Time-Domain Mechanism for Computing Error Vector Magnitude of OFDM Signals
US-2015304075-A1 · Oct 22, 2015 · US
US10917937B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10917937-B2 |
| Application number | US-201415520572-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 20, 2014 |
| Priority date | Oct 20, 2014 |
| Publication date | Feb 9, 2021 |
| Grant date | Feb 9, 2021 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.
Opening claim text (preview).
The invention claimed is: 1. A test system, comprising: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF transmit signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF transmit signals at a same time; a combiner network configured to combine the plurality of orthogonal RF transmit signals and to output a single channel under test; and a single channel measurement instrument configured to receive the single channel under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. 2. The test system of claim 1 , wherein the signal processor comprises at least a microprocessor and memory configured to generate a plurality of orthogonal baseband sequences. 3. The test system of claim 1 , wherein the signal processor is configured to multiply each of a plurality of baseband data sequences by a Walsh code to generate the plurality of orthogonal baseband sequences. 4. The test system of claim 1 , wherein the signal processor is configured to generate the plurality of orthogonal baseband sequences using orthogonal frequency division multiplexing (OFDM). 5. The test system of claim 1 , wherein the signal processor is configured to generate the plurality of orthogonal baseband sequences by multiplying each of a plurality of baseband data sequences by a corresponding Gold code. 6. The test system of claim 1 , wherein the at least one characteristic of each of the RF transmitters includes at least one of a power level, a bandwidth, and a distortion of the corresponding RF transmit signal generated by each of the RF transmitters. 7. The test system of claim 1 , wherein the single channel measurement instrument is a single channel signal analyzer. 8. The test system of claim 1 , wherein the signal generator is configured to sequentially supply the plurality of orthogonal baseband sequences to the corresponding plurality of RF transmitters of the DUT. 9. The test system of claim 1 , wherein each of the plurality of orthogonal baseband sequences comprising a pseudorandom bit stream.
using simultaneous multiple data streams, e.g. cooperative multipoint [CoMP], carrier aggregation [CA] or multiple input multiple output [MIMO] (allocation of physical resources in CoMP or in CA H04L5/0035) · CPC title
Testing, {supervising or monitoring} using simulated traffic · CPC title
Terminal devices · CPC title
Setup of multiple wireless link connections · CPC title
adapted for operation in multiple networks {or having at least two operational modes}, e.g. multi-mode terminals · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.