Flaw detecting apparatus, method for detecting flaw of plane mirror based on line scanning and ring band stitching

Patent metadata

Field	Value
Publication number	US-10962487-B2
Application number	US-201916681091-A
Country	US
Kind code	B2
Filing date	Nov 12, 2019
Priority date	Nov 13, 2018
Publication date	Mar 30, 2021
Grant date	Mar 30, 2021

Abstract

A flaw detecting apparatus and a method for a plane mirror based on line scanning and ring band stitching are provided. The flaw detecting apparatus comprises: a line scanning detector, an annular illumination source, a rotary table rotatable about a Z axis, a translation table translatable along an X axis and a processor. By translating and rotating the plane mirror to be detected, an entire surface of the plane mirror to be detected can be detected by the line scanning detector, and the flaw of the entire plane mirror to be detected is obtained by a ring band stitching method. The method of line scanning and ring band stitching reduces the imaging distortion, the intermediate data amount, the difficulty in the distortion correction and difficulty in stitching, and improves the detection speed and the detection quality.

First claim

What is claimed is:

1. A flaw detecting apparatus for a plane mirror based on line scanning and ring band stitching, comprising: a line scanning detector, an annular illumination source, a rotary table rotatable about a Z axis, a translation table translatable along a X axis, a processor, wherein the rotary table rotatable about the Z axis is disposed on the translation table translatable along a X axis, the plane mirror to be detected is placed on the rotary table rotatable about the Z axis, and the annular illumination source and the line scanning detector are mounted above the plane mirror to be detected, wherein the processor is connected with the line scanning detector, the rotary table rotatable about the Z axis, and the translation table translatable along the X axis to send out a control signal, wherein the X and Z axes are a first axis and a third axis of a spatial Cartesian coordinate system respectively.

2. The flaw detecting apparatus according to claim 1 , wherein the plane mirror to be detected is rotated about the Z axis with the rotary table, and the line scanning detector detects a flaw on the plane mirror to be detected, according to a control command of the processor.

3. A method for detecting a flaw of the plane mirror based on line scanning and ring band stitching using the flaw detecting apparatus according to claim 1 , comprising the following steps:
(1) planning a scan detection scheme; according to parameters of the plane mirror to be detected and the line scanning detector, planning number and positions of the ring bands, so that there is a certain degree of overlap between two adjacent ring bands, and carrying out a scan across all range of the plane mirror to be detected, and calculating the angular velocity of the rotary table according to the position of the ring band and the parameters of the line scanning detector when each ring band is scanned;
(2) detecting the first ring band; controlling the translation table to shift a distance px 1 +L in the X direction with the processor, and then controlling the rotary table to rotate one revolution at an angular velocity ω 1 with the processor, and controlling the line scanning detector to acquire data at a frame rate η with the processor, and then storing the data f 1 , with the processor, where f 1 is an image of N×J 1 pixels, and J 1 is the number of frames measured by the scanning detector when the rotary table rotates one revolution at the angular velocity ω 1 ;
(3) sequentially detecting the rest of the ring bands; controlling the translation table to shift a distance px k +L in the X direction with the processor, and then controlling the rotary table to rotate one revolution at an angular velocity ω k with the processor, and controlling the line scanning detector to acquire data at a frame rate η with the processor, and storing the data f k , with the processor, where f k is an image of N×J k pixels, and J k is the number of frames measured by the scanning detector when the rotary table rotates one revolution at an angular velocity ω k for detecting the kth ring band;
(4) performing a coordinate transformation, a position error correction and a region growth method to the data of respective detected ring band so as to stitch them into one image.

4. The method according to claim 3 , wherein the angular velocity ω k (k=1, 2, . . . , M) of the rotary tables for respective ring band is related to the number N of pixels of the line scanning detector, the frame rate η of the line scanning detector, an object-side view field L of the line scanning detector, and the distance px k of each ring band from the center of the plane mirror to be detected, and the specific relationship is written as follows:
ω k =ηL/N /( px k +L ).

5. The method according to claim 3 , wherein performing a coordinate transformation to the data of respective detected ring band according to the following formula

F
k

⁡

(

x
,
y

)

=

f
k

⁡

(

u
k

,

v
k

)

x
=

(

px
k

L
N

+

u
k

)

⁢
cos
⁢

⁢

(

ω
k

⁢

v
k

η

)

y
=

(

px
k

L
N

+

u
k

)

⁢
sin
⁢

⁢

(

ω
k

⁢

v
k

η

)

where (u k , v k ) is a point in f k , and the value of u k is 1, 2, . . . , N, and the value of v k is 1, 2, . . . , J k. (x, y) is the point in the global coordinates corresponding to (u k , v k ).

6. The method according to claim 3 , wherein when detecting data of respective ring band, there is a position error Δpx k , and since the stitching is based on the first ring band, that is, Δpx 1 is 0, the coordinate transformation formula including the position error correction is expressed the following equation,

F

Assignees

• Inst Optics & Electronics Cas

Inventors

• Xu Fuchao
• Quan Haiyang
• Fu Taotao
• Hu Xiaochuan
• Hou Xi
• Li Sheng

Classifications

• G01N2021/8887

  based on image processing techniques · CPC title

• G01N21/896 Primary

  Optical defects in or on transparent materials, e.g. distortion, surface flaws {in conveyed flat sheet or rod (for other objects G01N21/958)} · CPC title

• G02B26/105

  with one or more pivoting mirrors or galvano-mirrors (G02B26/101 takes precedence) · CPC title

• G01N2021/9511

  Optical elements other than lenses, e.g. mirrors · CPC title

• G01N21/8983 Primary

  for testing textile webs, i.e. woven material · CPC title