Method of producing a radiation-emitting semiconductor chip and radiation-emitting semiconductor chip

US10950752B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10950752-B2
Application numberUS-201716067955-A
CountryUS
Kind codeB2
Filing dateFeb 22, 2017
Priority dateFeb 25, 2016
Publication dateMar 16, 2021
Grant dateMar 16, 2021

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

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A method of producing a radiation-emitting semiconductor chip includes providing a growth substrate, epitaxially growing a buffer layer on the growth substrate such that a plurality of V-pits is generated in the buffer layer, epitaxially growing a radiation-generating active semiconductor layer sequence on the buffer layer, wherein the structure of the V-pits continues into the active semiconductor layer sequence, epitaxially growing a further layer sequence on the active semiconductor layer sequence, wherein the structure of the V-pits continues into the further layer sequence, selectively removing the further layer sequence from facets of the V-pits, wherein the further layer sequence remains on a main surface of the active semiconductor layer sequence, and epitaxially growing a p-doped semiconductor layer that completely or partially fills the V-pits.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method of producing a radiation-emitting semiconductor chip comprising: providing a growth substrate, epitaxially growing a buffer layer on the growth substrate such that a plurality of V-pits is generated in the buffer layer, epitaxially growing a radiation-generating active semiconductor layer sequence on the buffer layer, wherein the structure of the V-pits continues into the active semiconductor layer sequence, epitaxially growing a further layer sequence on the active semiconductor layer sequence, wherein the structure of the V-pits continues into the further layer sequence, selectively removing the further layer sequence from facets of the V-pits, wherein the further layer sequence remains on a main surface of the active semiconductor layer sequence, and epitaxially growing a p-doped semiconductor layer that completely or partially fills the V-pits. 2. The method according to claim 1 , wherein the active semiconductor layer sequence has a plurality of quantum films separated from one another by barrier layers, and the quantum films have InGaN and the barrier layers have GaN or AlGaN. 3. The method according to claim 1 , wherein the further layer sequence is completely removed from the facets of the V-pits such that the p-doped semiconductor layer at the facets is in direct contact with the active semiconductor layer sequence. 4. The method according to claim 1 , wherein the further layer sequence is formed from alternately arranged AlGaN layers and InGaN layers or from alternately arranged AlGaN layers and GaN layers or from alternately arranged InGaN layers and GaN layers. 5. The method according to claim 4 , wherein the thickness of the further layer sequence on the facets of the V-pits is formed thinner than on a main surface of the active semiconductor layer sequence. 6. The method according to claim 4 , wherein the aluminum content and/or indium content of the further layer sequence applied to the facets of the V-pits is reduced relative to the aluminum content and/or the indium content of the further layer sequence applied to the main surface of the active semiconductor layer sequence. 7. The method according to claim 1 , wherein the further layer sequence is selectively removed in situ from the facets of the V-pits by etching in the epitaxy reactor. 8. The method according to claim 7 , wherein a hydrogen content during the etching process is increased relative to a hydrogen content during the epitaxial growth process within the epitaxy reactor.

Assignees

Inventors

Classifications

  • H10H20/815Primary

    having stress relaxation structures, e.g. buffer layers · CPC title

  • Manufacture or treatment · CPC title

  • the light-emitting regions comprising nitride materials · CPC title

  • H10H20/821Primary

    of the light-emitting regions, e.g. non-planar junctions · CPC title

  • the light-emitting regions comprising nitride materials · CPC title

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What does patent US10950752B2 cover?
A method of producing a radiation-emitting semiconductor chip includes providing a growth substrate, epitaxially growing a buffer layer on the growth substrate such that a plurality of V-pits is generated in the buffer layer, epitaxially growing a radiation-generating active semiconductor layer sequence on the buffer layer, wherein the structure of the V-pits continues into the active semicondu…
Who is the assignee on this patent?
Osram Opto Semiconductors Gmbh, Osram Oled Gmbh
What technology area does this patent fall under?
Primary CPC classification H10H20/815. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Mar 16 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 9 related publications on this page (citations in our corpus or others sharing the same primary CPC).