Scm-10 molecular sieve, process for producing same and use thereof
US-2017128923-A1 · May 11, 2017 · US
US10974967B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10974967-B2 |
| Application number | US-201716622795-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 31, 2017 |
| Priority date | Jun 13, 2017 |
| Publication date | Apr 13, 2021 |
| Grant date | Apr 13, 2021 |
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The invention relates to a molecular sieve SCM-15, a preparation process and use thereof. The molecular sieve comprises a schematic chemical composition of a formula of “SiO 2 .GeO 2 ”, wherein the molar ratio of silicon and germanium satisfies SiO 2 /GeO 2 ≥1. The molecular sieve has unique XRD diffraction data and can be used as an adsorbent or a catalyst.
Opening claim text (preview).
The invention claimed is: 1. A molecular sieve SCM 15 in its prepared form or calcined form, has an X-ray diffraction spectrum substantially as shown in Table A-1 or Table A-2 below, TABLE A-1 2θ (°) (a) d-distance (Å) (b) Relative intensity (I/I 0 × 100) 4.811 18.353 w 6.571 13.441 m-vs 6.888 12.823 m-s 9.675 9.134 m-vs 9.894 8.933 m-vs 19.888 4.461 w-m (a) = ±0.3°, (b) is a function of 2θ, TABLE A-2 2θ (°) (a) d-distance (Å) Relative intensity (I/I 0 × 100) 4.811 18.424 ± 1.148 w 6.571 13.468 ± 0.614 m-vs 6.888 12.847 ± 0.559 m-s 9.675 9.143 ± 0.283 m-vs 9.894 8.941 ± 0.270 m-vs 19.888 4.462 ± 0.067 w-m (a)= ±0.3°. 2. The molecular sieve SCM-15 according to claim 1 , wherein the X-ray diffraction spectrum further comprises X-ray diffraction peaks substantially as shown in Table B-1 or Table B-2 below, TABLE B-1 2θ (°) (a) d-distance (Å) (b) Relative intensity (I/I 0 × 100) 8.225 10.741 W 15.592 5.679 W 22.031 4.031 w-m 22.435 3.960 w-m 25.330 3.513 W (a) = ±0.3°, (b) is a function of 2θ, TABLE B-2 2θ (°) (a) d-distance (Å) Relative intensity (I/I 0 × 100) 8.225 10.755 ± 0.392 W 15.592 5.681 ± 0.109 W 22.031 4.032 ± 0.054 w-m 22.435 3.960 ± 0.052 w-m 25.330 3.514 ± 0.041 W (a) = ±0.3°, said X-ray diffraction spectrum optionally further comprising X-ray diffraction peaks substantially as shown in the table below, 2θ (°) (a) d-distance (Å) Relative intensity (I/I 0 × 100) 14.294 6.194 ± 0.129 W 16.909
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