System and method for loading an ion trap

Patent metadata

Field	Value
Publication number	US-10923335-B2
Application number	US-201916357488-A
Country	US
Kind code	B2
Filing date	Mar 19, 2019
Priority date	Mar 19, 2018
Publication date	Feb 16, 2021
Grant date	Feb 16, 2021

Abstract

Systems and methods for loading microfabricated ion traps are disclosed. Photo-ablation via an ablation pulse is used to generate a flow of atoms from a source material, where the flow is predominantly populated with neutral atoms. As the neutral atoms flow toward the ion trap, two-photon photo-ionization is used to selectively ionize a specific isotope contained in the atom flow. The velocity of the liberated atoms, atom-generation rate, and/or heat load of the source material is controlled by controlling the fluence of the ablation pulse to provide high ion-trapping probability while simultaneously mitigating generation of heat in the ion-trapping system that can preclude cryogenic operation. In some embodiments, the source material is held within an ablation oven comprising an electrically conductive housing that is configured to restrict the flow of agglomerated neutral atoms generated during photo-ablation toward the ion trap.

First claim

What is claimed is:

1. An ion-trap system comprising:
an ion trap, wherein the ion trap is a microfabricated surface-electrode ion trap having a trapping region;
a photo-ablation system comprising:
(i) an ablation oven for holding a source material, wherein the ablation oven is characterized by a first fluence at which photo-ablation of a first neutral atom from the source material is enabled, and wherein the ablation oven is characterized by a second fluence at which plasma generation at the source material is enabled, wherein the ablation oven is electrically grounded to enable ions generated during a photo-ablation process to be attracted to sidewalls within the ablation oven and away from atom flow, wherein the source material is configured within the ablation oven; and
(ii) an ablation laser that is configured to provide an ablation pulse having a fluence that is equal to or greater than the first fluence and less than the second fluence;
wherein the ablation laser and ablation oven are optically coupled; and

a photo-ionization (PI) system configured to photo-ionize the first neutral atom.

2. The system of claim 1 wherein the source material is characterized by a plurality of isotopes, each isotope having a different resonant frequency, and wherein the first neutral atom is a first isotope of the plurality thereof having a first frequency of the plurality thereof, and further wherein the PI system includes:
a first PI laser having the first frequency, the first PI laser being configured to enable excitation of the first neutral atom to a first excited state; and
a second PI laser configured to enable excitation of the first neutral atom from the first excited state to the continuum.

3. The system of claim 1 wherein the PI system includes a first PI laser that is configured to (1) drive a transition of the first neutral atom to a first excited state with a first photon, the first excited state being equal to or greater than 50% and less than 100% of the energy required to excite the isotope to the continuum and (2) excite the first neutral atom from the first excited state to the continuum with a second photon.

4. The system of claim 1 wherein the ion trap includes a plurality of electrodes, and wherein adjacent electrodes of the plurality thereof are spaced apart by a spacing that is equal to or less than 300 microns.

5. The system of claim 4 wherein adjacent electrodes of the plurality thereof are spaced apart by a spacing that is equal to or less than 50 microns.

6. The system of claim 1 wherein the ablation oven comprises a housing having a chamber for holding the source material and an aperture that enables optical and fluidic access to the chamber, and wherein the ablation oven is electrically conductive.

7. The system of claim 6 wherein the housing has a longitudinal axis that is within the range of approximately 2 mm to approximately 50 mm, and wherein the aperture has a lateral dimension that is within the range of approximately 0.1 mm to approximately 3 mm.

8. The system of claim 7 wherein the housing is configured to restrict the flow of agglomerated neutral atoms toward the trapping region.

Assignees

• Univ Duke

Inventors

• Vrijsen Geert
• Kim Jungsang
• Spivey Robert
• Inlek Ismail
• Aikyo Yuhi

Classifications

• H01J49/161

  using photoionisation, e.g. by laser · CPC title

• H01J49/0018 Primary

  Microminiaturised spectrometers, e.g. chip-integrated devices, Micro-Electro-Mechanical Systems [MEMS] · CPC title

• H01J49/0463

  Desorption by laser or particle beam, followed by ionisation as a separate step (sample holder per se H01J49/0418) · CPC title

• H01J49/162

  Direct photo-ionisation, e.g. single photon or multi-photon ionisation · CPC title

• H01J49/422

  Two-dimensional RF ion traps (ion guides without mass selection H01J49/062) · CPC title