X-ray imaging system and a method of X-ray imaging

Patent metadata

Field	Value
Publication number	US-10945688-B2
Application number	US-201816177698-A
Country	US
Kind code	B2
Filing date	Nov 1, 2018
Priority date	Dec 5, 2016
Publication date	Mar 16, 2021
Grant date	Mar 16, 2021

Abstract

Disclosed herein is an X-ray imaging system suitable for detecting x-ray, comprising: a first X-ray detector, and a second X-ray detector; wherein the first X-ray detector is configured to move relative to the second X-ray detector; wherein a spatial resolution of the first X-ray detector is higher than a spatial resolution of the second X-ray detector; wherein a detection area of the first X-ray detector is smaller than a detection area of the second X-ray detector. Also described herein is a method of X-ray imaging using the X-ray imaging system.

First claim

What is claimed is:

1. An X-ray imaging system suitable for detecting x-ray, comprising:
a first X-ray detector, and a second X-ray detector;
wherein the first X-ray detector is configured to move relative to the second X-ray detector;
wherein a spatial resolution of the first X-ray detector is higher than a spatial resolution of the second X-ray detector;
wherein a detection area of the first X-ray detector is smaller than a detection area of the second X-ray detector;
wherein the first X-ray detector comprises:
an X-ray absorption layer comprising an electrode;
a first voltage comparator configured to compare a voltage of the electrode to a first threshold;
a second voltage comparator configured to compare the voltage to a second threshold;
a counter configured to register a number of X-ray photons absorbed by the X-ray absorption layer;
a controller;

wherein the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold;
wherein the controller is configured to activate the second voltage comparator during the time delay;
wherein the controller is configured to cause the number registered by the counter to increase by one, if the second voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the second threshold.

2. The X-ray imaging system of claim 1 , wherein the first X-ray detector and the second X-ray detector are each capable of forming an image.

3. The X-ray imaging system of claim 1 , wherein the first X-ray detector is configured to count photons of X-ray incident thereon.

4. The X-ray imaging system of claim 1 , wherein the first X-ray detector is pixelated.

5. The X-ray imaging system of claim 1 , wherein the first X-ray detector comprises cadmium telluride (CdTe) or cadmium zinc telluride (CZT).

6. The X-ray imaging system of claim 1 , wherein the second X-ray detector comprises a scintillator.

7. The X-ray imaging system of claim 1 , comprising an actuator configured to move the first X-ray detector relative to the second X-ray detector in one or more directions; wherein one of the one or more directions is not perpendicular to an imaging plane of the second X-ray detector.

8. The X-ray imaging system of claim 7 , wherein the actuator comprises a material that is selected from a group consisting of aluminum, aluminum composite, carbon fiber and a combination thereof.

9. The X-ray imaging system of claim 7 , wherein the actuator comprises a robotic arm.

10. The X-ray imaging system of claim 7 , wherein the actuator comprises a first rail and a second rail; wherein the first X-ray detector is configured to slide along the first rail; and wherein the first rail is configured to slide along the second rail, wherein the first and second rails are not parallel.

11. The X-ray imaging system of claim 1 , wherein the first X-ray detector further comprises a capacitor module electrically connected to the electrode, wherein the capacitor module is configured to collect charge carriers from the electrode.

12. The X-ray imaging system of claim 1 , wherein the controller is configured to activate the second voltage comparator at a beginning or expiration of the time delay.

13. The X-ray imaging system of claim 1 , wherein the first X-ray detector further comprises a voltmeter, wherein the controller is configured to cause the voltmeter to measure the voltage upon expiration of the time delay.

14. The X-ray imaging system of claim 1 , wherein the controller is configured to determine an X-ray photon energy based on a value of the voltage measured upon expiration of the time delay.

15. The X-ray imaging system of claim 1 , wherein the controller is configured to connect the electrode to an electrical ground.

16. The X-ray imaging system of claim 1 , wherein a rate of change of the voltage is substantially zero at expiration of the time delay.

17. The X-ray imaging system of claim 1 , wherein a rate of change of the voltage is substantially non-zero at expiration of the time delay.

18. The X-ray imaging system of claim 1 , wherein the X-ray absorption layer comprises a diode.

19. The X-ray imaging system of claim 1 , wherein the X-ray absorption layer comprises silicon, germanium, GaAs, CdTe, CdZnTe, or a combination thereof.

20. The X-ray imaging system of claim 1 , wherein the first X-ray detector does not comprise a scintillator.

21. A system comprising the X-ray imaging system of claim 1 and an X-ray source, wherein the system is configured to perform X-ray radiography on human chest or abdomen.

22. A system comprising the X-ray imaging system of claim 1 and an X-ray source, wherein the system is configured to perform X-ray radiography on human mouth.

23. A cargo scanning or non-intrusive inspection (NII) system, comprising the X-ray imaging system of claim 1 and an X-ray source, wherein the cargo scanning or non-intrusive inspection (NII) system is configured to form an image using backscattered X-ray.

24. A cargo scanning or non-intrusive inspection (NII) system, comprising the X-ray imaging system of claim 1 and an X-ray source, wherein the cargo scanning or non-intrusive inspection (NII) system is configured to form an image using X-ray transmitted through an object inspected.

25. A full-body scanner system comprising the X-ray imaging system of claim 1 and an X-ray source.

26. An X-ray computed tomography (X-ray CT) system comprising the X-ray imaging system of claim 1 and an X-ray source.

27. An electron microscope comprising the X-ray imaging system of claim 1 , an electron source and an electronic optical system.

28. A system comprising the X-ray imaging system of claim 1 , wherein the system is an X-ray telescope, or an X-ray microscopy, or wherein the system is configured to perform mammography, industrial defect detection, microradiography, casting inspection, weld inspection, or digital subtraction angiography.

29. A method of X-ray imaging using an X-ray imaging system, wherein the X-ray imaging system comprises:
a first X-ray detector, and a second X-ray detector;
wherein the first X-ray detector is configured to move relative to the second X-ray detector;
wherein a spatial resolution of the first X-ray detector is higher than a spatial resolution of the second X-ray detector;
wherein a detection area of the first X-ray detector is smaller than a detection area of the second X-ray detector;

wherein the first X-ray detector comprises:
an X-ray absorption layer comprising an electrode;
a first voltage comparator configured to compare a voltage of the electrode to a first threshold;
a second voltage comparator configured to compare the voltage to a second threshold;
a counter configured to register a number of X-ray photons absorbed by the X-ray absorption layer;
a controller;

wherein the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold;
wherein the controller is configured to activate the second voltage comparator during the time delay;
wherein the controller is configured to cause the number registered by the counter to increase by one, i

Assignees

• Shenzhen Xpectvision Tech Co Ltd

Inventors

• Cao Peiyan
• Liu Yurun

Classifications

• A61B6/4233

  using matrix detectors · CPC title

• A61B6/4266 Primary

  characterised by using a plurality of detector units (A61B6/4014 takes precedence) · CPC title

• A61B6/032

  Transmission computed tomography [CT] · CPC title

• A61B6/4241

  using energy resolving detectors, e.g. photon counting · CPC title

• G01T1/247

  Detector read-out circuitry (for processing gain or off-set correction H04N) · CPC title