Method of making an array of aberrated optical elements

US10989845B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10989845-B2
Application numberUS-77351307-A
CountryUS
Kind codeB2
Filing dateJul 5, 2007
Priority dateJul 17, 2006
Publication dateApr 27, 2021
Grant dateApr 27, 2021

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  5. First independent claim

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Abstract

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A method of making an array ( 18 ) of aberrated optical elements ( 20 ). The method comprises the steps of providing a substrate having a first surface with forming elements thereon, and controlled working a localized region on the first surface of the substrate. The controlled working is of a magnitude sufficient to aberrate one or more of the forming elements in an affected site surrounding the localized region.

First claim

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The invention claimed is: 1. A method of making a substrate for assembly into a production tool to make an array of aberrated optical elements, said method comprising the steps of: providing a substrate having a first surface with forming elements thereon, wherein the geometry of the forming elements corresponds to the geometry of non-aberrated optical elements in an analogous array comprising mutually intersecting faces; performing a working step by application of one of pressure, energy, chemicals, and impingement of particles to the first surface at a localized region on the first surface of the substrate such that face smoothness of the first surface is substantially the same as the non-aberrated optical elements, said working step is of a magnitude sufficient to aberrate forming elements in an affected site including and surrounding the localized region on the first surface; wherein the optical elements are retroreflective cube corner elements with three mutually perpendicular faces that intersect with each other at edges forming three dihedral angles; wherein said working step results in a dihedral angle of one or more of the forming elements being unequal to 90°; wherein the dihedral angle is the angle of a corner element between mutually intersecting faces of the forming element; wherein a second surface opposite the first surface is not worked; wherein said working step is a controlled working step; and wherein the substrate is electroformed nickel. 2. A method as set forth in claim 1 , wherein said working step is performed so that the array has a greater mean geometric divergence than the analogous array. 3. A method as set forth in claim 1 , wherein said working step is performed so that the array has a total retroreflectance that is at least 90% of that of the analogous array. 4. A method as set forth in claim 1 , wherein the optical elements are micro-optical elements. 5. A method as set forth in claim 1 , wherein the substrate is a master substrate, a copy of another substrate, or an assembly substrate. 6. A method as set forth in claim 1 , wherein said working step is performed while an electroformed copy is still attached to the substrate. 7. A method as set forth in claim 1 , wherein the magnitude of the working is sufficiently small such that smoothness of the faces of the forming elements is not substantially damaged, and/or such that sharpness of edges of the forming elements is not substantially damaged. 8. A method as set forth in claim 1 , wherein the substrate has a thickness in the range of about 0.01 mm to about 2.0 mm. 9. A method as set forth in claim 1 , wherein said working step is accomplished by the application of chemicals. 10. A method as set forth in claim 1 , wherein said working step comprises working a plurality of localized regions on the first surface of the substrate. 11. A method as set forth in the claim 1 , wherein the magnitude of the working step is the same in at least some of the plurality localized regions. 12. A method as set forth in claim 1 , wherein the magnitude of the working step varies in at least some of the plurality localized regions. 13. A method comprising the step of assembling a substrate made by the method of claim 1 into the production tool. 14. A method comprising the step of using a production tool made by the method of claim 13 to form the array of retroreflective elements. 15. A method as set forth in claim 1 , wherein the work step comprises impingement of particles to the first surface at the localized region. 16. A method of making a substrate for assembly into a production tool to make an array of aberrated optical elements, said method comprising the steps of: providing a substrate having a first surface with forming elements thereon, wherein the geometry of the forming elements corresponds to the geometry of non-aberrated optical elements in an analogous array; performing a working step by application of one of pressure, energy, chemicals, and the impingement of particles at a localized region on the first surface of the substrate such that sharpness of edges of the forming elements is not damaged, said working step is of a magnitude sufficient to aberrate forming elements in an affected site including and surrounding the localized region on the first surface; wherein the optical elements are retroreflective cube corner elements with three mutually perpendicular faces that intersect with each other at edges forming three dihedral angles; wherein said working step results in a dihedral angle of more than one of the forming elements being unequal to 90°; wherein the dihedral angle is the angle of a corner element between mutually intersecting faces of the forming element; wherein a second surface opposite the first surface is not worked; wherein said working step is a controlled working step; and wherein the substrate is electroformed nickel. 17. A method of making a substrate for assembly into a production tool to make an array of aberrated optical elements, said method comprising the steps of: providing a substrate having a thickness of greater than 10.00 mm and a first surface with forming elements thereon, wherein the geometry of the forming elements corresponds to the geometry of non-aberrated optical elements in an analogous array; performing a working step by application of one of pressure, energy, chemicals, and the impingement of particles at a localized region on the first surface of the substrate, said working step is of a magnitude sufficient to aberrate forming elements in an affected site including and surrounding the localized region on the first surface; wherein said working step is performed so that the array has a total retroreflectance that is at least 90% of that of the analogous array; wherein the optical elements are retroreflective cube corner elements with three mutually perpendicular faces that intersect with each other at edges forming three dihedral angles; wherein said working step results in a dihedral angle of one or more of the forming elements being unequal to 90°; wherein the dihedral angle is the angle of a corner element between mutually intersecting faces of the forming element; wherein a second surface opposite the first surface is not worked; wherein said working step is a controlled working step; and wherein the substrate is electroformed nickel.

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Inventors

Classifications

  • G02B5/124Primary

    plural reflecting elements forming part of a unitary plate or sheet · CPC title

  • Producing optical elements, e.g. lenses or prisms (grinding or polishing of optical elements B24B; constructional form of optical elements G02B; {optical parts of spectacles G02C7/00}) · CPC title

  • cube corner, trihedral or triple reflector type · CPC title

  • Production of reflex reflectors · CPC title

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What does patent US10989845B2 cover?
A method of making an array ( 18 ) of aberrated optical elements ( 20 ). The method comprises the steps of providing a substrate having a first surface with forming elements thereon, and controlled working a localized region on the first surface of the substrate. The controlled working is of a magnitude sufficient to aberrate one or more of the forming elements in an affected site surrounding t…
Who is the assignee on this patent?
Chapman Steven R, Huang Kejian Kevin, Wu Feng, and 1 more
What technology area does this patent fall under?
Primary CPC classification G02B5/124. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 27 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).