Method and system for an optoelectronic built-in self-test system for silicon photonics optical transceivers
US-2015381273-A1 · Dec 31, 2015 · US
US10955464B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10955464-B2 |
| Application number | US-201815960911-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 24, 2018 |
| Priority date | Apr 28, 2017 |
| Publication date | Mar 23, 2021 |
| Grant date | Mar 23, 2021 |
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A method is disclosed use with a circuit device that includes a circuit having a predetermined voltage-current characteristic and a detector configured to detect a voltage-current relation of the circuit. The method includes using the detector to detect the voltage-current relation of the circuit, and indicating if the detected voltage-current relation differs from the predetermined voltage-current characteristic. A circuit device includes a circuit having a predetermined voltage-current characteristic, and a detector configured to detect a voltage-current relation of the circuit. The circuit device is configured to indicate if the detected voltage-current relation differs from the predetermined voltage-current characteristic.
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What is claimed is: 1. A method for use with a circuit device, wherein the circuit device comprises a circuit having an adaptive voltage-current characteristic, and a detector configured to detect a voltage-current relation of the circuit, the method comprising: adapting, by the detector, the adaptive voltage-current characteristic over time; detecting, by the detector, the voltage-current relation of the circuit; comparing, by the detector, the detected voltage-current relation with the adaptive voltage-current characteristic to generate a comparison result; and based on the comparison result, generating a signal by the detector, the signal indicating that the detected voltage-current relation differs from the adaptive voltage-current characteristic; wherein detecting the voltage-current relation of the circuit comprises: applying, by the detector, a predefined voltage at a measurement node of the circuit; sensing, by the detector, a measured current through a measurement portion of the circuit, wherein the measured current is produced at the measurement portion of the circuit in response to the predefined voltage applied to the measurement node; and determining, by the detector, a corresponding design current expected at the measurement portion of the circuit in response to the predefined voltage by cross-referencing the predefined voltage to the adaptive voltage-current characteristic in order to determine the corresponding design current, and wherein comparing the detected voltage-current relation with the adaptive voltage-current characteristic to generate the comparison result comprises: comparing, by the detector, the measured current to the corresponding design current to generate the comparison result. 2. The method of claim 1 , the method comprising: identifying, by the detector, the adaptive voltage-current characteristic based on simulating operation of a model of the circuit. 3. The method of claim 1 , the method comprising: identifying, by the detector, the adaptive voltage-current characteristic based on operating a prototype of the circuit. 4. The method of claim 1 , the method comprising: identifying, by the detector, a plurality of circuit portions of the circuit; identifying, by the detector, a plurality of adaptive partial voltage-current characteristics, each of the plurality of adaptive partial voltage-current characteristics corresponding to a different one of the plurality of circuit portions of the circuit; and consolidating, by the detector, the plurality of adaptive partial voltage-current characteristics in the adaptive voltage-current characteristic. 5. The method of claim 1 , the method further comprising: generating, by the detector, a signal indicative of a difference of the measured current to the corresponding design current exceeding a threshold current difference or not. 6. The method of claim 1 , further comprising: forecasting, by the detector, a future health of the circuit using at least one of data mining, machine learning, artificial intelligence, and pattern matching. 7. A method for use with a circuit device, wherein the circuit device comprises a circuit having an adaptive voltage-current characteristic, and a detector configured to detect a voltage-current relation of the circuit, the method comprising: adapting, by the detector, the adaptive voltage-current characteristic over time; detecting, by the detector, the voltage-current relation of the circuit; comparing, by the detector, the detected voltage-current relation with the adaptive voltage-current characteristic to generate a comparison result; and based on the comparison result, generating a signal by the detector, the signal indicating that the detected voltage-current relation differs from the adaptive voltage-current characteristic; wherein detecting the voltage-current relation of the circuit comprises: applying, by the detector, a predefined current to a measurement node of the circuit; at a sense node of the circuit, sensing, by the detector, a measured voltage across the circuit, wherein the measured voltage is produced at the sense node in response to the predefined current applied to the measurement node; and determining, by the detector, a corresponding design voltage expected at the sense node in response to the predefined current by cross-referencing the predefined current to the adaptive voltage-current characteristic in order to determine the corresponding design voltage, and wherein comparing the detected voltage-current relation with the adaptive voltage-current characteristic to generate the comparison result comprises: comparing, by the detector, the measured voltage to the corresponding design voltage to generate the comparison result. 8. The method of claim 7 , further comprising: generating, by the detector, a signal indicative of a difference of the measured voltage to the corresponding design voltage exceeding a threshold voltage difference or not. 9. A circuit device, comprising: a circuit having an adaptive voltage-current characteristic; and a detector configured to adapt the adaptive voltage-current characteristic over time, measure a voltage-current relation of the circuit, compare the measured voltage-current relation with the adaptive voltage-current characteristic to generate a comparison result, and generate a signal indicating that the detected voltage-current relation differs from the adaptive voltage-current characteristic; wherein the detector is further configured to: apply a predefined voltage at a measurement node of the circuit; sense a measured current through a measurement portion of the circuit, wherein the measured current is produced at the measurement portion of the circuit in response to the predefined voltage applied to the measurement node; determine a corresponding design current expected at the measurement portion of the circuit in response to the predefined voltage by cross-referencing the predefined voltage to the adaptive voltage-current characteristic in order to determine the corresponding design current; and compare the measured current to the corresponding design current to generate the comparison result. 10. The circuit device of claim 9 , wherein the adaptive voltage-current characteristic is based on a simulated operation of a model of the circuit. 11. The circuit device of claim 9 , wherein the adaptive voltage-current characteristic is based on an operation of a prototype of the circuit. 12. The circuit device of claim 9 , wherein the circuit comprises a plurality of circuit portions having a plurality of adaptive partial voltage-current characteristics, and the circuit device further comprises: a multiplexer coupled to the plurality of circuit portions and configured to select at least one selected signal from a plurality of signals of the plurality of circuit portions for the detector to measure the voltage-current relation of the circuit. 13. The circuit device of claim 9 , wherein the circuit device is configured to perform a built-in self-test on the circuit via the detector. 14. The circuit device of claim 13 , wherein the detector is configured to set a measurement node of the circuit to a measurement voltage and to sense a measured current through a measurement portion of the circuit. 15. The circuit device of claim 14 , wherein: the detector is configured to generate a signal indicative of a difference of the measured current to the corresponding design current exceeding a threshold current or not. 16. The circuit device of claim 13 , wherein the detector is confi
Automated test systems [ATE]; using microprocessors or computers (G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736) · CPC title
Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM] · CPC title
Measuring sum, difference or ratio · CPC title
Testing of integrated circuits [IC] (G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801) · CPC title
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