Quantum dot, light emitting material and manufacturing method of quantum dot comprising thermal treatment of solution containing formed quantum dot

US11008512B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11008512-B2
Application numberUS-201816166191-A
CountryUS
Kind codeB2
Filing dateOct 22, 2018
Priority dateOct 24, 2017
Publication dateMay 18, 2021
Grant dateMay 18, 2021

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Abstract

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A quantum dot, a light emitting material, and a manufacturing method of quantum dot are provided. A ratio of an emission intensity to an absorption intensity of the quantum dot at a characteristic wavelength ranges from 1.5×108 CPS/Abs. to 2.0×109 CPS/Abs. The characteristic wavelength is a shorter wavelength of two wavelengths corresponding to half of a maximum intensity of an emission peak of the quantum dot.

First claim

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What is claimed is: 1. A manufacturing method of a quantum dot, comprising: providing a first solution comprising a group 12 element, a group 13 element, or a group 14 element; providing a second solution comprising a group 15 element or a group 16 element; mixing the first solution with the second solution to form a third solution; adding a material comprising the group 12 element, the group 13 element, or the group 14 element and a fourth solution comprising the group 15 element or the group 16 element to the third solution to form a fifth solution comprising the quantum dot; and performing a thermal treatment to the fifth solution, wherein a temperature of the thermal treatment is higher than a temperature of forming the fifth solution comprising the quantum dot by 15° C. to 75° C., and a time period of the thermal treatment is 3 minutes to 7 minutes; a ratio of an emission intensity to an absorption intensity of the quantum dot at a characteristic wavelength ranges from 1.5×10 8 CPS/Abs. to 2.0×10 9 CPS/Abs. after the thermal treatment, and the characteristic wavelength is a shorter wavelength of two wavelengths corresponding to half of a maximum intensity of an emission peak of the quantum dot after the thermal treatment. 2. The manufacturing method of the quantum dot as claimed in claim 1 , wherein the temperature of the thermal treatment is higher than the temperature of forming the fifth solution comprising the quantum dot by 20° C. to 50° C. 3. The manufacturing method of the quantum dot as claimed in claim 1 , wherein a ratio of a diameter of the quantum dot after the thermal treatment to a diameter of the quantum dot before the thermal treatment ranges from 1.0 to 1.3. 4. The manufacturing method of the quantum dot as claimed in claim 3 , wherein the quantum dot comprises an inner core and an outer shell, and a ratio of a thickness of the outer shell after the thermal treatment to a thickness of the outer shell before the thermal treatment ranges from 1.0 to 1.6. 5. The manufacturing method of the quantum dot as claimed in claim 1 , wherein the ratio of the emission intensity to the absorption intensity of the quantum dot at the characteristic wavelength ranges from 2.0×10 8 CPS/Abs. to 1.0×10 9 CPS/Abs. 6. The manufacturing method of the quantum dot as claimed in claim 1 , wherein the ratio of the emission intensity to the absorption intensity of the quantum dot at the characteristic wavelength ranges from 2.0×10 8 CPS/Abs. to 6.0×10 8 CPS/Abs. 7. The manufacturing method of the quantum dot as claimed in claim 1 , wherein the temperature of forming the fifth solution comprising the quantum dot ranges from 220° C. to 260° C.

Assignees

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Classifications

  • C09K11/883Primary

    with zinc or cadmium · CPC title

  • non-luminescent particle coatings or suspension media · CPC title

  • Manufacture or treatment of nanostructures · CPC title

  • Nanooptics, e.g. quantum optics or photonic crystals · CPC title

  • of wavelength conversion means · CPC title

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What does patent US11008512B2 cover?
A quantum dot, a light emitting material, and a manufacturing method of quantum dot are provided. A ratio of an emission intensity to an absorption intensity of the quantum dot at a characteristic wavelength ranges from 1.5×108 CPS/Abs. to 2.0×109 CPS/Abs. The characteristic wavelength is a shorter wavelength of two wavelengths corresponding to half of a maximum intensity of an emission peak of…
Who is the assignee on this patent?
Chi Mei Corp
What technology area does this patent fall under?
Primary CPC classification C09K11/883. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue May 18 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).