WIM sensor and method for producing the WIM sensor

Patent metadata

Field	Value
Publication number	US-10921176-B2
Application number	US-201816215950-A
Country	US
Kind code	B2
Filing date	Dec 11, 2018
Priority date	Dec 15, 2017
Publication date	Feb 16, 2021
Grant date	Feb 16, 2021

Abstract

A WIM sensor for determining wheel loads of a vehicle on a roadway segment during the passage of a wheel of the vehicle includes an elongated hollow profile that defines an enclosed first space. A plurality of piezoelectric measuring elements are disposed within the first space. A support element is arranged in the first space and secures therein the plurality of piezoelectric measuring elements. An electronic element is arranged in the first space and secured by the support element. An electric charge conductor is disposed in the first space and electrically connects a force-receiving surface of a piezoelectric measuring element to the electronic element.

First claim

What is claimed is:

1. A WIM sensor for determining wheel loads of a wheeled vehicle traveling on a roadway segment that defines a roadway surface on which moves a crossing wheel of the wheeled vehicle, the WIM sensor comprising:
a hollow profile that elongates to extend along a longitudinal axis thereof, the hollow profile defining an upper surface that is configured to be disposed flush with the roadway surface when the profile is arranged in the roadway segment, the hollow profile defining a first space enclosed within the hollow profile;
a plurality of piezoelectric measuring elements disposed in the first space and arranged along said longitudinal axis, each said piezoelectric measuring element includes a first force-receiving surface and a second force-receiving surface, each piezoelectric measuring element is configured to generate on each first force-receiving surface and each second force-receiving surface thereof electric charges that are proportional to the wheel load exerted on the respective piezoelectric measuring element;
a support element disposed in the first space so as to secure at least one piezoelectric measuring element;
an electronic element disposed in the first space and secured by the support element; and
an electric charge conductor disposed in the first space and electrically connecting the electronic element and a respective first force-receiving surface of one of said plurality of piezoelectric measuring elements, wherein the electric charge conductor is configured for conducting a charge signal from the respective first force-receiving surface to the electronic element.

2. The WIM sensor according to claim 1 , further comprising:
an electrode film, a first force introduction element and a second force introduction element, each of the electrode film, the first force introduction element and the second force introduction element being disposed in the first space of the hollow profile;
wherein in the first space the hollow profile defines a first pressing surface and a second pressing surface, which pressing surfaces are arranged opposite to each other; the first force-receiving surface faces the first pressing surface, the second force-receiving surface faces the second pressing surface, which respective pressing surface acts indirectly onto the respective force-receiving surface; wherein said indirect action of the pressing surfaces onto the force-receiving surfaces occurs by means of the first force introduction element and the second force introduction element, which force introduction elements are arranged between a pressing surface and a force-receiving surface; and
an electrode film is arranged between the second force-receiving surface and the second pressing surface; said electrode film comprising an insulating film; wherein said insulating film includes an electrically insulating material; said insulating film electrically insulates the second force-receiving surface from the second pressing surface; the electrode film further comprises an electrically conductive layer on at least the side of the insulating film that faces the second force-receiving surface; the electrically conductive layer on the side of the insulating film that faces the second force-receiving surface is subdivided into at least two electrically conductive regions; and wherein the electrode film comprises an electrical insulation between said electrically conductive regions of the electrically conductive layer.

3. The WIM sensor according to claim 2 , wherein at least one electrically conductive region of the electrode film is connected to the second force introduction element by force closure; the force closure of the second force introduction element and the electrically conductive of the electrode film generates an electrical contact between the second force introduction element and the electrically conductive region of the electrode film; by means of the second force introduction element an electrical contact is formed between the second force-receiving surface and the electrically conductive region; and wherein second force-receiving surfaces of different piezoelectric measuring elements are electrically insulated from each other due to the electrical insulation between electrically conductive regions.

4. The WIM sensor according to claim 3 , further comprising:
a first spring contact that defines a spring contact surface and is formed of material that is both elastic and electrically conductive;
wherein the first spring contact is connected to the electronic element in an electrically conductive manner and prestressed between the electronic element and a contact surface defined by the hollow profile; the prestressed first spring contact exerts a defined mechanical spring force onto the contact surface by means of a spring contact surface; the spring contact surface is connected to the contact surface by force closure;
wherein the electronic element is connected in an electrically conductive manner to the contact surface by means of the spring contact and the connection by force closure between the contact surface and the spring contact surface; and in that the contact surface is an electrode film or a pressing surface of the hollow profile.

5. The WIM sensor according to claim 4 , wherein a first electric charge conductor electrically connecting the first force-receiving surface of the piezoelectric measuring element and the electronic element is formed by the first spring contact, the electrical contact between the first spring contact and the first pressing surface of the hollow profile, the hollow profile, the electrical contact between the hollow profile and the first force introduction element, and the first force introduction element;
wherein the first electric charge conductor conducts a first charge signal;
wherein a second electric charge conductor electrically connecting the second force-receiving surface of the piezoelectric measuring element and the electronic element is formed by a second spring contact, the electrical contact between the second spring contact and the electrode film, the electrode film, the electrical contact between the electrode film and the second force introduction element, and the second force introduction element; and
wherein the second electric charge conductor conducts a second charge signal.

6. The WIM sensor according to claim 5 , wherein the electronic element secured to the support element includes a charge amplifier and an A/D converter;
wherein the charge amplifier is configured to convert the charge signal of a piezoelectric measuring element into a charge amplifier signal;
wherein the A/D converter is configured to convert the charge amplifier signal into a digital charge signal; and
wherein the A/D converter provides the digital charge signal as an output signal.

7. The WIM sensor according to claim 6 , wherein the charge amplifier of the electronic element is disposed at a distance not more than 20 mm from the first force-receiving surface or the second force-receiving surface of the piezoelectric measuring element.

8. The WIM sensor according to claim 6 , further comprising:
an evaluation element is arranged in the first space;
a connection element for an electrical signal conductor is arranged on the evaluation element;
a connection element for the electrical signal conductor is arranged on the electronic element;
a second electronic element disposed in the first space and secured by the support element; and
wherein the electrical signal conductor electrically connects the connection element of the evaluation element and the connection elements of the electronic element and the second electronic element in series; and
wherein the electronic element and the second electronic elem

Assignees

• Kistler Holding Ag

Inventors

• Ribi Adrian

Classifications

• G01G23/01

  Testing or calibrating of weighing apparatus · CPC title

• G01G19/027 Primary

  using electrical weight-sensitive devices · CPC title

• G01G3/13

  having piezoelectric or piezoresistive properties · CPC title

• G01G19/024 Primary

  using electrical weight-sensitive devices · CPC title

• G01L1/04

  by measuring elastic deformation of gauges, e.g. of springs · CPC title