X-ray flux reducer for a photon counting detector

Patent metadata

Field	Value
Publication number	US-10959688-B2
Application number	US-201515525079-A
Country	US
Kind code	B2
Filing date	Nov 11, 2015
Priority date	Nov 20, 2014
Publication date	Mar 30, 2021
Grant date	Mar 30, 2021

Abstract

An imaging system includes a radiation source (108) configured to rotate about an examination region (106) and emit radiation that traverses the examination region. The imaging system further includes an array of radiation sensitive pixels (112) configured to detect radiation traversing the examination region and output a signal indicative of the detected radiation. The array of radiation sensitive pixels is disposed opposite the radiation source, across the examination region. The imaging system further includes a rigid flux filter device (130) disposed in the examination region between the radiation source and the radiation sensitive detector array of photon counting pixels. The rigid flux filter device is configured to filter the radiation traversing the examination region and incident thereon. The radiation leaving the rigid flux filter device has a predetermined flux.

First claim

The invention claimed is:

1. An imaging system, comprising:
an x-ray radiation source configured to rotate about an examination region and emit x-ray radiation that traverses the examination region;
an array of x-ray radiation sensitive pixels configured to detect x-ray radiation traversing the examination region and output a signal indicative of the detected x-ray radiation, wherein the array of x-ray radiation sensitive pixels is disposed opposite the x-ray radiation source, across the examination region; and
a rigid flux filter device disposed in the examination region between the x-ray radiation source and the x-ray radiation sensitive detector array of pixels, wherein the flux filter device does not rotate together with the x-ray radiation source and is configured to filter the x-ray radiation traversing the examination region and incident thereon, and wherein the x-ray radiation leaving the flux filter device has a predetermined flux,
wherein along an axis direction around which the x-ray radiation source rotates, the rigid flux filter device is configured to slide, relative to the examination region, toward the examination region from a location at which the rigid flux filter device is spaced apart from the examination region in the axis direction.

2. The imaging system of claim 1 , wherein the rigid flux filter device includes an inner region with first attenuation characteristics, a first outer region with second attenuation characteristics, and a second outer region,
wherein the inner region is disposed between the first and second outer regions in a plan view, and
wherein the inner region that is disposed between the first and second outer regions in the plan view attenuates the x-ray radiation to a greater degree than each of the first and second outer regions.

3. The imaging system of claim 1 , wherein the rigid flux filter device includes at least one of a synthetic fluoropolymer of tetrafluoroethylene material or aluminum.

4. The imaging system of claim 1 , wherein the x-ray radiation sensitive detector array includes photon counting pixels.

5. The imaging system of claim 1 , wherein the rigid flux filter device has a thickness corresponding to a given x-ray radiation source voltage and a given x-ray radiation source current.

6. The imaging system of claim 5 , wherein the rigid flux filter device is one rigid flux filter device from a set of flux filter devices, each having a thickness corresponding to a different combination of different given x-ray radiation source voltage and x-ray radiation source current setting.

7. The imaging system of claim 1 , wherein the rigid flux filter device at least filters x-ray radiation directed towards an inner region of detector pixels of the array of x-ray radiation sensitive pixels based on a predetermined flux value.

8. The imaging system of claim 1 , further comprising:
a source controller configured to modulate an x-ray radiation source current of the x-ray radiation source between at least a first flux and a second different flux.

9. The imaging system of claim 8 , wherein the source controller employs a predetermined pattern that modulates the x-ray radiation source current based on a current angle of the x-ray radiation source with respect to the examination region.

10. The imaging system of claim 1 , further comprising:
a source controller configured to maintain a same flux throughout a scan.

11. The imaging system of claim 1 , further comprising:
a subject support, and wherein the rigid flux filter device includes a filter and at least one bracket configured to rest on the subject support and support the filter over the subject support.

12. The imaging system of claim 1 , further comprising:
a subject support with a tabletop having a long axis along a z-direction, wherein the rigid flux filter device is disposed inside of the tabletop.

13. The imaging system of claim 12 , wherein the rigid flux filter device includes a flux reducing element that increases or decreases in area along the z direction.

14. The imaging system of claim 12 , wherein the rigid flux filter device includes a plurality of flux reducing elements with a plurality of shapes having an invariant cross section along the z direction over a z-range larger than an extension of an x-ray beam in the z-direction.

15. A method, comprising:
rotating an x-ray radiation source about an examination region, wherein the x-ray radiation source emits x-ray radiation that traverses the examination region;
filtering the x-ray radiation that traverses the examination region with a rigid flux filter device, wherein the rigid flux filter device is disposed in the examination region and does not rotate together with the x-ray radiation source, wherein along an axis direction around which the x-ray radiation source rotates, the rigid flux filter device is configured to slide, relative to the examination region, toward the examination region from a location at which the rigid flux filter device is spaced apart from the examination region in the axis direction; and
detecting, with detector pixels located opposite the x-ray radiation source, across from the examination region, x-ray radiation traversing the flux filter device and generating a signal indicative thereof.

16. The method of claim 15 , wherein the rigid flux filter device includes an inner region with first attenuation characteristics, a first outer region with second attenuation characteristics, and a second outer region,
wherein the inner region is disposed between the first and second outer regions in a plan view, and
wherein the inner region that is disposed between the first and second outer regions in the plan view attenuates the x-ray radiation to a greater degree than each of the first and second outer regions.

Assignees

• Koninklijke Philips Nv

Inventors

• Brendel Bernhard Johannes
• Proksa Roland
• Koehler Thomas
• Roessl Ewald
• Daerr Heiner
• Grass Michael
• Thran Axel

Classifications

• A61B6/035 Primary

  Mechanical aspects of CT · CPC title

• A61B6/06 Primary

  Diaphragms · CPC title

• A61B6/4241

  using energy resolving detectors, e.g. photon counting · CPC title

• A61B6/032

  Transmission computed tomography [CT] · CPC title

• A61B6/0407

  Supports, e.g. tables or beds, for the body or parts of the body · CPC title