Linear-scan ultrasonic inspection apparatus and linear-scan ultrasonic inspection method

Patent metadata

Field	Value
Publication number	US-10895557-B2
Application number	US-201816112183-A
Country	US
Kind code	B2
Filing date	Aug 24, 2018
Priority date	Aug 25, 2017
Publication date	Jan 19, 2021
Grant date	Jan 19, 2021

Abstract

According to an embodiment, a linear-scan ultrasonic inspection apparatus comprises: an ultrasonic array probe having ultrasonic elements aligned in a first direction; a delay-time calculator configured to calculate, referring to the surface shape of the test object, values of delay time of at least one of transmitting and receiving ultrasonic wave; an overlapping-region adjustor configured to set conditions for generating an image of an overlapping region; and an integrated-image generator configured to generate first image data of a region including the overlapping region. The overlapping-region adjustor is configured to set the conditions of the surface shape to be referred to the delay-time calculator in calculating the values of the delay time at either the first-probe setting position or the second-probe setting position as both of a first acquired shape obtained at the first-probe setting position and a second acquired shape obtained at the second-probe setting position.

First claim

What is claimed is:

1. A linear-scan ultrasonic inspection apparatus comprising:
an ultrasonic array probe having a plurality of ultrasonic elements aligned in a first direction, each of the ultrasonic elements being configured to transmit and receive ultrasonic wave in a test object;
an input to receive both of locating-position information data and shape information data from outside, and to receive data including physical property data and acoustic characteristic data for calculation from outside;
a surface-shape calculator, implemented by circuitry, configured to receive the locating-position information data and the shape information data received by the input, and to calculate an acquired shape as a shape of a surface of the test object;
a delay-time calculator, implemented by the circuitry, configured to receive the shape information data of the test object, the physical property data, the acoustic characteristic data received by the input, and the acquired shape calculated by the surface-shape calculator, to calculate a value of delay time for transmitting to a focus point and receiving the ultrasonic wave, and to output the delay time;
a synthesizing-calculator, implemented by the circuitry, configured to receive the delay time from the delay-time calculator and digital ultrasonic waveform data, and to generate a synthesized signal using the delay time;
an overlapping-region adjustor, implemented by the circuitry, configured to receive a first acquired shape at a first-probe locating position and a second acquired shape at a second-probe locating position calculated by the surface-shape calculator, to set a surface shape of an overlapping region of a first-probe locating position and a second-probe locating position for the synthesizing-calculator, and to output the surface shape as an adjusted shape to the synthesizing-calculator; and
an integrated-image generator, implemented by the circuitry, configured to receive the synthesized signal generated by the synthesizing-calculator, the adjusted shape output by the overlapping-region adjustor, the locating-position information data and the shape information data of the test object, to decide an ultrasonic-beam path along the first direction based on the locating-position information data and the shape information data, to generate and output a first image data of a region including the overlapping region, the first image data expanding in the first direction and the depth direction of the test object,
wherein the overlapping-region adjustor is configured to set conditions of the surface shape to be referred to the delay-time calculator in calculating the values of the delay time at either the first-probe locating position or the second-probe locating position as both of a first acquired shape obtained at the first-probe locating position and a second acquired shape obtained at the second-probe locating position.

2. The linear-scan ultrasonic inspection apparatus according to claim 1 , wherein the overlapping-region adjustor uses a first synthesized waveform obtained at the first-probe locating position and a second synthesized waveform obtained at the second-probe locating position.

3. The linear-scan ultrasonic inspection apparatus according to claim 2 , wherein the second-probe locating position is so set that a path of an ultrasonic-wave beam having the second synthesized waveform overlaps a path of an ultrasonic-wave beam having the first synthesized waveform.

4. The linear-scan ultrasonic inspection apparatus according to claim 1 , wherein the overlapping-region adjustor obtains the first acquired shape and the second acquired shape based on ultrasonic test data transmitted from the ultrasonic array probe.

5. The linear-scan ultrasonic inspection apparatus according to claim 1 , further comprising a shape acquiring unit including cameras located axially outside the ultrasonic array probe, to acquire and to output, to the surface-shape calculator, the shape information data and information on positional relation between the test object and the ultrasonic array probe.

6. The linear-scan ultrasonic inspection apparatus according to claim 1 , further comprising an array probe driver to set the ultrasonic array probe at a probe-locating position where the ultrasonic array probe scans the test object and to drive the ultrasonic array probe between the probe-locating positions.

7. The linear-scan ultrasonic inspection apparatus according to claim 1 , wherein
the ultrasonic array probe has a plurality of ultrasonic elements arranged in the first direction and in a second direction different from the first direction, forming a two-dimensional array; and
the linear-scan ultrasonic inspection apparatus further comprises a second image generator configured to generate second image data expanding in the direction perpendicular to the first direction.

8. A linear-scan ultrasonic inspection method comprising:
storing in a non-transitory storage a first inspection data obtained by an ultrasonic array probe having a plurality of ultrasonic elements at a first-probe locating position on a surface of a test object;
storing in the non-transitory storage a second inspection data obtained by the ultrasonic array probe at a second-probe locating position including an overlapping region overlapping the first-probe locating position in a first direction along the surface of the test object;
setting in an overlapping-region adjustor a surface shape of the test object as a condition of generating image data for the overlapping region; and
generating with an integrated-image generator inspection image data corresponding to the first-probe locating position and the second-probe locating position including an adjusted overlapping region and a synthesized signal, based on the first ultrasonic test data, the second ultrasonic test data and the condition, wherein
the generating includes calculating with a delay-time calculator values of delay time of at least one of transmitting and receiving ultrasonic wave in the test object to a focus point with each of the ultrasonic elements, referring to the surface shape of the test object, and generating the synthesized signal using the delay time, and
the setting includes setting the condition of the surface shape to be referred to the delay-time calculator in calculating the values of the delay time at either the first-probe locating position or the second-probe locating position as both of a first acquired shape obtained at the first-probe locating position and a second acquired shape obtained at the second-probe locating position.

Assignees

• Toshiba Kk
• Toshiba Energy Systems & Solutions Corp

Inventors

• Yamamoto Setsu
• Sugawara Azusa
• Semboshi Jun
• Tsuchihashi Kentaro
• Otsuka Masaru

Classifications

• G01N29/341

  with time characteristics · CPC title

• G01N2291/269

  Various geometry objects · CPC title

• G01N29/2468

  Probes with delay lines · CPC title

• G01N2291/106

  one or more transducer arrays · CPC title

• G01N29/265

  by moving the sensor relative to a stationary material · CPC title