Thin layer chromatography plates and related methods
US-9283541-B2 · Mar 15, 2016 · US
US10921279B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10921279-B2 |
| Application number | US-201615299386-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 20, 2016 |
| Priority date | Oct 20, 2015 |
| Publication date | Feb 16, 2021 |
| Grant date | Feb 16, 2021 |
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In a general aspect, an apparatus can include a substrate and a post disposed on the substrate. The post can include a plurality of nanotubes and extend substantially vertically from the substrate. The post can have an aspect ratio of a height of the post to a diameter of the post of greater than or equal to 25:1.
Opening claim text (preview).
What is claimed is: 1. An apparatus comprising: a substrate; and a micro-scale, free-standing post disposed on the substrate, the micro-scale, free-standng post having a height-to-diameter aspect ratio of greater than or equal to 25:1, the micro-scale, free-standing post including: a plurality of nanotubes, the micro-scale, free-standing post extending substantially vertically from the substrate; and an infiltration material that, over a height of the micro-scale, free-standing post, structurally links nanotubes of the plurality of nanotubes together. 2. The apparatus of claim 1 , wherein a diameter of the micro-scale, free-standing post is in a range of 5 micrometers (μm) to 100 μm. 3. The apparatus of claim 1 , wherein the micro-scale, free-standing post is substantially cylindrical. 4. The apparatus of claim 1 , wherein a height of the micro-scale, free-standing post is greater than or equal to 1 millimeter (mm). 5. The apparatus of claim 1 , wherein the plurality of nanotubes includes a plurality of carbon nanotubes (CNTs). 6. The apparatus of claim 1 , wherein the infiltration material includes carbon (C). 7. The apparatus of claim 1 , wherein the infiltration material includes at least one of silicon (Si) or silicon nitride (SiN). 8. The apparatus of claim 1 , wherein at least a portion of the plurality of nanotubes of the micro-scale, free-standing post are plated with a metal. 9. The apparatus of claim 1 , wherein the micro-scale, free-standing post is a first micro-scale, free-standing post, the apparatus further comprising a second micro-scale, free-standing post disposed on the substrate and laterally spaced from the first micro-scale, free-standing post, the second micro-scale, free-standing post including a plurality of nanotubes and extending substantially vertically from the substrate, the second micro-scale, free-standing post having a height-to-diameter aspect ratio of greater than or equal to 25:1. 10. The apparatus of claim 1 , wherein the substrate includes a silicon (Si) wafer having an aluminum oxide (Al 2 O 3 ) layer disposed thereon. 11. A method comprising: providing a substrate; forming a patterned catalyst layer on the substrate, the patterned catalyst layer defining a template for carbon nanotube growth, the template defining a pattern for formation of: a first micro-scale carbon nanotube post; a second micro-scale carbon nanotube post; and a supporting structure disposed between the first micro-scale carbon nanotube post and the second micro-scale carbon nanotube post; growing carbon nanotubes on the patterned catalyst layer to form the first micro-scale carbon nanotube post, the second micro-scale carbon nanotube post and the supporting structure, the first micro-scale carbon nanotube post and the second micro-scale carbon nanotube post each having a height-to-diameter aspect ratio of greater than or equal to 25:1, the supporting structure having height-to-width aspect ratio of greater than or equal to 200:1; infiltrating, over a height of the first micro-scale carbon nanotube post and the second micro-scale carbon nanotube post, carbon nanotubes of the first micro-scale carbon nanotube post and carbon nanotubes the second micro-scale carbon nanotube post with an infiltration material, the infiltration material: over the height of the first micro-scale carbon nanotube post, structurally linking carbon nanotubes of the first micro-scale carbon nanotube post together; and over the height of the second micro-scale carbon nanotube post, structurally linking carbon nanotubes of the second micro-scale carbon nanotube post together; and removing the supporting structure, such that each of the first micro-scale carbon nanotube post and the second micro-scale carbon nanotube post are free-standing and extend substantially vertically from the substrate. 12. The method of claim 11 , wherein, prior to removal of the supporting structure, a height of the first micro-scale carbon nanotube post, a height of the second micro-scale carbon nanotube post and a height of the supporting structure are substantially a same height. 13. The method of claim 12 , wherein the same height is greater than or equal to 1 millimeter (mm). 14. The method of claim 11 , wherein the infiltration material includes carbon (C). 15. The method of claim 11 , wherein the infiltration material includes at least one of silicon (Si) or silicon nitride (SiN). 16. The method of claim 11 , further comprising plating the first micro-scale carbon nanotube post and the second micro-scale carbon nanotube post with a metal. 17. The method of claim 11 , wherein removing the supporting structure includes: performing a non-directional plasma etch to remove an upper portion of the supporting structure, such that a lower portion of the supporting structure remains, the lower portion of the supporting structure being disposed on the substrate; infiltrating the first micro-scale carbon nanotube post, the second micro-scale carbon nanotube post and the lower portion of the supporting structure with carbon (C); and performing a directional plasma etch to remove the lower portion of the supporting structure. 18. The method of claim 11 , wherein the substrate includes a silicon (Si) wafer having an aluminum oxide (Al 2 O 3 ) layer disposed thereon, the patterned catalyst layer being formed on the Al 2 O 3 layer. 19. The method of claim 18 , wherein forming the patterned catalyst layer includes forming, using photolithography, a patterned iron (Fe) layer, the Al 2 O 3 layer preventing diffusion of the patterned Fe layer into the Si wafer. 20. An apparatus comprising: a substrate; and an array of micro-scale, free-standing carbon nanotube posts disposed on the substrate, each micro-scale, free-standing carbon nanotube post of the array of micro-scale, free-standing carbon nanotube posts including a plurality of nanotubes and extending substantially vertically from the substrate, each micro-scale, free-standing carbon nanotube post of the array of micro-scale, free-standing carbon nanotube posts having a height-to-diameter aspect ratio of greater than or equal to 25:1, each of the micro-scale, free-standing carbon nanotube posts including an infiltration material that, over a height of a micro-scale, free-standing post of the array of micro-scale, free-standing carbon nanotube posts, structurally links nanotubes of a respective plurality of nanotubes together.
Preparation · CPC title
using moulds and master templates, e.g. for hot-embossing · CPC title
confining liquids at a location by surface tension, e.g. virtual wells on plates, wires (B01L3/50857 takes precedence) · CPC title
involving nanosized elements, e.g. nanogaps or nanoparticles (nanopores G01N33/48721; magnetic beads G01N27/745) · CPC title
Tips, pillars, i.e. raised structures (microneedles A61M37/0015) · CPC title
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