Mass analyzer

Patent metadata

Field	Value
Publication number	US-10957527-B2
Application number	US-201816482731-A
Country	US
Kind code	B2
Filing date	Apr 4, 2018
Priority date	Apr 4, 2017
Publication date	Mar 23, 2021
Grant date	Mar 23, 2021

Abstract

A mass analyzer for scanning sample gases is disclosed. The mass analyzer comprises an ionizer for generating ions from a sample; a mass filter with an accumulator section integrated in the mass filter and accumulates filtered ions prior to ejecting from the mass filter; and an ion detector that is configured to detecting ejected ions from the mass filter. The mass filter may include a quadrupole array and the accumulator section includes an ion trap array.

First claim

The invention claimed is:

1. A mass analyzer comprising:
an ionizer for generating ions from a sample;
a mass filter with an accumulator section that is integrated with a filter section of the mass filter by fixing the filter section and the accumulator section on a single glass chassis so that the filter section and the accumulator section are aligned to filter ions in the filter section and accumulate the filtered ions in the accumulator section prior to ejecting the filtered ions from the mass filter; and
an ion detector that is configured to detecting ejected ions from the mass filter.

2. The mass analyzer according to claim 1 , wherein the mass filter includes a quadrupole array and the accumulator section includes an ion trap array.

3. The mass analyzer according to claim 2 , wherein the ion trap array includes a cylindrical ion trap array.

4. The mass analyzer according to claim 3 , wherein the cylindrical ion trap array includes a top endcap plate, a ring electrode plate and a bottom endcap plate.

5. The mass analyzer according to claim 2 , wherein rods of the quadrupole array act as ring electrodes of the ion trap array.

6. The mass analyzer according to claim 1 , further comprises a module that is configured to control the mass analyzer in two modes, wherein a first mode of the two modes is ejecting the filtered ions through the accumulating section without accumulating prior to ejecting from the mass filter, and a second mode of the two modes is accumulating the filtered ions in the accumulator section prior to ejecting from the mass filter.

7. The mass analyzer according to claim 1 , further comprises a module that is configured to provide a same electric or magnetic field to the accumulator section as that provided to the mass filter.

8. The mass analyzer according to claim 1 , further comprises a module that is configured to provide a different electric or magnetic field to the accumulator section than that provided to the mass filter.

9. The mass analyzer according to claim 1 , wherein the single chassis is configured to integrate the ionizer, the mass filter and the ion detector.

10. The mass analyzer according to claim 1 , further comprises a modular component that is configured to assemble any one of the ionizer, the mass filter and the ion detector.

11. The mass analyzer according to claim 1 , wherein the ion detector includes a Faraday detector.

12. A system comprising:
the mass analyzer according to claim 1 ; and
a module that is configured to use an output from the mass analyzer.

13. The system according to claim 12 , wherein the module includes an output unit that is configured to output an information relating to the sample detected by the mass analyzer.

14. A method that includes controlling a mass analyzer that comprises an ionizer for generating ions from a sample, a mass filter with an accumulator section integrated with a filter section of the mass filter by fixing the filter section and the accumulator section on a single glass chassis, an ion detector for detecting ejected ions from the mass filter, and a controller that is configured to control an electric or magnetic field provided to the mass filter and the accumulator section, wherein the controlling the mass analyzer includes:
controlling the filter section and the accumulator section individually using the controller via a plurality of pins for electrical connection through the chassis; and
accumulating, filtered ions in the accumulator section prior to ejecting from the mass filter.

15. The method according to claim 14 , wherein the controlling the mass analyzer further includes:
ejecting, using the controller, the filtered ions through the accumulating section without accumulating prior to ejecting from the mass filter.

16. The method according to claim 14 , wherein the controlling the mass analyzer further includes:
providing, using the controller, a same electric or magnetic field to the accumulator section as that provided to the mass filter.

17. The method according to claim 14 , wherein the controlling the mass analyzer further includes:
providing, using the controller, a different electric or magnetic field to the accumulator section than that provided to the mass filter.

18. The method according to claim 15 , further comprising:
performing a first scan of a set of mass to charge ratios using the mass analyzer with a first mode including the ejecting; and
performing a second scan of the set of mass to charge ratios using the mass analyzer with a second mode including the accumulating.

19. A nontransitory computer program product for a computer to operate a system including a mass analyzer that comprises an ionizer for generating ions from a sample, a mass filter with an accumulator section integrated with a filter section of the mass filter by fixing the filter section and the accumulator section on a single glass chassis, and an ion detector for detecting ejected ions from the mass filter, wherein the computer program includes executable codes for performing steps of:
a first scan of a set of mass to charge ratios controlling the mass analyzer via a plurality of pins for electrical connection through the chassis with a first mode including ejecting filtered ions through the accumulating section without accumulating prior to ejecting from the mass filter; and
a second scan of the set of mass to charge ratios controlling the mass analyzer via the plurality of pins with a second mode including accumulating the filtered ions in the accumulator section prior to ejecting from the mass filter.

20. The mass analyzer according to claim 1 , further comprising a plurality of pins for electrical connection for controlling the filter section and the accumulator section through the chassis.

Assignees

• Atonarp Inc

Inventors

• Boumsellek Said
• Murthy Prakash Sreedhar
• Anderson Dave

Classifications

• G01N27/62

  by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode · CPC title

• H01J49/421 Primary

  Mass filters, i.e. deviating unwanted ions without trapping · CPC title

• H01J49/0031

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• H01J49/0013 Primary

  Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components · CPC title

• H01J49/009

  Spectrometers having multiple channels, parallel analysis · CPC title