Thyristor valve test system based on cooperation of logical functions of software

Patent metadata

Field	Value
Publication number	US-11009542-B2
Application number	US-201816496384-A
Country	US
Kind code	B2
Filing date	Jun 20, 2018
Priority date	Jul 10, 2017
Publication date	May 18, 2021
Grant date	May 18, 2021

Abstract

A thyristor valve test system based on cooperation of logic functions of software, wherein the test system comprises: a thyristor valve (5) to be tested, a VBE (3) and a tester (4), and the VBE (3) has a dedicated test mode, the tester (4) provides three steps for each test item. The thyristor valve (5) to be tested and the VBE (3) are connected by optical fibers (1), and the thyristor valve (5) to be tested and the tester (4) are connected by cables (2), and there is no connection between the VBE (3) and the tester (4).

First claim

What is claimed is:

1. A thyristor valve test system based on cooperation of logic functions of software, wherein the test system comprises: a tested thyristor valve, a tester and a valve based electronics (VBE), wherein the tested thyristor valve and the VBE are connected via optical fibers, which are used for transmitting a firing pulse (FP) and an indication pulse (IP); the tested thyristor valve and the tester are connected via cables, which are used for the tester to apply a test voltage to the tested thyristor valve; there is no connection between the VBE and the tester; the tested thyristor valve includes at least one thyristor level, the thyristor level at least includes a thyristor, a thyristor control unit (TCU) and an auxiliary circuit; the TCU feeds back an IP1 to the VBE when in normal operation, and the value of a return counter is incremented by 1 each time the VBE receives an IP1; and the TCU feeds back an IP2 to the VBE when being protective fired, and the value of an auxiliary counter is incremented by 1 each time the VBE receives an IP2;
VBE is provided with a test mode correspondingly, and in the test mode:
a. send a FP to the tested thyristor valve and clear the return counter if the VBE receives N consecutive IP1 and the value of an auxiliary counter is 0;
b. after receiving the IP2, the value of the auxiliary counter is incremented by 1, the VBE does not send FP to the tested thyristor valve when next time receiving N consecutive IP1;
c. if the VBE does not receive any of the IPs within a certain time T, calculate the number of the IP1 and IP2 from zero by clearing the values of the return counter and the auxiliary counter to 0; and
the tester applies different voltages in different stages according to the test requirements.

2. The thyristor valve test system based on cooperation of logic functions of software according to claim 1 , wherein applying different voltages in different stages by the tester according to the test requirements specifically refers to that each test item comprises three steps:
a. applying a sinusoidal voltage, wherein the tester detects whether the thyristor is turned on during this stage, and determines whether the entire thyristor level circuit and optical paths work normally;
b. applying a sinusoidal voltage or a surge voltage or the combination of a sinusoidal voltage and a surge voltage corresponding to the content of the test item, wherein the tester detects the thyristor voltage and current in this stage, and determines whether the thyristor valve in the test item satisfies the electrical requirements; and
c. applying a sinusoidal voltage, wherein the tester detects whether the thyristor is turned on in this stage, and determines whether the optical signal sent by the thyristor valve to the VBE in step b is correct.

Assignees

• Nr Electric Co Ltd
• Nr Engineering Co Ltd

Inventors

• Yang Fan
• Liu Lei
• Zhang Xiang
• Zhou Chen
• Pan Weiming
• Fang Taixun

Classifications

• G01R31/2642

  Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests · CPC title

• G01R31/263 Primary

  for testing thyristors · CPC title

• G01R31/2601

  Apparatus or methods therefor (G01R31/2607, G01R31/2642 take precedence) · CPC title

• G01R31/3336

  Synthetic testing, i.e. with separate current and voltage generators simulating distance fault conditions · CPC title

• G01R31/26 Primary

  Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment {H10P74/00}) · CPC title