Wide-range high mass resolution in reflector time-of-flight mass spectrometers

Patent metadata

Field	Value
Publication number	US-10937642-B2
Application number	US-202016747106-A
Country	US
Kind code	B2
Filing date	Jan 20, 2020
Priority date	Sep 28, 2017
Publication date	Mar 2, 2021
Grant date	Mar 2, 2021

Abstract

The invention relates to the operation of an energy-focusing and solid-angle-focusing reflector for time-of-flight mass spectrometers with pulsed ion acceleration into a flight tube, e.g. from an ion source with ionization by matrix-assisted laser desorption (MALDI). The objective of the invention is to generate high mass resolution in wide mass ranges up to high masses above eight kilodaltons by varying at least one operating voltage on one of the diaphragms of the reflector which can be varied according to a suitable time function during the spectrum acquisition. It may also be advantageous to adapt the operation of the accelerating voltages in the starting region of the ions accordingly. These measures make it possible to achieve a mass resolution much higher than R=100,000 in a wide mass range extending up to and above eight kilodaltons.

First claim

The invention claimed is:

1. A method for operating a reflector time-of-flight mass spectrometer, in which ions are accelerated in the form of pulses from a starting region, pass through a reflector, which comprises a plurality of diaphragms supplied with predefined voltages, and are then recorded as a time-of-flight spectrum,
wherein at least one voltage on a diaphragm of the reflector is changed, in order to improve reflection conditions for the ions as they successively pass the reflector, during acquisition of a single time-of-flight spectrum as a function of the flight time that correlates with ion mass, and
wherein the diaphragm on which the at least one voltage is changed is located at a position along the plurality of diaphragms that substantially corresponds to a point of velocity reversal of the ions within a rear part of the reflector so that the said voltage change bends equipotential surfaces of a reflection field in the reflector at said position along the plurality of diaphragms.

2. The method according to claim 1 , wherein at least one of a focusing voltage U 3 on one of the last diaphragms of the reflector and a decelerating voltage U 2 on one of the first diaphragms of the reflector are varied during acquisition of the single time-of-flight spectrum.

3. The method according to claim 2 , wherein the focusing voltage U 3 is varied by less than 200 volts.

4. The method according to claim 1 , wherein a voltage is varied on more than one diaphragm of the reflector during acquisition of the single time-of-flight spectrum.

5. The method according to claim 1 , wherein a function for changing an accelerating voltage in the starting region is adapted to the change in the at least one diaphragm voltage after the accelerating voltage has been switched on with a time delay.

6. The method according to claim 5 , wherein a parameter T for the change to the accelerating voltage in the starting region is optimized.

7. The method according to claim 1 , wherein the at least one voltage on the diaphragm of the reflector is changed during the acquisition of the single time-of-flight spectrum over a time period that corresponds to substantially more than a range of 1000 Dalton ion mass.

8. The method according to claim 7 , wherein the at least one voltage on the diaphragm of the reflector is changed during the acquisition of the single time-of-flight spectrum over a time period that corresponds to substantially more than a range of 2000 Dalton ion mass.

9. The method according to claim 8 , wherein the at least one voltage on the diaphragm of the reflector is changed during the acquisition of the single time-of-flight spectrum over a time period that corresponds to substantially more than a range of 4000 Dalton ion mass.

10. The method according to claim 1 , wherein the starting region comprises a MALDI ion source.

11. The method according to claim 1 , wherein at least one of mass spectrometric images of tissue sections are measured and proteins sequenced.

12. The method according to claim 1 , wherein a rate of change in the at least one voltage on the diaphragm of the reflector is substantially less than 100 volts per nanosecond.

13. The method according to claim 1 , wherein a rate of change in the at least one voltage on the diaphragm of the reflector is substantially less than one of 10 volts per nanosecond and several volts per microsecond.

14. A reflector time-of-flight mass spectrometer in which ions are accelerated in the form of pulses from a starting region, whose reflector comprises a plurality of diaphragms supplied with predetermined voltages, and which is equipped with an electronic system with which at least one voltage on at least one diaphragm of the reflector can be varied according to a pre-selected time function during a spectrum acquisition such that the said voltage variation bends equipotential surfaces of a reflection field within the reflector, wherein the electronic system is configured to vary the diaphragm voltage(s) on a microsecond timescale, and wherein the at least one diaphragm on which the voltage can be varied is located at a position along the plurality of diaphragms that substantially corresponds to a point of velocity reversal of the ions within a rear part of the reflector.

15. The reflector time-of-flight mass spectrometer according to claim 14 , wherein the reflector is energy-focusing and solid-angle-focusing.

16. The reflector time-of-flight mass spectrometer according to claim 14 , wherein the electronic system is configured to change the at least one voltage on the at least one diaphragm over a time period that corresponds to substantially more than a range of 1000 Dalton ion mass.

17. The reflector time-of-flight mass spectrometer according to claim 16 , wherein the electronic system is configured to change the at least one voltage on the at least one diaphragm over a time period that corresponds to substantially more than a range of 2000 Dalton ion mass.

18. The reflector time-of-flight mass spectrometer according to claim 17 , wherein the electronic system is configured to change the at least one voltage on the at least one diaphragm over a time period that corresponds to substantially more than a range of 4000 Dalton ion mass.

19. The reflector time-of-flight mass spectrometer according to claim 14 , wherein the electronic system is configured to change the at least one voltage on the at least one diaphragm with a rate substantially less than 100 volts per nanosecond.

20. The reflector time-of-flight mass spectrometer according to claim 14 , wherein the reflector is grid-free.

Assignees

• Bruker Daltonik Gmbh

Inventors

• Böhm Sebastian
• Haase Andreas

Classifications

• H01J49/403 Primary

  characterised by the acceleration optics and/or the extraction fields · CPC title

• H01J49/164 Primary

  Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI] (sample holders H01J49/0418) · CPC title

• H01J49/405 Primary

  characterised by the reflectron, e.g. curved field, electrode shapes · CPC title

• H01J49/0031 Primary

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• H01J49/0418

  for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates · CPC title