a plurality of statistical parameters for each of the plurality of data sets, to generate a data set vector having components equal to the plurality of statistical parameters for each of the plurality of data sets, to assign each data set to a cluster based on the data set vectors using a clustering algorithm, and to generate a display of the statistical distributions as a function of the labels in which the statistical distributions belonging to the same cluster are grouped together.

First claim

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What is claimed is: 1. A method for operating a data processing system to analyze data sets for groupings, said method comprising causing said data processing system to: receive a plurality of data sets, each data set comprising a plurality of measurements of a first physical quantity made by a corresponding test instrument, and a label identifying said test instrument, and being characterized by a statistical distribution; compute a plurality of statistical parameters for each of said plurality of data sets; generate a data set vector having components equal to said plurality of statistical parameters for each of said plurality of data sets; assign each data set to a cluster based on said data set vectors using a clustering algorithm; and generate a graph of said statistical distributions as a function of said labels on a display of said data processing system that is viewed by user to determine if systematic variations in said data sets are the result of variations in said test instruments or variations in components measured by said test instruments in which said statistical distributions belonging to the same cluster are grouped together along a first axis of said graph with said labels being shown on said first axis and said statistical distributions are displayed on a second axis of said graph, wherein each statistical distribution comprises a one-dimensional scatter plot of said measurement values of said dataset corresponding to said label and adjacent clusters are separated by a dividing line parallel to said second axis. 2. The method of claim 1 wherein said display comprises a graph of a symbol associated with said statistical parameters, said symbol located at a median value or an average value of said data set values. 3. The method of claim 1 wherein said data sets are further ordered within each cluster in said graph by said median value or said average value. 4. The method of claim 1 wherein said display comprises a graph of a symbol associated with said statistical parameters as a function of said label, said symbol located at a median value or average value of said plurality of measurements made by that test instrument. 5. The method of claim 4 wherein said symbol comprises a boxplot. 6. The method of claim 1 wherein each of said test instruments comprises a second test probe different from said first test probe and provides a measurement of a second physical quantity by said second test probe, and wherein said data processing system generates a plurality of statistical parameters that characterize a statistical distribution for a set of measurements corresponding to each of said plurality of test instruments and said second test probe associated with that test instrument and said instrument vectors further comprising said second plurality of statistical parameters. 7. A computer readable medium comprising instructions that cause a data processing system to execute a method that causes said data processing system to: receive a plurality of data sets, each data set comprising a plurality of measurements of a first physical quantity made by a corresponding test instrument, and a label identifying said test instrument, and being characterized by a statistical distribution; compute a plurality of statistical parameters for each of said plurality of data sets; generate a data set vector having components equal to said plurality of statistical parameters for each of said plurality of data sets; assign each data set to a cluster based on said data set vectors using a clustering algorithm; and generate a graph of said statistical distributions as a function of said labels on a display of said data processing system that is viewed by user to determine if systematic variations in said data sets are the result of variations in said test instruments or variations in components measured by said test instruments in which said statistical distributions belonging to the same cluster are grouped together along a first axis of said graph with said labels being shown on said first axis and said statistical distributions are displayed on a second axis of said graph, wherein each statistical distribution comprises a one-dimensional scatter plot of said measurement values of said dataset corresponding to said label and adjacent clusters are separated by a dividing line parallel to said second axis. 8. The computer readable medium of claim 7 wherein said display comprises a graph of a symbol associated with said statistical parameters, said symbol located at a median value or an average value of said data set values. 9. The computer readable medium of claim 7 wherein said data sets are further ordered within each cluster in said graph by said median value or said average value. 10. The computer readable medium of claim 7 wherein said display comprises a graph of a symbol associated with said statistical parameters as a function of said label, said symbol located at a median value or average value of plurality of said measurements made by that test instrument. 11. The computer readable medium of claim 10 wherein said symbol comprises a boxplot. 12. The computer readable medium of claim 7 wherein each of said test instruments comprises a second test probe different from said first test probe and provides a measurement of a second physical quantity by said second test probe, and wherein said data processing system generates a plurality of statistical parameters that characterize a statistical distribution for a set of measurements corresponding to each of said plurality of test instruments and said second test probe associated with that test instrument and said instrument vectors further comprising said second plurality of statistical parameters.

Assignees

Inventors

Classifications

  • G06F17/18Primary

    for evaluating statistical data {, e.g. average values, frequency distributions, probability functions, regression analysis (forecasting specially adapted for a specific administrative, business or logistic context G06Q10/04)} · CPC title

  • Updates performed during online database operations; commit processing · CPC title

  • G06F7/08Primary

    Sorting, i.e. grouping record carriers in numerical or other ordered sequence according to the classification of at least some of the information they carry (by merging two or more sets of carriers in ordered sequence G06F7/16) · CPC title

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What does patent US11036470B2 cover?
A method for operating a data processing system to analyze data sets for groupings and a computer readable medium having instructions to execute that method are disclosed. The method includes causing the data processing system to receive a plurality of data sets, each data set including a plurality of values characterized by a statistical distribution and a label. The method also includes causi…
Who is the assignee on this patent?
Keysight Technologies Inc
What technology area does this patent fall under?
Primary CPC classification G06F17/18. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 15 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).