Method for determining failure of power element and electronic device thereof

Patent metadata

Field	Value
Publication number	US-11002782-B2
Application number	US-201916507969-A
Country	US
Kind code	B2
Filing date	Jul 10, 2019
Priority date	Jul 26, 2018
Publication date	May 11, 2021
Grant date	May 11, 2021

Abstract

A method for determining failure of a power element for use in an electronic device is provided. The electronic device includes a power element and a detection circuit. The method includes the steps of: obtaining a temperature-calculation model of the power element, and obtaining a parameterized temperature-calculation model of a power-element parameter and a parameterized temperature of the power element; detecting load information and the power-element parameter by the detection circuit; calculating a modeled temperature of the power element according to the load information and the temperature-calculation model, and calculating the parameterized temperature of the power element according to the power-element parameter and the parameterized temperature-calculation model; determining whether an error between the modeled temperature and the parameterized temperature exceeds a permitted range; and determining that the power element has failed in response to the error exceeding the permitted range.

First claim

What is claimed is:

1. A method for determining failure of a power element, for use in an electronic device, wherein the electronic device comprises a power element and a detection circuit, the method comprising the steps of:
obtaining a temperature-calculation model of the power element, and obtaining a parameterized temperature-calculation model of a power-element parameter and a parameterized temperature of the power element;
detecting load information and the power-element parameter by the detection circuit;
calculating a modeled temperature of the power element according to the load information and the temperature-calculation model, and calculating the parameterized temperature of the power element according to the power-element parameter and the parameterized temperature-calculation model;
determining whether an error between the modeled temperature and the parameterized temperature exceeds a permitted range; and
determining that the power element has failed in response to the error exceeding the permitted range.

2. The method as claimed in claim 1 , wherein the power-element parameter is a non-aging parameter.

3. The method as claimed in claim 2 , wherein the power element is an insulated gate bipolar transistor (IGBT) module, and the load information comprises an environmental temperature, an operating voltage, an operating current, an output frequency, a switching frequency of the IGBT module, or a combination thereof, and the power-element parameter is a gate current of the IGBT module.

4. The method as claimed in claim 2 , wherein the power element is a capacitor module, and the load information comprises an environmental temperature, an operating voltage, a ripple voltage, an input current, an input power factor, a frequency of the capacitor module, or a combination thereof.

5. The method as claimed in claim 1 , further comprising:
calibrating the temperature-calculation model according to the parameterized temperature in response to the error exceeding the permitted range.

6. The method as claimed in claim 1 , wherein the parameterized temperature calculated by the parameterized temperature-calculation model is determined by the power-element parameter and another power-element parameter.

7. A method for determining failure of a power element, for use in an electronic device, wherein the electronic device comprises a power element and a detection circuit, the method comprising the steps of:
obtaining a temperature-calculation model of the power element, and obtaining a first equation between a power-element parameter and a parameterized temperature of the power element;
building a second equation between a modeled temperature calculated by the temperature-calculation model and a corresponding modeled power-element parameter;
detecting a temperature of the power element by the detection circuit;
calculating the modeled power-element parameter according to the detected temperature and the second equation, and calculating the power-element parameter of the power element according to the detected temperature and the first equation;
determining whether an error between the modeled power-element parameter and the power-element parameter exceeds a permitted range; and
determining that the power element has failed in response to the error exceeding the permitted range.

8. A method for determining failure of a power element, for use in an electronic device, wherein the electronic device comprises a power element and a detection circuit, the method comprising the steps of:
obtaining a temperature-calculation model of the power element;
building an equation between the temperature-calculation model, a power-element parameter and a parameterized temperature of the power element;
detecting load information and the power-element parameter by the detection circuit;
calculating a modeled temperature of the power element according to the load information and the temperature-calculation model, and calculating the parameterized temperature of the power element according to the power-element parameter and the temperature-calculation model;
determining whether an error between the modeled temperature and the parameterized temperature exceeds a permitted range; and
determining that the power element has failed in response to the error exceeding the permitted range.

9. The method as claimed in claim 8 , wherein the power-element parameter is an aging parameter.

10. The method as claimed in claim 8 , further comprising:
calibrating the temperature-calculation model according to the parameterized temperature in response to the error exceeding the permitted range.

11. The method as claimed in claim 8 , wherein the parameterized temperature calculated by the parameterized temperature-calculation model is determined by the power-element parameter.

12. A method for determining failure of a power element, for use in an electronic device, wherein the electronic device comprises a power element and a detection circuit, the method comprising the steps of:
obtaining a temperature-calculation model of the power element;
building an equation between a modeled power-element parameter and a modeled temperature of the power element;
detecting load information and a power-element parameter by the detection circuit;
calculating the modeled power-element parameter of the power element according to the load information and the temperature-calculation model by the equation;
determining whether an error between the modeled power-element parameter and the power-element parameter exceeds a permitted range; and
determining that the power element has failed in response to the error exceeding the permitted range.

13. An electronic device, comprising:
a power element;
a detection circuit, configured to detect load information and a power-element parameter of the power element; and
a controller, configured to obtain a temperature-calculation model of the power element, and obtain a parameterized temperature-calculation model of the power-element parameter and a parameterized temperature of the power element,
wherein the controller is further configured to calculate a modeled temperature of the power element according to the load information and the temperature-calculation model, and calculate the parameterized temperature of the power element according to the power-element parameter and the parameterized temperature-calculation model,
wherein the controller is further configured to determine whether an error between the modeled temperature and the parameterized temperature exceeds a permitted range;
in response to the error exceeding the permitted range, the controller determines that the power element has failed, and
in response to the error not exceeding the permitted range, the controller controls the electronic device to operate normally.

14. An electronic device, comprising:
a power element;
a detection circuit, configured to detect load information and a power-element parameter of the power element; and
a controller, configured to obtain a temperature-calculation model of the power element, and build an equation between the temperature-calculation model, the power-element parameter and a parameterized temperature of the power element, wherein the controller is further configured to calculate a modeled temperature of the power element according to the load information and the temperature-calculation model, and calculate the parameterized temperature of the power element according to the power-element parameter and the temperature-calculation model by the equation;
wherein the controller is further configured to determine whether

Assignees

• Delta Electronics Inc

Inventors

• Hsing Lei-Chung
• Ou Hsien-Chih
• Huang Chun-Chang

Classifications

• G01R31/64

  Testing of capacitors · CPC title

• G01R31/2601 Primary

  Apparatus or methods therefor (G01R31/2607, G01R31/2642 take precedence) · CPC title

• G01R31/263

  for testing thyristors · CPC title

• G01R31/2619 Primary

  for measuring thermal properties thereof · CPC title

• G01R31/2628

  for measuring thermal properties thereof · CPC title