Manufacturing method of radiation imaging apparatus
US-2024063247-A1 · Feb 22, 2024 · US
US10996347B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10996347-B2 |
| Application number | US-201715493449-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 21, 2017 |
| Priority date | Jun 14, 2013 |
| Publication date | May 4, 2021 |
| Grant date | May 4, 2021 |
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Example embodiments of a radiation detection system including a detector is described. The detector can include a scintillator, a sensor, and a light source. The radiation detection system can further include a controller programmed to control the light source to expose the scintillator to a light to saturate traps in the scintillator. In some embodiments, the detector can further include a second light source, and the controller is programmed to control the second light source to expose the scintillator to a second light to detrap afterglow traps in the scintillator.
Opening claim text (preview).
What is claimed is: 1. A device comprising: a housing; a scintillator; a sensor; a controller; a first light source; a second light source; and a filter; wherein: the scintillator, the sensor, the controller, the first light source, and the filter are situated in the housing; the device is configured to receive an exterior light generated by an exterior light source to reach the scintillator, the exterior light source being outside of the device; the scintillator is configured to generate a visible light when the scintillator is exposed to the exterior light; the first light source is situated next to the scintillator, and the first light source is configured to exposes the scintillator to a first light, wherein: the first light saturates defect centers in the scintillator so that the defect centers are substantially incapable of trapping charge carriers; and the first light has a wavelength of 345 or 445 nanometer; the second light source is situated next to the scintillator, and the second light source is configured to exposes the scintillator to a second light, wherein the second light detraps afterglow trap centers to cause an optical bleaching of the scintillator; the filter is situated between the scintillator and the sensor, wherein the filter is configured to block out the first light; the controller is configured to control the first light source and the second light source; and each of the following light sources is different than any other one of the light sources: the first light source, the second light source and the exterior light source. 2. The device of claim 1 , wherein the scintillator comprises a Gadolinium Gallium Aluminum garnet-based material. 3. The device of claim 1 , wherein the first light from the first light source is one of visible or ultraviolet. 4. The device of claim 1 , wherein the controller is programmed to tune the first light source to emit specific wavelengths of the first light. 5. The device of claim 1 , wherein the controller is programmed to tune the first light source to expose the scintillator continuously with the first light. 6. The device of claim 1 , wherein the controller is programmed to tune the first light source to expose the scintillator continuously with the first light during scintillation detection. 7. The device of claim 1 , wherein the controller is programmed to tune the first light source to expose the scintillator intermittently or periodically with the first light. 8. The device of claim 1 , wherein the controller is programmed to tune the first light source to expose the scintillator with pulses of the first light. 9. The device of claim 1 , wherein the controller is programmed to tune the first light source to expose the scintillator with the first light for a predetermined duration during a calibration phase before performing scintillation detection. 10. The device of claim 1 , wherein the controller is programmed to tune the second light source to emit specific wavelengths of the second light.
the detector being a crystal · CPC title
calibration techniques (stabilization of spectrometer G01T1/40) · CPC title
Testing, adjusting or calibrating thereof · CPC title
Selection of materials · CPC title
with scintillation detectors · CPC title
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