Method, electronic device and computer program product for storage

Patent metadata

Field	Value
Publication number	US-10921990-B2
Application number	US-201916572934-A
Country	US
Kind code	B2
Filing date	Sep 17, 2019
Priority date	Oct 29, 2018
Publication date	Feb 16, 2021
Grant date	Feb 16, 2021

Abstract

Techniques involve determining a first remaining lifetime of a flash device at a first time based on a warranty period, a factor of the number of writes per unit of time, and the number of executed writes for the flash device. The techniques further involve obtaining a second remaining lifetime at a second time prior to the first time, the second remaining lifetime being determined at the second time based on the warranty period, the factor of the number of writes per unit of time, and the number of executed writes. The techniques further involve determining a first lifetime decay rate based on the first and second remaining lifetimes. In addition, the techniques may determine a first predicted remaining lifetime based on the first lifetime decay rate. Accordingly, a remaining lifetime can be predicted based on the usage trend thereof.

First claim

We claim:

1. A method for storage, comprising:
determining a first remaining lifetime of a flash device at a first time point based on a warranty period, a factor of a number of writes per unit of time, and a number of executed writes for the flash device;
obtaining a second remaining lifetime of the flash device at a second time point prior to the first time point, the second remaining lifetime being determined at the second time point based on the warranty period, the factor of the number of writes per unit of time, and the number of executed writes;
determining a first lifetime decay rate of the flash device based on the first and second remaining lifetimes; and
determining a first predicted remaining lifetime of the flash device based on the first lifetime decay rate.

2. The method of claim 1 , further comprising:
obtaining a third remaining lifetime of the flash device at a third time point prior to the first and second time points, the third remaining lifetime being determined at the third time point based on the warranty period, the factor of the number of writes per unit of time, and the number of executed writes;
determining a second lifetime decay rate of the flash device based on the first and third remaining lifetimes;
determining a second predicted remaining lifetime of the flash device based on the second lifetime decay rate; and
determining an average value of the first and second predicted remaining lifetimes.

3. The method of claim 2 , wherein the average value is a weighted average value of the first and second predicted remaining lifetimes, and wherein a first weight for the first predicted remaining lifetime is greater than a second weight for the second predicted remaining lifetime.

4. The method of claim 2 , further comprising:
determining a ratio of the average value to the first remaining lifetime; and
indicating a wear level of the flash device based on a comparison between the ratio and a threshold.

5. The method of claim 1 , further comprising:
determining a remaining power-on lifetime of the flash device based on the warranty period and a power-on time duration of the flash device prior to the first time point; and
in response to the first predicted remaining lifetime being greater than the remaining power-on lifetime, setting the first predicted remaining lifetime to the remaining power-on lifetime.

6. The method of claim 1 , further comprising:
determining a remaining power-on lifetime of the flash device based on the warranty period and a power-on time duration of the flash device prior to the first time point; and
in response to the first remaining lifetime being equal to the second remaining lifetime, setting the first predicted remaining lifetime to the remaining power-on lifetime.

7. The method of claim 1 , wherein determining a first lifetime decay rate of the flash device comprises:
determining a lifetime difference between the first and second remaining lifetimes;
determining a time difference between the first and second time points; and
determining the first lifetime decay rate based on a ratio of the lifetime difference to the time difference.

8. The method of claim 1 , wherein determining a first predicted remaining lifetime of the flash device based on the first lifetime decay rate comprises:
determining the first predicted remaining lifetime based on a ratio of the first remaining lifetime to the first lifetime decay rate.

9. An electronic device, comprising:
at least one processing unit;
at least one memory coupled to the at least one processing unit and storing instructions executable by the at least one processing unit, the instructions, when executed by the at least one processing unit, causing the electronic device to perform acts of:
determining a first remaining lifetime of a flash device at a first time point based on a warranty period, a factor of a number of writes per unit of time, and a number of executed writes for the flash device;
obtaining a second remaining lifetime of the flash device at a second time point prior to the first time point, the second remaining lifetime being determined at the second time point based on the warranty period, the factor of the number of writes per unit of time, and the number of executed writes;
determining a first lifetime decay rate of the flash device based on the first and second remaining lifetimes; and
determining a first predicted remaining lifetime of the flash device based on the first lifetime decay rate.

10. The electronic device of claim 9 , wherein the instructions, when executed by the at least one processing unit, further cause the electronic device to perform acts of:
obtaining a third remaining lifetime of the flash device at a third time point prior to the first and second time points, the third remaining lifetime being determined at the third time point based on the warranty period, the factor of the number of writes per unit of time, and the number of executed writes;
determining a second lifetime decay rate of the flash device based on the first and third remaining lifetimes;
determining a second predicted remaining lifetime of the flash device based on the second lifetime decay rate; and
determining an average value of the first and second predicted remaining lifetimes.

11. The electronic device of claim 10 , wherein the average value is a weighted average value of the first and second predicted remaining lifetimes, and wherein a first weight for the first predicted remaining lifetime is greater than a second weight for the second predicted remaining lifetime.

12. The electronic device of claim 10 , wherein the instructions, when executed by the at least one processing unit, further cause the electronic device to perform acts of:
determining a ratio of the average value to the first remaining lifetime; and
indicating a wear level of the flash device based on a comparison between the ratio and a threshold.

13. The electronic device of claim 9 , wherein the instructions, when executed by the at least one processing unit, further cause the electronic device to perform acts of:
determining a remaining power-on lifetime of the flash device based on the warranty period and a power-on time duration of the flash device prior to the first time point; and
in response to the first predicted remaining lifetime being greater than the remaining power-on lifetime, setting the first predicted remaining lifetime to the remaining power-on lifetime.

14. The electronic device of claim 9 , wherein the instructions, when executed by the at least one processing unit, further cause the electronic device to perform acts of:
determining a remaining power-on lifetime of the flash device based on the warranty period and a power-on time duration of the flash device prior to the first time point; and
in response to the first remaining lifetime being equal to the second remaining lifetime, setting the first predicted remaining lifetime to the remaining power-on lifetime.

15. The electronic device of claim 9 , wherein determining a first lifetime decay rate of the flash device comprises:
determining a lifetime difference between the first and second remaining lifetimes;
determining a time difference between the first and second time points; and
determining the first lifetime decay rate based on a ratio of the lifetime difference to the time difference.

16. The electronic device of claim 9 , wherein determining a first predicted remaining lifetime of the flash device based on the first lifetime decay rate comprises:
determining the first predicted remaining lif

Assignees

• Emc Ip Holding Co Llc

Inventors

• Zhang Yang
• Wang Hao
• Tan Jiang

Classifications

• G06F3/0679

  Non-volatile semiconductor memory device, e.g. flash memory, one time programmable memory [OTP] · CPC title

• G06F2212/7211

  Wear leveling · CPC title

• G06F3/0616 Primary

  in relation to life time, e.g. increasing Mean Time Between Failures [MTBF] · CPC title

• G06F12/0246 Primary

  in block erasable memory, e.g. flash memory · CPC title

• G06F3/0653

  Monitoring storage devices or systems · CPC title