Method of manufacturing imprint stamp and display apparatus manufactured using the imprint stamp

US10926564B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10926564-B2
Application numberUS-201715628083-A
CountryUS
Kind codeB2
Filing dateJun 20, 2017
Priority dateJul 19, 2016
Publication dateFeb 23, 2021
Grant dateFeb 23, 2021

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method of manufacturing an imprint stamp including forming an imprint resist only in a second area of a sample substrate including a first area and the second area, pressing the imprint resist with the imprint stamp and curing the imprint resist, in which the imprint stamp includes a fine protrusion pattern that corresponds to the first area and the second area of the sample substrate, and separating the imprint stamp from the sample substrate such that a portion of the fine protrusion pattern corresponding to the second area is separated from the imprint stamp by the cured imprint resist.

First claim

Opening claim text (preview).

What is claimed is: 1. A method of manufacturing an imprint stamp, the method comprising: forming an imprint resist only in a second area of a sample substrate, the sample substrate comprising a first area and the second area; pressing the imprint resist with a preliminary imprint stamp and curing the imprint resist, the preliminary imprint stamp comprising a fine protrusion pattern that corresponds to the first area and the second area of the sample substrate; and separating the preliminary imprint stamp from the sample substrate, such that a portion of the fine protrusion pattern corresponding to the second area is separated from the preliminary imprint stamp by the cured imprint resist. 2. The method of claim 1 , wherein the fine protrusion pattern has the same pattern as a wire grid pattern. 3. The method of claim 2 , wherein a pitch of the fine protrusion pattern is 50 nm to 150 nm. 4. The method of claim 2 , wherein the sample substrate comprises a sample pattern in the second area. 5. The method of claim 4 , wherein: the sample substrate comprises a display substrate of a display apparatus; and the sample pattern comprises a black matrix pattern of the display apparatus. 6. The method of claim 5 , wherein a line width of the sample pattern is at least 10 μm. 7. The method of claim 1 , wherein the imprint resist comprises at least one of thermosetting resin and photocurable resin. 8. The method of claim 7 , wherein the fine protrusion pattern of the imprint stamp is formed by curing the at least one of the thermosetting resin and photocurable resin. 9. The method of claim 8 , wherein the imprint resist and the fine protrusion pattern comprise the same material. 10. The method of claim 1 , wherein in the step of separating the preliminary imprint stamp from the sample substrate, a process condition is set such that a bonding force between the cured imprint resist and the fine protrusion pattern is: greater than a releasing force between the cured imprint resist and the fine protrusion pattern; and greater than strength of a structure of the fine protrusion pattern. 11. The method of claim 1 , wherein the imprint resist is formed only in the second area using an inkjet method. 12. The method of claim 11 , wherein the imprint resist contacts the sample substrate. 13. The method of claim 11 , wherein: a sample pattern is formed in the second area of the sample substrate; and the imprint resist is disposed on the sample pattern.

Assignees

Inventors

Classifications

  • G02B5/3058Primary

    comprising electrically conductive elements, e.g. wire grids, conductive particles · CPC title

  • Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping · CPC title

  • B41K1/50Primary

    Stamping surfaces impregnated with ink, or made of material leaving a mark after stamping contact · CPC title

  • Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic · CPC title

  • Manufacture or treatment of nanostructures · CPC title

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What does patent US10926564B2 cover?
A method of manufacturing an imprint stamp including forming an imprint resist only in a second area of a sample substrate including a first area and the second area, pressing the imprint resist with the imprint stamp and curing the imprint resist, in which the imprint stamp includes a fine protrusion pattern that corresponds to the first area and the second area of the sample substrate, and se…
Who is the assignee on this patent?
Samsung Display Co Ltd
What technology area does this patent fall under?
Primary CPC classification G02B5/3058. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Feb 23 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).