Inorganic oxide articles with thin, durable anti-reflective structures

Patent metadata

Field	Value
Publication number	US-10948629-B2
Application number	US-202016749513-A
Country	US
Kind code	B2
Filing date	Jan 22, 2020
Priority date	Aug 17, 2018
Publication date	Mar 16, 2021
Grant date	Mar 16, 2021

Abstract

An article that includes: an inorganic oxide substrate having opposing major surfaces; and an optical film structure disposed on a first major surface of the substrate, the optical film structure comprising one or more of a silicon-containing oxide, a silicon-containing nitride and a silicon-containing oxynitride and a physical thickness from about 50 nm to less than 500 nm. The article exhibits a hardness of 8 GPa or greater measured at an indentation depth of about 100 nm or a maximum hardness of 9 GPa or greater measured over an indentation depth range from about 100 nm to about 500 nm, the hardness and the maximum hardness measured by a Berkovich Indenter Hardness Test. Further, the article exhibits a single-side photopic average reflectance that is less than 1%.

First claim

What is claimed is:

1. An article comprising:
an inorganic oxide substrate comprising opposing major surfaces; and
an optical film structure disposed on a first major surface of the inorganic oxide substrate, the optical film structure comprising a physical thickness from about 50 nm to less than 325 nm, a plurality of alternating high index and low index layers with a first low index layer on the first major surface, and a capping low index layer,
wherein the plurality of alternating high index and low index layers is at least four (4) layers, wherein each low index layer comprises a silicon-containing oxide and each high index layer comprises a silicon-containing nitride,
wherein the optical thickness of the high index layer adjacent to the capping low index layer is from about 45 nm to about 450 nm, and the physical thickness of the capping low index layer is about 80 nm or more,
wherein the article exhibits a hardness of 8 GPa or greater measured at an indentation depth of about 100 nm or a maximum hardness of 9 GPa or greater measured over an indentation depth range from about 100 nm to about 500 nm, the hardness and the maximum hardness measured by a Berkovich Indenter Hardness Test,
wherein a combined physical thickness of the high index layers is about 35% or greater than the physical thickness of the optical film structure, and
further wherein the article exhibits a single-side photopic average reflectance that is less than 1%.

2. The article of claim 1 , wherein the article exhibits a hardness of 10 GPa or greater measured at an indentation depth of about 100 nm or a maximum hardness of 11 GPa or greater measured over an indentation depth range from about 100 nm to about 500 nm, the hardness and the maximum hardness measured by a Berkovich Indenter Hardness Test, wherein the physical thickness of the optical film structure is from about 130 nm to less than 325 nm, and further wherein the article exhibits a single-side photopic average reflectance that is less than 0.6%.

3. The article of claim 1 , wherein the article exhibits an a* value, in reflectance, from about −10 to +5 and a b* value, in reflectance, from −10 to +2, the a* and b* values each measured on the optical film structure at a near-normal incident illumination angle.

4. The article of claim 1 , wherein the article exhibits an a* value, in reflectance, from about −4 to +4 and a b* value, in reflectance, from −6 to −1, the a* and b* values each measured on the optical film structure at a near-normal incident illumination angle.

5. The article of claim 1 , wherein the article exhibits a maximum hardness of about 12 GPa or greater as measured by a Berkovich Indenter Hardness Test over an indentation depth range from about 100 nm to about 500 nm.

6. The article of claim 1 , wherein the optical film structure comprises a residual stress in the range from about −1000 MPa (compressive) to about +50 MPa (tensile).

7. The article of claim 1 , wherein the inorganic oxide substrate comprises a glass selected from the group consisting of soda lime glass, alkali aluminosilicate glass, alkali-containing borosilicate glass, and alkali aluminoborosilicate glass.

8. The article of claim 7 , wherein the glass is chemically strengthened and comprises a compressive stress (CS) layer with a peak CS of 250 MPa or more, the CS layer extending within the chemically strengthened glass from the first major surface to a depth of compression (DOC) of about 10 microns or more.

9. The article of claim 1 , further comprising any one or more of an easy-to-clean coating, a diamond-like coating, and a scratch resistant coating, disposed on the optical film structure.

10. The article of claim 1 , wherein the article exhibits a specular component excluded (SCE) value of 0.2% or less, as measured according to an Alumina SCE Test.

11. The article of claim 1 , wherein the article exhibits a single-side average transmittance of greater than or equal to 87% in the infrared spectrum from 900 nm to 1000 nm.

12. The article of claim 1 , wherein the physical thickness of the optical film structure is from about 160 nm to about 300 nm.

13. The article of claim 12 , wherein the article exhibits an a* value, in reflectance, from about −4.5 to +1.5 and a b* value, in reflectance, from −6 to 0, the a* and b* values each measured on the optical film structure at a near-normal incident illumination angle, and further wherein the article exhibits a single-side photopic average reflectance that is less than 0.9%.

14. The article of claim 13 , wherein the article exhibits a hardness of 10 GPa or greater measured at an indentation depth of about 100 nm or a maximum hardness of 11 GPa or greater measured over an indentation depth range from about 100 nm to about 500 nm, the hardness and the maximum hardness measured by a Berkovich Indenter Hardness Test.

15. The article of claim 1 , wherein the plurality of alternating high index and low index layers is four (4) layers, wherein each low index layer and capping layer is silicon dioxide and each high index layer is silicon nitride, wherein the physical thickness of the optical film structure is from about 130 nm to less than 325 nm, and further wherein the first low index layer has a physical thickness of less than 60 nm.

16. The article of claim 1 , wherein the inorganic oxide substrate is a crystalline substrate.

17. The article of claim 16 , wherein the crystalline substrate is a glass ceramic substrate.

18. A consumer electronic product, comprising:
a housing comprising a front surface, a back surface and side surfaces;
electrical components at least partially within the housing, the electrical components comprising a controller, a memory, and a display, the display at or adjacent to the front surface of the housing; and
a cover substrate disposed over the display,
wherein at least one of a portion of the housing or the cover substrate comprises the article of claim 1 .

19. An article comprising:
an inorganic oxide substrate comprising opposing major surfaces; and
an optical film structure disposed on a first major surface of the inorganic oxide substrate, the optical film structure comprising a physical thickness from about 50 nm to less than 325 nm, a plurality of alternating high index and low index layers with a first low index layer on the first major surface, and a capping low index layer,
wherein the plurality of alternating high index and low index layers is at least four (4) layers, wherein each low index layer comprises a silicon-containing oxide and each high index layer comprises a silicon-containing nitride,
wherein the optical thickness of the high index layer adjacent to the capping low index layer is from about 45 nm to about 450 nm, and the physical thickness of the capping low index layer is about 80 nm or more,
wherein a refractive index of the low index layers is within a range of a refractive index of the substrate such that the refractive index of the low index layers is less than about 1.8, and wherein the high index layer comprises a refractive index that is greater than 1.8,
wherein the high index layer exhibits a maximum hardness of 18 GPa or greater as measured by a Berkovich Indenter Hardness Test over an indentation depth from about 100 nm to about 500 nm on a hardness test stack comprising the high index layer with a physical thickness of about 2 microns disposed on the inorganic oxide substrate,
wherein a combined physical thickness of the high index layers is about 35% or greater than the physical thickness of the optical film s

Assignees

• Corning Inc

Inventors

• Hart Shandon Dee
• Koch Iii Karl William
• Lin Lin
• Price James Joseph
• Mayolet Alexandre Michel
• Kosik Williams Carlo Anthony

Classifications

• G02B1/14

  Protective coatings, e.g. hard coatings · CPC title

• C03C2217/218

  V2O5, Nb2O5, Ta2O5 · CPC title

• C03C2217/212

  TiO2 · CPC title

• G02B1/115 Primary

  Multilayers · CPC title

• C03C17/3435 Primary

  comprising a nitride, oxynitride, boronitride or carbonitride · CPC title