Transformer testing device, and method for testing a transformer

US10914778B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10914778-B2
Application numberUS-201515543063-A
CountryUS
Kind codeB2
Filing dateDec 18, 2015
Priority dateJan 13, 2015
Publication dateFeb 9, 2021
Grant dateFeb 9, 2021

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A transformer testing device (10) comprises outputs (31-33) for detachably connecting the transformer testing device to windings of multiple phases of a transformer (50). The transformer testing device (10) further comprises a plurality of sources (21-23), each of which is designed to generate a test signal. The transformer testing device (10) also comprises a switching matrix (40) that is connected between the plurality of sources (21-23) and the outputs (31-33).

First claim

Opening claim text (preview).

The invention claimed is: 1. A transformer testing device, comprising, a housing, a plurality of outputs provided in the housing for releasably connecting the transformer testing device to windings of a plurality of phases of a transformer and for impressing test signals on the plurality of phases of the transformer, a plurality of test signal sources integrated in the housing, wherein each source of the plurality of test signal sources is configured in each case for generating a test signal, and a switching matrix connected between the plurality of test signal sources and the plurality of outputs, wherein the switching matrix is controllable to connect at least two test signal sources of the plurality of sources in series or in parallel such that at least one output of the plurality of outputs receives a test signal generated by the at least two test signal sources of the plurality of test signal sources being connected in series or in parallel, wherein when the at least two test signal sources are operated as voltage sources, the test signal sources are connected by the switching matrix in series to generate a test signal having an increased voltage amplitude, and wherein when the at least two test signal sources are operated as current sources, the test signal sources are connected in parallel by the switching matrix to generate a test signal having an increased current amplitude. 2. The transformer testing device as claimed in claim 1 , further comprising a control unit for controlling the switching matrix, which is connected to at least one controllable switching means of the switching matrix. 3. The transformer testing device as claimed in claim 2 , wherein the control unit is configured to drive the switching matrix such that, in a first state of the switching matrix, each of the plurality of outputs is conductively connected to respectively only one test signal source, and that, in a second state of the switching matrix, at least one output of the plurality of outputs is connected to at least two different test signal sources. 4. The transformer testing device as claimed in claim 2 , wherein the control unit is configured to control the switching matrix depending on an input received at a user interface. 5. The transformer testing device as claimed in claim 4 , wherein the user interface is configured to enable a selection between a simultaneous test of the plurality of phases of the transformer and a test of only one phase of the transformer. 6. The transformer testing device as claimed in claim 1 , wherein each source of the plurality of test signal sources is configured to operate as a voltage source. 7. The transformer testing device as claimed in claim 1 , wherein each source of the plurality of test signal sources is configured to operate as a current source. 8. The transformer testing device as claimed in claim 1 , wherein each test signal source of the plurality of test signal sources is controllable such that it operates optionally as a voltage source or as a current source. 9. The transformer testing device as claimed in claim 1 , wherein the transformer testing device comprises at least one controllable switch to short-circuit at least one of the phases of the transformer on a high-voltage side or on a low-voltage side. 10. The transformer testing device as claimed in claim 1 , wherein the transformer testing device comprises at least three mutually different test signal sources. 11. A system comprising a transformer having a plurality of phases, and a transformer testing device as claimed in claim 1 , which is releasably connected to the plurality of phases of the transformer by the outputs. 12. A method for testing a transformer having a plurality of phases with a transformer testing device having a plurality of outputs for releasably connecting the transformer testing device to the plurality of phases of the transformer, wherein the method comprises: controlling a plurality of test signal sources of the transformer testing device in each case for generating a test signal, and controlling a switching matrix of the transformer testing device to selectively connect at least one output of the plurality of outputs of the transformer testing device to a series connection or parallel connection of at least two test signal sources of the plurality of sources such that the at least one output of the plurality of outputs receives a test signal generated by the series connection or the parallel connection of the at least two test signal sources of the plurality of test signal sources, wherein when the at least two test signal sources are operated as voltage sources, the test signal sources are connected by the switching matrix in series to generate a test signal having an increased voltage amplitude, and wherein when the at least two test signal sources are operated as current sources, these test signal sources are connected in parallel by the switching matrix to generate a test signal having an increased current amplitude. 13. The method as claimed in claim 12 , which is performed with the transformer testing device as claimed in claim 1 .

Assignees

Inventors

Classifications

  • G01R31/50Primary

    Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections (testing of sparking plugs H01T13/58) · CPC title

  • H02P13/00Primary

    Arrangements for controlling transformers, reactors or choke coils, for the purpose of obtaining a desired output · CPC title

  • G01R31/62Primary

    Testing of transformers · CPC title

  • G01R31/027Primary

    Physics · mapped topic

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What does patent US10914778B2 cover?
A transformer testing device (10) comprises outputs (31-33) for detachably connecting the transformer testing device to windings of multiple phases of a transformer (50). The transformer testing device (10) further comprises a plurality of sources (21-23), each of which is designed to generate a test signal. The transformer testing device (10) also comprises a switching matrix (40) that is conn…
Who is the assignee on this patent?
Omicron Electronics Gmbh
What technology area does this patent fall under?
Primary CPC classification G01R31/50. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Feb 09 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).