System and method for RF and jitter testing using a reference device

Patent metadata

Field	Value
Publication number	US-10890610-B2
Application number	US-202016779942-A
Country	US
Kind code	B2
Filing date	Feb 3, 2020
Priority date	Dec 20, 2017
Publication date	Jan 12, 2021
Grant date	Jan 12, 2021

Abstract

According to some embodiments, a tester tests one or more DUTs by utilizing one or more respective reference devices. The tester comprises one or more test sites and one or more test circuits operatively coupled to each of the test sites. Each test site is configured to: hold a reference device and a DUT, transmit a transmitted electromagnetic RF signal including a test data pattern to the DUT, and receive a received electromagnetic RF signal emitted from the DUT. The test circuits are configured to: receive a first electrical signal converted from the received electromagnetic RF signal, extract first data from the first electrical signal, determine a first error rate between the test data pattern and the first data, and generate a test result on the basis of the first error rate.

First claim

What is claimed is:

1. A tester comprising:
a test site configured to:
hold a reference device,
hold a device under test (DUT) with respect to the reference device,
transmit, via the reference device, a first electromagnetic radio frequency (RF) signal to the DUT, the first electromagnetic RF signal including a test data pattern, and
receive, via the reference device, a second electromagnetic RF signal emitted from the DUT; and

one or more test circuits operatively coupled to the test site and configured to:
determine a first error rate between the test data pattern and data extracted from the second electromagnetic RF signal, and
generate a test result based on the first error rate.

2. The tester of claim 1 , wherein the test site comprises a first test socket configured to hold the reference device and a second test socket configured to hold the DUT.

3. The tester of claim 1 , wherein the test site holds the reference device and the DUT a predetermined distance from each other based on a communication range of the DUT using extremely high frequency (EHF) signals.

4. The tester of claim 1 , further comprising one or more waveguide configured to focus and facilitate propagation of electromagnetic RF signals between the reference device and the DUT.

5. The tester of claim 1 , wherein the test site comprises one or more adjustment mechanism configured to adjust an alignment between the reference device and the DUT.

6. The tester of claim 5 , wherein the one or more adjustment mechanisms provide for adjusting the alignment along two axes.

7. The tester of claim 1 , further comprising a mating structure having features complementary to a structure of the DUT and configured to hold the DUT in position.

8. The tester of claim 1 , further comprising one or more additional test sites.

9. A method comprising:
holding a reference device that has previously passed testing in a way that the reference device is known to operate according to specified operational parameters, including positioning the reference device in a first test socket of a test site;
holding a device under test (DUT) with respect to the reference device, including positioning the DUT in a second test socket of the test site, in a way that the reference device and the DUT are held a predetermined distance and degree of alignment from each other based on a communication range of the DUT using extremely high frequency (EHF) signals;
transmitting, from the reference device, a transmitted electromagnetic radio frequency (RF) signal to the DUT, the transmitted electromagnetic RF signal including a test data pattern;
receiving, at the reference device, a received electromagnetic RF signal emitted from the DUT;
receiving, from a receiver of the reference device, an electrical signal converted from the received electromagnetic RF signal;
extracting, by one or more test circuits, data from the electrical signal;
determining, by one or more test circuits, an error rate between the test data pattern and the extracted data; and
generating, by one or more test circuits, a test result based on the error rate.

10. The method of claim 9 , wherein the reference device and DUT each include communication modules that are manufactured according to a same design to meet a predetermined set of operational specifications.

11. The method of claim 9 , wherein communication modules of the reference device are substantially identical to communication modules of the DUT in structure excluding variations due to manufacturing tolerance and defects.

12. The method of claim 9 , further comprising testing the receiver sensitivity of the DUT, comprising:
transmitting the electromagnetic RF signal to the DUT at a specified transmit power;
measuring a signal strength of the RF signal received by the DUT; and
comparing the measured signal strength to an expected signal strength associated with the specified transmit power of the reference device.

13. The method of claim 9 , further comprising testing the receiver sensitivity of the DUT, comprising:
transmitting the electromagnetic RF signal to the DUT at a specified transmit power;
gradually decreasing the transmit power at which the transmitted electromagnetic RF signal is transmitted to the DUT; and
monitoring a quality of the RF signal received at the DUT to determine a threshold transmit power below which the quality of the received RF signal fails to meet predetermined criteria.

14. The method of claim 9 , wherein positioning the reference device and the DUT in a way that that they are held at a predetermined degree of alignment includes adjusting the alignment to create a particular misalignment between the reference device and the DUT.

15. A tester comprising:
means for holding a reference device and a device under test (DUT) with respect to each other;
means for transmitting, via the reference device, a first electromagnetic radio frequency (RF) signal to the DUT, the first electromagnetic RF signal including a test data pattern, and
means for receiving, from the reference device, a second electromagnetic RF signal emitted from the DUT;
means for determining a first error rate between the test data pattern and data extracted from the second electromagnetic RF signal; and
means for generating a test result based on the first error rate.

16. The tester of claim 15 , wherein the means for holding comprises a first test socket configured to hold the reference device and a second test socket configured to hold the DUT.

17. The tester of claim 15 , wherein the means for holding holds the reference device and the DUT a predetermined distance from each other based on a communication range of the DUT using extremely high frequency (EHF) signals.

18. The tester of claim 15 , further comprising means for focusing and facilitating propagation of electromagnetic RF signals between the reference device and the DUT.

19. The tester of claim 15 , further comprising means for adjusting an alignment between the reference device and the DUT.

20. The tester of claim 19 , wherein the means for adjusting provide for adjusting the alignment along two axes.

21. The tester of claim 15 , further comprising a mating means having features complementary to a structure of the DUT and configured to hold the DUT in position.

Assignees

• Keyssa Systems Inc

Inventors

• Gondi Srikanth
• Mothilal Arunprasad Ramiya

Classifications

• H04B17/29

  Performance testing · CPC title

• H04B17/318

  Received signal strength · CPC title

• G01R31/31709

  Jitter measurements; Jitter generators (measuring jitter, noise figure or signal-to-noise ratio per se G01R29/26; analysis of tester signals G01R31/31901) · CPC title

• G01R31/2822

  of microwave or radiofrequency circuits (of attenuation, gain, e.g. using network analyzers G01R27/28) · CPC title

• H04B17/0085 Primary

  using test signal generators · CPC title