Calibration device and method

US10898982B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10898982-B2
Application numberUS-201716069360-A
CountryUS
Kind codeB2
Filing dateJan 10, 2017
Priority dateJan 12, 2016
Publication dateJan 26, 2021
Grant dateJan 26, 2021

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A calibration device for a machine tool is described that includes a base attachable to a machine tool and a calibration artefact, such as a sphere of known radius. A deflection mechanism attaches the calibration artefact to the base and allows movement of the calibration artefact relative to the base when an external force is applied to the calibration artefact. The deflection mechanism also maintains the calibration artefact in a defined rest position relative to the base in the absence of an applied external force. A sensor is provided for sensing the extent of movement of the calibration artefact relative to the base. A method of using the device with a reference tool to accurately determine a position of a calibration artefact is also described.

First claim

Opening claim text (preview).

The invention claimed is: 1. A calibration device for a machine tool, the device comprising: a base attachable to the machine tool; a calibration artefact having one or more known dimensions and being configured to define a reference or datum position for an automated machine tool calibration process in which a measurement probe of the machine tool measures a plurality of points on a surface of the calibration artefact to determine the reference or datum position; a deflection mechanism that attaches the calibration artefact to the base and allows movement of the calibration artefact relative to the base when an external force is applied to the calibration artefact, the deflection mechanism also maintaining the calibration artefact in a defined rest position relative to the base in the absence of an applied external force; and a sensor configured for sensing an extent of movement of the calibration artefact relative to the base when the external force is applied to the calibration artefact. 2. The device according to claim 1 , wherein the calibration artefact comprises a sphere of known radius. 3. The device according to claim 1 , wherein the calibration artefact is attached to a rod that protrudes from the base. 4. The device according to claim 1 , wherein the deflection mechanism comprises a spring configured for biasing the calibration artefact into the defined rest position. 5. The device according to claim 1 , wherein a force that biases the calibration artefact into the defined rest position is greater than a force that would be applied to the calibration artefact during the process in which the points on the surface of the calibration artefact are measured using the measurement probe. 6. The device according to claim 1 , wherein the deflection mechanism comprises a first part attached to the calibration artefact and a second part attached to the base, wherein the first and second parts are configured so as to adopt a repeatable position relative to one another when brought into engagement with one another. 7. The device according to claim 1 , wherein the calibration artefact is constrained to move along a single linear axis relative to the base. 8. The device according to claim 7 , wherein the sensor is a transducer configured for measuring linear motion. 9. The device according to claim 1 , wherein a wireless transmitter is configured for transmitting measurements taken by the sensor. 10. The device according to claim 1 , wherein the base is configured for attachment to a bed or table of the machine tool. 11. A kit comprising a device according to claim 1 , and at least one of a reference tool and a spindle-mounted measurement probe configured for mounting in a spindle of a machine tool. 12. A method for calibrating a machine tool, comprising: mounting a calibration device to the machine tool, the calibration device comprising: a base attachable to the machine tool; a calibration artefact having one or more known dimensions; a deflection mechanism that attaches the calibration artefact to the base and allows movement of the calibration artefact relative to the base when an external force is applied to the calibration artefact, the deflection mechanism also maintaining the calibration artefact in a defined rest position relative to the base in the absence of an applied external force; and a sensor configured for sensing an extent of movement of the calibration artefact relative to the base when the external force is applied to the calibration artefact; and using the calibration device to calibrate the machine tool. 13. The method according to claim 12 , comprising moving a reference tool held by a spindle of the machine tool into contact with the calibration artefact of the calibration device thereby deflecting the calibration artefact. 14. The method according to claim 12 , wherein the machine tool is calibrated by measuring a position of the calibration artefact with a measurement probe carried by the machine tool. 15. The method according to claim 14 , wherein the machine tool is calibrated by measuring a plurality of points on a surface of the calibration artefact with the measurement probe of the machine tool to thereby determine a reference or datum position defined by the calibration artefact. 16. The method according to claim 12 , wherein the calibration artefact of the calibration device comprises a sphere and the method comprises measuring a position of the center of the sphere.

Assignees

Inventors

Classifications

  • Characteristics of machine, deviation of movement, gauge, · CPC title

  • for adjusting the tool relative to the workpiece · CPC title

  • Calibration or calibration artifacts (G01B3/30, G01B9/02072 take precedence) · CPC title

  • characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes (G05B19/19 takes precedence) · CPC title

  • Calibration of measuring system, probe, sensor · CPC title

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What does patent US10898982B2 cover?
A calibration device for a machine tool is described that includes a base attachable to a machine tool and a calibration artefact, such as a sphere of known radius. A deflection mechanism attaches the calibration artefact to the base and allows movement of the calibration artefact relative to the base when an external force is applied to the calibration artefact. The deflection mechanism also m…
Who is the assignee on this patent?
Renishaw Plc, Metrology Software Products Ltd
What technology area does this patent fall under?
Primary CPC classification B23Q17/2233. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Jan 26 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).