Measurement device and configuration method

US10908197B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10908197-B2
Application numberUS-201615282573-A
CountryUS
Kind codeB2
Filing dateSep 30, 2016
Priority dateSep 30, 2016
Publication dateFeb 2, 2021
Grant dateFeb 2, 2021

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The present invention provides a measurement device for measuring a number of physical variables, the measurement device comprising a number of parameter inputs, wherein the parameter inputs are configured to receive parameter values, which configure at least one function of the measurement device, a calculation unit, which controllably performs calculation functions with at least one parameter value provided in a respective parameter input and replaces the parameter value in the respective parameter input with the result of the calculation, and a number of function keys, wherein every function key controls the calculation unit to perform a predetermined one of the calculation functions.

First claim

Opening claim text (preview).

The invention claimed is: 1. A measurement device comprising: at least one measurement input, wherein the measurement input is configured to measure at least one physical variable from a device under test (DUT), a number of parameter inputs, wherein the parameter inputs comprise physical inputs configured to receive parameter values input by a user, and a display configured to display the received parameter values, wherein the parameter values comprise digital numbers and configure at least one operational function of the measurement device operating on the at least one physical variable measured from the DUT, and wherein the at least one operational function comprises a measurement function, a calculation unit comprising circuitry to: perform calculation functions with at least one parameter value provided in the display of the respective parameter input, and replace the parameter value in the display of the respective parameter input with the result of the calculation, a controller for configuring the measurement device, wherein the displayed result of the calculation is used as a parameter for configuring the at least one measurement input, and a number of function keys, wherein every function key controls the calculation unit to perform a predetermined one of the calculation functions, and wherein the functions of the function keys are changed depending on a selected measurement function. 2. The measurement device according to claim 1 , wherein one of the calculation functions comprises adding or subtracting at least two parameter values. 3. The measurement device according to claim 1 , wherein one of the calculation functions comprises multiplying or dividing at least two parameter values. 4. The measurement device according to claim 1 , wherein one of the calculation functions comprises calculating the ratio of a voltage divider formed by two resistances based on the measured at least one physical variable. 5. The measurement device according to claim 1 , wherein one of the calculation functions comprises calculating the reciprocal value of a parameter value in a parameter input. 6. The measurement device according to claim 1 , wherein one of the calculation functions comprises incrementing the value of a parameter value in a parameter input by a predetermined number. 7. The measurement device according to claim 1 , wherein one of the calculation functions comprises decrementing the value of a parameter value in a parameter input by a predetermined number. 8. The measurement device according to claim 1 , wherein one of the calculation functions comprises multiplying the value of a parameter value in a parameter input by 10 elevated by a predetermined exponent. 9. The measurement device according to claim 1 , wherein the function keys are arranged adjacent to the display and the display shows for every function key an indication of the respective calculation function. 10. The measurement device according to claim 1 , comprising a housing and a detachable input device, which is detachably coupled to the housing, and wherein the function keys are provided on the detachable input device. 11. The measurement device of claim 1 , wherein the measurement device comprises an oscilloscope configured to measure a plurality of physical variables, wherein physical variables comprise voltages and currents in an electrical circuit. 12. A configuration method for a measurement device for measuring a number of physical variables, the method comprising: measuring at least one physical variable, of the number of physical variables, from a device under test (DUT); receiving parameter values input by a user, wherein the parameter values comprise digital numbers and configure at least one operational function of the measurement device operating on the at least one physical variable measured from the DUT, via physical inputs of a number of parameter inputs, wherein the received parameter values are displayed on a display of the parameter input, and wherein the at least one operational function comprises a measurement function, reading a number of function keys, wherein every function key refers to a predetermined calculation function, and wherein the functions of the function keys are changed depending on a selected measurement function, based on the readings of the function keys performing the respective calculation function of a plurality of calculation functions with at least one parameter value displayed in the display of a respective one of the parameter inputs, replacing the parameter value in the display of the respective parameter input with the result of the calculation, and configuring a measurement input of the measurement device based on the result of the calculation displayed in the display of a respective one of the parameter inputs displaying the result of the calculation. 13. The configuration method according to claim 12 , wherein one of the calculation functions comprises adding or subtracting at least two parameter values. 14. The configuration method according to claim 12 , wherein one of the calculation functions comprises multiplying or dividing at least two parameter values. 15. The configuration method according to claim 12 , wherein one of the calculation functions comprises calculating the ratio of a voltage divider formed by two resistances based on the measured at least one physical variable. 16. The configuration method according to claim 12 , wherein one of the calculation functions comprises calculating the reciprocal value of a parameter value in a parameter input. 17. The configuration method according to claim 12 , wherein one of the calculation functions comprises incrementing the value of a parameter value in a parameter input by a predetermined number. 18. The configuration method according to claim 12 , wherein one of the calculation functions comprises decrementing the value of a parameter value in a parameter input by a predetermined number. 19. The configuration method according to claim 12 , wherein one of the calculation functions comprises multiplying the value of a parameter value in a parameter input by 10 elevated by a predetermined exponent. 20. The configuration method according to claim 12 , arranging on the display next to the function keys adjacent for every function key an indication of the respective calculation function.

Assignees

Inventors

Classifications

  • Tester/user interface · CPC title

  • Display of waveforms, e.g. of logic analysers (G06F11/323 takes precedence) · CPC title

  • Circuits for representing a single waveform by sampling, e.g. for very high frequencies · CPC title

  • for displaying measured electric variables in digital form · CPC title

  • Automated test systems [ATE]; using microprocessors or computers (G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736) · CPC title

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What does patent US10908197B2 cover?
The present invention provides a measurement device for measuring a number of physical variables, the measurement device comprising a number of parameter inputs, wherein the parameter inputs are configured to receive parameter values, which configure at least one function of the measurement device, a calculation unit, which controllably performs calculation functions with at least one parameter…
Who is the assignee on this patent?
Rohde & Schwarz
What technology area does this patent fall under?
Primary CPC classification G01R31/31912. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Feb 02 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).