Charged particle accelerators, radiation sources, systems, and methods
US-2016345418-A1 · Nov 24, 2016 · US
US10886096B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10886096-B2 |
| Application number | US-201916519245-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 23, 2019 |
| Priority date | Jul 25, 2018 |
| Publication date | Jan 5, 2021 |
| Grant date | Jan 5, 2021 |
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A target is for generating X-ray radiation by way of loading with a particle stream containing charged particles. In an embodiment, the target includes a layer structure including at least two metallic layers. A target surface, loadable by the particle stream, is formed by a first layer of the at least two metallic layers of the layer structure including a material including a first metallic element. A second layer of the at least two metallic layers of the layer structure includes a material including a second metallic element. Finally, an ordinal number of the first metallic element is less than an ordinal number of the second metallic element.
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What is claimed is: 1. A target for generating X-ray radiation by way of loading with a particle stream containing charged particles, the target including a layer structure comprising at least two metallic layers, a target surface, loadable by the particle stream, being formed by a first layer of the at least two metallic layers of the layer structure including a material comprising a first metallic element, wherein a second layer of the at least two metallic layers of the layer structure includes a material comprising a second metallic element, and wherein an ordinal number of the first metallic element is less than an ordinal number of the second metallic element, wherein a layer thickness of the first layer is in a region between 0.3 and 0.7 times a range of electrons in a material of the first layer and a layer thickness of the second layer is in a region between 0.3 and 0.7 times a range of electrons in a material of the second layer. 2. The target of claim 1 , wherein the ordinal number of the first metallic element is less than 36 and the ordinal number of the second metallic element is more than 36. 3. The target of claim 2 , wherein the charged particles are electrons. 4. The target of claim 2 , wherein the material comprising a first metallic element and the material comprising a second metallic element are a metal or a metal alloy. 5. The target of claim 2 , wherein the first metallic element is copper and the second metallic element is tungsten. 6. The target of claim 1 , wherein the material comprising a first metallic element and the material comprising a second metallic element are a metal or a metal alloy. 7. The target of claim 1 , wherein the first metallic element is copper and the second metallic element is tungsten. 8. The target of claim 1 , wherein the target is formed via a generative manufacturing process. 9. The target of claim 8 , wherein the target is formed by sintering, selective laser melting or 3D printing. 10. The target of claim 8 , wherein the first layer and the second layer include at least one first layer and at least one second layer, respectively, and wherein the target is formed via a generative manufacturing process such that a material composition of the target between the at least one first layer and the at least one second layer is continuously variable. 11. An X-ray emitter, comprising: a particle source to emit a particle stream; and an acceleration device including a plurality of cavity resonators coupled to each other, to generate a particle stream directed onto a target, the target including a layer structure comprising at least two metallic layers, wherein a target surface, loadable by the particle stream, is formed by a first layer of the at least two metallic layers of the layer structure, including a material comprising a first metallic element, wherein a second layer of the at least two metallic layers of the layer structure includes a material comprising a second metallic element, wherein an ordinal number of the first metallic element is less than an ordinal number of the second metallic element, wherein a layer thickness of the first layer is in a region between 0.3 to 0.7 times a range of electrons in a material of the first layer and a layer thickness of the second layer is in a region between 0.3 and 0.7 times a range of electrons in a material of the second layer. 12. The X-ray emitter of claim 11 , wherein the particle stream loading the target surface is aligned along a beam axis, essentially perpendicular to the at least two metallic layers of the layer structure. 13. The X-ray emitter of claim 12 , wherein the acceleration device is designed to accelerate the particles in the particle stream to a mean particle energy in a range of more than 1 MeV and less than 20 MeV. 14. The X-ray emitter of claim 11 , wherein the acceleration device is designed to accelerate particles in the particle stream to a mean particle energy in a range of more than 1 MeV and less than 20 MeV. 15. The X-ray emitter of claim 11 , wherein the target for radiation of X-ray radiation is arranged in a solid angle range of less than 60° around a beam axis. 16. The X-ray emitter of claim 15 , wherein the target for radiation of X-ray radiation is arranged in a solid angle range of about 35° around a beam axis. 17. The X-ray emitter of claim 15 , wherein the target for radiation of X-ray radiation is arranged in a solid angle range of less than 60° around a beam axis in a direction of the particle stream loading the target surface. 18. The X-ray emitter of claim 11 , wherein the particle stream contains charged particles and wherein the charged particles are electrons. 19. The X-ray emitter of claim 11 , wherein the acceleration device is an acceleration device of a linear accelerator. 20. A method of generating X-ray radiation, comprising: loading a target with a particle stream containing charged particles to generate the X-ray radiation, the target including a layer structure comprising at least two metallic layers, wherein a target surface loaded by the particle stream is formed by a first layer of the at least two metallic layers of the layer structure includes a material comprising a first metallic element, and wherein a second layer of the at least two metallic layers of the layer structure includes a material comprising a second metallic element, wherein an ordinal number of the first metallic element is less than an ordinal number of the second metallic element, wherein a layer thickness of the first layer is in a region between 0.3 to 0.7 times a range of electrons in a material of the first layer and a layer thickness of the second layer is in a region between 0.3 and 0.7 times a range of electrons in a material of the second layer. 21. The method of claim 20 , wherein the particle stream, loading the target surface, is aligned along a beam axis essentially perpendicular to the at least two metallic layers of the layer structure. 22. The method of claim 20 , wherein the target for radiation of X-ray radiation is arranged in a solid angle range of less than 60° around a beam axis. 23. The method of claim 22 , wherein the target for radiation of X-ray radiation is arranged in a solid angle range of about 35° around a beam axis. 24. The method of claim 22 , wherein the target for radiation of X-ray radiation is arranged in a solid angle range of less than 60° around a beam axis in a direction of the particle stream loading the target surface. 25. The method of claim 20 , wherein particles in the particle stream are accelerated via an acceleration device comprising a plurality of coupled cavity resonators, to a mean particle energy in a range of MeV. 26. The method of claim 20 , wherein the x-ray radiation generated is provided for non-destructive material testing, for imaging at least one of inspection of cargo and medical radiotherapy. 27. The method of claim 20 , wherein particles in the particle stream are accelerated via an acceleration device comprising a plurality of coupled cavity resonators, to a mean particle energy in a range of more than 1 MeV and less than 20 MeV. 28. The method of claim 20 , wherein the charged particles of the particle stream are electrons.
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